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Cited by 310

The DOI matches its Crossref record; 23 of the 23 references it cites were found in a registry or an index.

Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy

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Garcia, R., Gómez, C. J., Martinez, N. F., Patil, S., Dietz, C., Magerle, R.·2006·Physical Review Letters

Abstract

Identification of energy-dissipation processes at the nanoscale is demonstrated by using amplitude-modulation atomic force microscopy. The variation of the energy dissipated on a surface by a vibrating tip as a function of its oscillation amplitude has a shape that singles out the dissipative process occurring at the surface. The method is illustrated by calculating the energy-dissipation curves for surface energy hysteresis, long-range interfacial interactions and viscoelasticity. The method remains valid with independency of the amount of dissipated energy per cycle, from 0.1 to 50 eV. The agreement obtained between theory and experiments performed on silicon and polystyrene validates the method.

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Metadata

Authors
Garcia, R., Gómez, C. J., Martinez, N. F., Patil, S., Dietz, C., & Magerle, R.
Venue
Physical Review Letters
Published
2006-07-07
Volume
97
Issue
1
Pages
016103-016103
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W2060398584
Cited by
310
References
23
FWCI
10.31
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy. https://app.cochat.ai/papers/10.1103/physrevlett.97.016103
The paper
Garcia, R., Gómez, C. J., Martinez, N. F., Patil, S., Dietz, C., & Magerle, R. (2006). Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy. Physical Review Letters. https://doi.org/10.1103/physrevlett.97.016103

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

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