The DOI matches its Crossref record; 7 of the 7 references it cites were found in a registry or an index.
Crystalline Oxides on Silicon: The First Five Monolayers
Abstract
The long-standing problem of growing a commensurate crystalline oxide interface with silicon has been solved. Alkaline earth and perovskite oxides can be grown in perfect registry on the (001) face of silicon, totally avoiding the amorphous silica phase that ordinarily forms when silicon is exposed to an oxygen containing environment. The physics of the heteroepitaxy lies in establishing a sequenced transition that uniquely addresses the thermodynamics of a layer-by-layer energy minimization at the interface. A metal-oxide-semiconductor capacitor using $\mathrm{SrTiO}{}_{3}$ as an alternative to $\mathrm{SiO}{}_{2}$ yields the extraordinary result of ${t}_{\mathrm{eq}}<10\AA{}$.
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Cites
Possible highT c superconductivity in the Ba?La?Cu?O system
Bednorz, J. G., & M�ller, K. A. (1986) · Zeitschrift f�r Physik B Condensed Matter · doi:10.1007/bf01303701 · Cited by 14,319
Thermochemical properties of inorganic substances
Barin, I., Knacke, O., & Kubaschewski, O. (1977) · Springer eBooks · doi:10.1007/978-3-662-02293-1 · Cited by 4,521
Parkin, S., More, N., & Roche, K. P. (1990) · Physical Review Letters · doi:10.1103/physrevlett.64.2304 · Cited by 2,756
Thermodynamic stability of binary oxides in contact with silicon
Hubbard, K. J., & Schlom, D. G. (1996) · Journal of Materials Research · doi:10.1557/jmr.1996.0350 · Cited by 1,242
McKee, R. A., Walker, F. J., Conner, J. R., Specht, E. D., & Zelmon, D. E. (1991) · Applied Physics Letters · doi:10.1063/1.105341 · Cited by 205
Self-citationFundamental Aspects of Ultrathin Dielectrics on Si-based Devices
Garfunkel, E. L., Gusev, E., & Vul', A. Y. (1998) · Springer eBooks · doi:10.1007/978-94-011-5008-8 · Cited by 157
Imprint of (Pb,La)(Zr,Ti)O3 thin films with various crystalline qualities
Lee, J., & Ramesh, R. (1996) · Applied Physics Letters · doi:10.1063/1.116421 · Cited by 92
Cited by
SrTiO3-based thermoelectrics: Progress and challenges
Shi, X.-L., Wu, H., Liu, Q., Zhou, W., Lu, S., Shao, Z., Dargusch, M., & Chen, Z.-G. (2020) · Nano Energy · doi:10.1016/j.nanoen.2020.105195 · Cited by 259
Chang, J. P., Lin, Y.-S., & Chu, K. (2001) · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena · doi:10.1116/1.1396639 · Cited by 102
Posadas, A. B., Park, H., Reynaud, M., Cao, W., Reynolds, J. D., Guo, W., Jeyaselvan, V., Beskin, I., Mashanovich, G. Z., Warner, J. H., et al. (2021) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.1c14048 · Cited by 75
Reynaud, M., Dong, Z., Park, H., Li, W., Posadas, A. B., Warner, J. H., Wasserman, D., & Demkov, A. A. (2022) · Physical Review Materials · doi:10.1103/physrevmaterials.6.095201 · Cited by 16
Reynaud, M., Waqar, M., Du, C., Posadas, A. B., Pan, X., & Demkov, A. A. (2025) · Communications Materials · doi:10.1038/s43246-025-00908-x · Cited by 14
Metadata
- Authors
- McKee, R. A., Walker, F. J., & Chisholm, M. F.
- Venue
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Published
- 1998-10-05
- Volume
- 81
- Issue
- 14
- Pages
- 3014-3017
- ISSN
- 0031-9007 (ISSN-L)
- 1079-7114
- OpenAlex
- W2072451721
- Cited by
- 1,019
- References
- 7
- FWCI
- 52.03
- Type
- journal article
- Language
- en
- Open access
- closed
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- McKee, R. A., Walker, F. J., & Chisholm, M. F. (1998). Crystalline Oxides on Silicon: The First Five Monolayers. Physical Review Letters. https://doi.org/10.1103/physrevlett.81.3014
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
