Essential physics of carrier transport in nanoscale MOSFETs
Cited by (554)
Items 401–500 of 554
- Evaluation of quasi-ballistic transport in nano-MOSFETs by deterministic solver of the time dependent multi-subbands Boltzmann Transport EquationYong Wang, Tiao Lu, Xiaoyan Liu, Gang Du · 2011 · IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
- Postannealing Effects on Strain/Crystal Quality of Lateral Source Relaxed/Strained Layer Heterostructures Fabricated by O+ Ion ImplantationTomohisa Mizuno, Juria Takehi, Shou Tanabe · 2012 · Japanese Journal of Applied Physics
- Time-Stabilization on Flat Currents with Non-Degenerate Boltzmann-Poisson ModelsLaurent Gosse · 2013 · SIMAI springer series
- Tunneling Component of the Ballistic Current in Ultimate Double-Gate DevicesJean‐Luc Autran, Daniela Munteanu · 2003 · Electrochemical and Solid-State Letters
- Study of Backscattering Phenomenon from Drain Region of Silicon Decanano Diode Using Nonequilibrium Green's Function ApproachToshiyuki Tsutsumi, Kazutaka Tomizawa · 2010 · Japanese Journal of Applied Physics
- Analytical model of ballistic current for GAA nanowire MOSFET including band structure effects: Application to ring oscillatorJulien Dura, Sbastien Martinie, Daniela Munteanu, François Triozon, Sylvain Barraud, Yann‐Michel Niquet, J. C. Barbé, Jean‐Luc Autran · 2011 · Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
- Analytical Compact Model for Quantization in Undoped Double-Gate Metal Oxide Semiconductor Field Effect Transistors and Its Impact on Quasi-Ballistic CurrentMarlène Ferrier, Raphael Clerc, G. Pananakakis, G. Ghibaudo, F. Bœuf, T. Skotnicki · 2006 · Japanese Journal of Applied Physics
- On the current saturation in low dimensional MOSFETsA. Benfdila, M.T. Bensidhoum · 2004
- Analog/RF Performance and Optimization of Vertical III–V Double-Gate TransistorKun-Huan Shih, Chi On Chui · 2013 · IEEE Transactions on Electron Devices
- An improved procedure to extract the limiting carrier velocity in ultra scaled CMOS devicesP. Toniutti, Raphael Clerc, Pierpaolo Palestri, C. Diouf, A. Cros, David Esseni, F. Bœuf, G. Ghibaudo, L. Selmi · 2012 · IEEE International Conference on Microelectronic Test Structures (ICMTS)
- On the effect of scattering in Schottky Barrier MOSFETsLang Zeng, Xiao Yan Liu, Gang Du, Jin Kang, Ruqi Han · 2008 · IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
- Electronic transport in GAA silicon nanowire MOSFETs: From Kubo-Greenwood mobility including screening remote coulomb scattering to analytical backscattering coefficientJulien Dura, François Triozon, Daniela Munteanu, Sylvain Barraud, Sbastien Martinie, Jean‐Luc Autran · 2012 · International Workshop on Computational Electronics
- Contact engineering for nanocarbon interconnectsYusuke Abe, Anshul A. Vyas, Richard Senegor, Patrick Wilhite, Cary Y. Yang · 2015 · IEEE International Conference on Nanotechnology (IEEE-NANO)
- Analyze the Tunneling Effect on Gate-All-Around Field Effect TransistorAwanit Sharma, Shyam Akashe · 2014 · International Journal of Advanced Science and Technology
- Extracting a closed-form I–V equation and noise analysis for CNFET in analog/RF applicationsOmid Khorgami, Alireza Saberkari, Javad Bagheri Asli, Seyed Mohsen Hosseini-Golgoo, Eduardo José Alarcón Cot · 2017 · IEEE International New Circuits and Systems Conference (NEWCAS)
- Impact of crystal orientation and surface scattering on DG-MOSFETs in quasi-ballistic regionLei Shen, Shaoyan Di, Longxiang Yin, Yun Li, Xiaoyan Liu, Gang Du · 2018 · Journal of Semiconductors
- Research on Noise Suppression in Double-Gate Nano-MOSFETs Based on Monte Carlo SimulationXiaofei Jia, Liang He, Wenhao Chen · 2019 · MAPAN
- Investigation of Electrical Behaviors Observed in Vertical GaN Nanowire Transistors Using Extended Landauer-Büttiker FormulaFatimah Arofiati Noor, Ibnu Syuhada, Toto Winata, Yu Feng, Muhammad Fahlesa Fatahilah, Hutomo Suryo Wasisto, Khairurrijal Khairurrijal · 2020 · IEEE Access
