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The DOI matches its Crossref record; 7 of the 7 references it cites were found in a registry or an index.

The finer things in X-ray diffraction data collection

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Pflugrath, J. W.·1999·Acta Crystallographica Section D Biological Crystallography

Abstract

X-ray diffraction images from two-dimensional position-sensitive detectors can be characterized as thick or thin, depending on whether the rotation-angle increment per image is greater than or less than the crystal mosaicity, respectively. The expectations and consequences of the processing of thick and thin images in terms of spatial overlap, saturated pixels, X-ray background and I/σ(I) are discussed. The d*TREK software suite for processing diffraction images is briefly introduced, and results from d*TREK are compared with those from another popular package.

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Metadata

Authors
Pflugrath, J. W.
Venue
Acta Crystallographica Section D Biological Crystallography
Published
1999-10-01
Volume
55
Issue
10
Pages
1718-1725
ISSN
0907-4449 (ISSN-L)
OpenAlex
W2116947993
Cited by
1,244
References
7
FWCI
6.00
Type
journal article
Language
en
Open access
hybrid

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CoChat. (2026). Citation check: The finer things in X-ray diffraction data collection. https://app.cochat.ai/papers/10.1107/s090744499900935x
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Pflugrath, J. W. (1999). The finer things in X-ray diffraction data collection. Acta Crystallographica Section D Biological Crystallography. https://doi.org/10.1107/s090744499900935x

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