Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 571

The DOI matches its Crossref record.

Nonvolatile Memory with Multilevel Switching: A Basic Model

Rozenberg, M. J., Inoue, I. H., Sánchez, M. J.·2004·Physical Review Letters

Abstract

There is a current upsurge in research on nonvolatile two-terminal resistance random access memory (RRAM) for next generation electronic applications. The RRAM is composed of a simple sandwich of a semiconductor with two metal electrodes. We introduce here an initial model for RRAM with the assumption that the semiconducting part has a nonpercolating domain structure. We solve the model using numerical simulations and the basic carrier transfer mechanism is unveiled in detail. Our model captures three key features observed in experiments: multilevel switchability of the resistance, its memory retention, and hysteretic behavior in the current-voltage curve.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1103/physrevlett.92.178302

Cites

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

No references could be resolved yet.

Research works printed but not linked: 21

  1. 10.1103/PhysRevLett.21.1450 · DOI · Paper page
  2. 10.1063/1.1480887 · DOI
  3. 10.1063/1.1572964 · DOI · Paper page
  4. 10.1063/1.1556555 · DOI · Paper page
  5. 10.1016/S0022-2313(98)00068-4 · doi:10.1016/s0022-2313(98)00068-4
  6. 10.1103/PhysRevB.59.11257 · doi:10.1103/physrevb.59.11257
  7. 10.1063/1.126902 · DOI · Paper page
  8. 10.1063/1.1377617 · DOI · Paper page
  9. 10.1063/1.126464 · DOI · Paper page
  10. S. Q. Liu, 2001, Growth, Evolution and Properties of Surfaces, Thin Films and Self-Organized Structures Symposium
  11. W. W. Zhuang, 2002, International Electron Devices Meeting
  12. S. T. Hsu, 2003, Non-Volatile Semiconductor Memory Workshop
  13. 10.1063/1.1590741 · DOI · Paper page
  14. 10.1126/science.283.5410.2034 · doi:10.1126/science.283.5410.2034
  15. 10.1016/S0370-1573(00)00121-6 · DOI · Paper page
  16. E. Dagotto, 2002, Nanoscale Phase Separation and Colossal Magnetoresistance, 10.1007/978-3-662-05244-0 · DOI · Paper page
  17. 10.1038/35095012 · DOI · Paper page
  18. S. M. Sze, 1981, Physics of Semiconductor Devices
  19. 10.1063/1.360553 · DOI
  20. 10.1103/PhysRevB.49.12095 · DOI · Paper page
  21. 10.1103/RevModPhys.70.1039 · DOI · Paper page

Cited by

See all 571

Metadata

Authors
Rozenberg, M. J., Inoue, I. H., & Sánchez, M. J.
Venue
Physical Review Letters
Published
2004-04-30
Volume
92
Issue
17
Pages
178302-178302
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W2007070351
Cited by
571
References
0
FWCI
31.72
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Nonvolatile Memory with Multilevel Switching: A Basic Model. https://app.cochat.ai/papers/10.1103/physrevlett.92.178302
The paper
Rozenberg, M. J., Inoue, I. H., & Sánchez, M. J. (2004). Nonvolatile Memory with Multilevel Switching: A Basic Model. Physical Review Letters. https://doi.org/10.1103/physrevlett.92.178302

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.