- The Monte Carlo approach to transport modeling in deca-nanometer MOSFETsENRICO SANGIORGI, Pierpaolo Palestri, David Esseni, C. Fiegna, L. Selmi · 2007 · European Solid-State Circuits Conference (ESSCIRC)
- An optimized nanoscale Quasi-Ballistic DG MOSFET model with diffusive carrier scattering dependencyVyas R. Murnal, C. Vijaya · 2022 · International Journal of Electronics
- Influence of ballistic effects in ultra-small MOSFETsJérôme Saint-Martin, Aubry-Fortuna, Bournel, Dollfus, Galdin, Chassat · 2004
- A Quasi-Ballistic Model for Short Channel Monolayer Graphene Field Effect Transistor Including Scattering EffectsSudipta Bardhan, Manodipan Sahoo, Jagannath Samanta, Hafizur Rahaman · 2024 · IETE Journal of Research
- Fundamentals of Photonics and Optoelectronics in Modern Industrial ProcessesAmit Das, Preeti Goyal, Swati Sharma, Anjana Bhardwaj, Kaushik Das, R.S. Gupta · 2025 · Advances in optics and optoelectronics
- Tunneling and intersubband coupling in ultra-thin body double-gate mosfetsViktor A. Sverdlov, A. Gehring, Hans Kosina, S. Selberherr · 2005 · European Solid-State Device Research Conference
- A surface potential based quasi-ballistic double gate MOSFET modelJin Huang, Ganggang Zhang, Xiaoyan Liu, Gang Du · 2015 · IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
- Nanowire Transistors and RF Circuits for Low-Power ApplicationsKarl‐Magnus Persson · 2014
- Computational Investigation of Quantum Transport to Design Single-Strand DNA Logic Gate Using Silicon Carbide Nanotube ElectrodePradipta Roy, Debarati Dey, Debashis De · 2019 · IETE Journal of Research
- Electron transport properties of electrically doped guanine nano-sheet based bio-Zener diode: a first principle paradigmDebarati Dey, Debashis De · 2021 · Journal of Computational Electronics
- A Theoretical Study of Electron Mobility Distribution in FDSOI MOSFETNima Dehdashti Akhavan, Gilberto Antonio Umana-Membreno, Renjie Gu, Jarek Antoszewski, L. Faraone, Sorin Cristoloveanu · 2021 · Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
- Electron mobility distribution in FD-SOI MOSFETs using a NEGF-Poisson approachNima Dehdashti Akhavan, Gilberto Antonio Umana-Membreno, Renjie Gu, Jarek Antoszewski, L. Faraone, Sorin Cristoloveanu · 2022 · Solid-State Electronics
- Geometrical scaling effects on carrier transport in ultrathin-body MOSFETsvan der Jan-Laurens P.J. Steen · 2011
- Physics and Simulation of Quasi-Ballistic Transport in Nanoscale TransistorsJung-Hoon Rhew · 2013 · Purdue e-Pubs (Purdue University System)
- New tools for the direct characterisation of FinFETsGiuseppe Carlo Tettamanzi, Ajoy Paul, S. Lee, Gerhard Klimeck, Sven M. J. Rogge · 2011 · arXiv (Cornell University)
- Metrology (including materials characterization) for nanoelectronicsAlain C. Diebold, Jimmy Price, Ping-Fang Hung · 2006 · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
- Kinetic study of quasi‐ballistic electron transport in nanoscale semiconductor devicesNobuyuki Sano · 2005 · Electronics and Communications in Japan (Part II Electronics)
- High-temperature CNFET charactristicsSamaneh Soleimani Amiri, Ali Afzali‐Kusha, Behjat Forouzandeh · 2009 · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
- The impact of longitudinal nonuniform fin-thickness on quasi-ballistic transport in FinFETsNuno Serra, Pierpaolo Palestri, Geert D. J. Smit, L. Selmi · 2008 · Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
- Analytical modelling and performance analysis of double-gate MOSFET-based circuit including ballistic/quasi-ballistic effectsSbastien Martinie, Daniela Munteanu, G. Le Carval, Jean‐Luc Autran · 2009 · Molecular Simulation
- Physics-Based Modelling of Ballistic Transport in Nanoscale TransistorIsmail Saad, Razak Mohd Ali Lee, Razali Ismail, Vijay Kumar Arora · 2009 · Asia International Conference on Modelling & Simulation (AMS)
- Scattering Theory of the MOSFET2006 · Kluwer Academic Publishers eBooks
- Conservation Laws at Physical Origins of Universal Mobility in MOSFET Inversion Layers in Consilience with River Flow in a Gravitational FieldF.S. Shoucair · 2022
