The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.
Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise
Abstract
In very small electronic devices the alternate capture and emission of carriers at an individual defect site generates discrete switching in the device resistance—referred to as a random telegraph signal (RTS). The study of RTSs has provided a powerful means of investigating the capture and emission kinetics of single defects, has demonstrated the defect origins of low-frequency (1/ƒ) noise in these devices, and has provided new insight into the nature of defects at the Si/SiO2 interface.
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Citations
Cites
Electronic properties of two-dimensional systems
Ando, T., Fowler, A. B., & Stern, F. (1982) · Reviews of Modern Physics · doi:10.1103/revmodphys.54.437 · Cited by 7,455
Universal Conductance Fluctuations in Metals
Lee, P. A., & Stone, A. D. (1985) · Physical Review Letters · doi:10.1103/physrevlett.55.1622 · Cited by 1,369
Cited by
Single-electron devices and their applications
Likharev, K. K. (1999) · Proceedings of the IEEE · doi:10.1109/5.752518 · Cited by 1,453
Electron-spin-resonance transistors for quantum computing in silicon-germanium heterostructures
Vrijen, R., Yablonovitch, E., Wang, K., Jiang, H. W., Balandin, A., Roychowdhury, V., Mor, T., & DiVincenzo, D. (2000) · Physical Review A · doi:10.1103/physreva.62.012306 · Cited by 837
1/f noise in ion sensitive field effect transistors from subthreshold to saturation
Jakobson, C. G., & Nemirovsky, Y. (1999) · IEEE Transactions on Electron Devices · doi:10.1109/16.737468 · Cited by 62
Metadata
- Authors
- Kirton, M. J., & Uren, M. J.
- Venue
- Advances in Physics
- Publisher
- Informa UK Limited
- Published
- 1989-01
- Volume
- 38
- Issue
- 4
- Pages
- 367-468
- ISSN
- 0001-8732 (ISSN-L)
- 1460-6976
- OpenAlex
- W2035374584
- Cited by
- 1,281
- References
- 2
- FWCI
- 35.32
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise. https://app.cochat.ai/papers/10.1080/00018738900101122
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- Kirton, M. J., & Uren, M. J. (1989). Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise. Advances in Physics. https://doi.org/10.1080/00018738900101122
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
