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Cited by 165

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Piezoelectric thin films for mems

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Muralt, Paul·1997·Integrated Ferroelectrics

Abstract

A short overview is given on deposition and integration of PZT thin films on silicon for MEMS applications. The application principles are explained and the piezoelectric coefficients are compared with the ones of AlN and ZnO. The Materials figure of merits are given for various applications and discussed. The coupling coefficient for ultrasonic applications is treated in more detail.

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Metadata

Authors
Muralt, P.
Venue
Integrated Ferroelectrics
Published
1997-09
Volume
17
Issue
1-4
Pages
297-307
ISSN
  • 1026-7530 (ISSN-L)
  • 1058-4587
  • 1607-8489
OpenAlex
W2092872972
Cited by
165
References
0
FWCI
6.56
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Piezoelectric thin films for mems. https://app.cochat.ai/papers/10.1080/10584589708013004
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Muralt, P. (1997). Piezoelectric thin films for mems. Integrated Ferroelectrics. https://doi.org/10.1080/10584589708013004

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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.