- Fabrication, characterization, and modeling of metallic source/drain MOSFETsValur Gudmundsson · 2011 · KTH Publication Database DiVA (KTH Royal Institute of Technology)
- Challenges to Advanced Materials Characterization for ULSI ApplicationsAlain C. Diebold · 2006 · Springer eBooks
- Crossover from diffusive to ballistic transport as a function of frequency in a two dimensional electron gasSungmu Kang, Peter John Burke, Loren N. Pfeiffer, K. W. West · 2004 · International Semiconductor Device Research Symposium
- Advanced modeling of nanoscale multigate transistors for circuit simulationM. Balaguer Jiménez · 2013
- Challenges and solutions for numerical modeling of nanoMOSFETsGilberto Curatola, Gianluca Fiori, Giuseppe Iannaccone · 2004 · IEEE Conference on Nanotechnology (IEEE NANO)
- Physical modeling of double-gate transistorGennady Ivanovich Zebrev · 2004
- Transient simulation of nano-scale UTBB nmosfets by deterministically solving BTEShao-yan Dia, Kai Zhao, Tiao Lu, Gang Du, Xiaoyan Liu · 2014 · IEEE International Conference on Solid-State and Integrated Circuit Technology
- Quasi-ballisticity of the electron transport in a 16nm silicon double-gate nMOSFETKai Zhao, Christoph Jungemann, Xiaoyan Liu · 2011 · IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
- A tradeoff between on and off current for armchair graphene nanoribbon field effect transistors explained by the complex band structureTongsheng Xia, Pilong Yang, Liujun Zhang, Hongge Li · 2012 · IEEE International Conference on Solid-State and Integrated Circuit Technology
- Impact of (Quasi-)Ballistic Transport on Operation of Complementary Metal–Oxide–Semiconductor Inverters Based on Fully-Depleted Silicon-on-Insulator and Nanowire DevicesSébastien Martinie, Daniela Munteanu, G. Le Carval, Julien Dura, Marie-Anne Jaud, Sylvain Barraud, Jean‐Luc Autran · 2011 · Japanese Journal of Applied Physics
- Investigation of Channel Backscattering Characteristics in Nanoscale Uniaxial-Strained PMOSFETsWei Lee, Pin Su · 2009 · IEEE Transactions on Nanotechnology
- Power scalability in a mesh-connected reconfigurable architecturePaul Beckett · 2009 · ACM Transactions on Embedded Computing Systems
- Stress coefficient extractions on MOSFET micro-sensorsChung-Yen Ni, Ren-Tzung Tan, Hsien Chung, Kun-Fu Tseng, Ben-Je Lwo · 2011 · International Microsystems, Packaging, Assembly and Circuits Technology Conference
- Adaptive wiring for 20nm scale epitaxial silicon Ohmic contacts to silicon nanowiresMichael J. Rooks, G. M. Cohen, J. O. Chu, Paul Michael Solomon, John A. Ott, R.J. Miller, Raman G. Viswanathan, Wilfried Hänsch · 2007 · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
- Monte-Carlo simulation of MOSFETs with band offsets in the source and drainM. Braccioli, Pierpaolo Palestri, M. Mouis, T. Poiroux, M. Vinet, G. Le Carval, C. Fiegna, ENRICO SANGIORGI, S. Deleonibus · 2007 · Solid-State Electronics
- Stacked field effect transistor integration in double channel transistors (DCT) with tri-state transfer slope and ballistic field effect behaviorFrank Wirbeleit · 2010 · Microelectronic Engineering
- Enhancement of ballistic efficiency due to source to channel heterojunction barrier in Si metal oxide semiconductor field effect transistorsWenlong Wang, H. Tsuchiya, M. Ogawa · 2009 · Journal of Applied Physics
- A deterministic method study of the impact of the Pauli principle in double-gate MOSFETsChristoph Jungemann, Kai Zhao, Xiaoyan Liu · 2012 · Chinese Physics B
- Analysis of channel electrons scattered in each region of silicon nanodiode at low drain voltage using nonequilibrium Green’s function approachToshiyuki Tsutsumi, Kazutaka Tomizawa · 2014 · Japanese Journal of Applied Physics
- Monte Carlo Method for Advanced Semiconductor DevicesNobuyuki Sano · 2009 · The Journal of the Institute of Electrical Engineers of Japan
- Quantum ballistic simulation study of In0.7Ga0.3As/InAs/In0.7Ga0.3As Quantum Well MOSFETSudipta Romen Biswas, Kanak Datta, Abir Shadman, Ehsanur Rahman, Quazi D. M. Khosru · 2014 · International Conference on Electrical and Computer Engineering (ICECE)
- Extraction of Ballistic Parameters in 65 nm MOSFETsJunsoo Kim, Jaehong Lee, Yong-Min Kwon, Byung‐Gook Park, Jong-Duk Lee, Hyungcheol Shin · 2009 · JSTS Journal of Semiconductor Technology and Science
- Decoherence Due to Electron-Phonon Scattering in Semiconductor NanodevicesDamien Querlioz, Jérôme Saint-Martin, Philippe Dollfus · 2009 · International Workshop on Computational Electronics
- Experimental Characterization of Quasi-Fermi Potential Profile in the Channel of a Silicon Nanowire Field-Effect Transistor with Four-Terminal GeometrySoshi Sato, Kenji Ohmori, Kuniyuki Kakushima, Parhat Ahmet, Kenji Natori, Keisaku Yamada, Hiroshi Iwai · 2011 · Applied Physics Express
- Quantum ballistic simulation study of InGaAs/InAs/InGaAs quantum well MOSFET: Effects of doping and physical device parametersSudipta Romen Biswas, Kanak Datta, Ehsanur Rahman, Abir Shadman, Quazi D. M. Khosru · 2014 · IEEE International Conference on Semiconductor Electronics
- Assessment of III–V MOSFET architectures for low power applications using static and dynamic numerical simulationMing Shi, Jérôme Saint-Martin, Arnaud Bournel, Damien Querlioz, Philippe Dollfus, Jiongjong Mo, Nicolas Wichmann, L. Desplanque, Xavier Wallart, F. Danneville et al. · 2011 · IEEE International SOI Conference (SOI)
- Design considerations to enhance the modulation efficiency and cutoff frequency of AlGaN/InGaN/GaN HEMTsIman Rezanezhad Gatabi, D. W. Johnson, Jung Hwan Woo, Michael Babb, Harlan Rusty Harris · 2013 · International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
- Modelling and analysis of scaled MOSFET devices and circuit simulationMustafa M. EL-Muradi, Mohamed A. Elmansouri · 2009 · IEEE International Conference on Electronics, Circuits and Systems (ICECS)
- Strategy for in-line MOS transistor transport optimizationA. Cros · 2011 · IEEE International Conference on Microelectronic Test Structures (ICMTS)
- Electron transport in nanoscale semiconductor devices: ballistic versus quasiballistieNobuyuki Sano · 2005 · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
- A theoretical study of the performance of sub-micron MOSFET devices in the presence of edge potentialV Kiran, Ravinder Kumar, Abhilasha Singh, S. Gurunarayanan · 2005 · International Journal of Electronics
- Advanced technologies for enhancing drive current of high-density transistorsHidenobu Fukutome, Yoichi Momiyama · 2009 · International Workshop on Junction Technology
- Ballistic carrier transport in a quasi-two-dimensional nanoscale field effect transistor (FET)Ismail Saad, Mohammad Taghi Ahmadi, Razali Ismail, Vijay Kumar Arora · 2008 · IEEE International Conference on Semiconductor Electronics
- Backscattering coefficient accurate model for nanoscale Si-MOSFET transistorAbdoul M. Rjoub, Mamoun F. Al‐Mistarihi, Nedal R. Al-Taradeh · 2013 · IEEE Faible Tension Faible Consommation
- Ion Species Dependence of Relaxation Phenomena of Strained SiGe Layers Formed by Ion-Implantation-Induced Relaxation TechniqueTomohisa Mizuno, Juria Takehi, Youhki Abe, Hiromu Akamatsu · 2013 · Japanese Journal of Applied Physics
- Silicon based nano-MOSFET: New materials, new device architectures, and new challenges for device simulationENRICO SANGIORGI · 2008
- Closed-form Model of Barrier Height in Bulk MOSFET Including 2D Effects and Electron StatisticsMichaela Weidemann, Melanie Jung, Alexander Kloes · 2006 · IEEE International Conference on Solid-State and Integrated Circuit Technology
- Electronics from the bottom up: An approach to 21st century electronic devicesMark Lundstrom · 2008
- Extended design window of resonant plasma-wave transistor for terahertz emitter by considering degenerate carrier velocity model with Fermi–Dirac distributionJong Yul Park, Sung-Ho Kim, K.R. Kim · 2015 · Japanese Journal of Applied Physics
- ovel Aspects ofanoscale TransistorsKenji Natori, Takashi Kurusu · 2006
- Performance study of Ballistic and Quasi-Ballistic on Double-Gate MOSFETs 6T SRAM cellAutran J-L, Jaud M-A, G. Le Carval, Sbastien Martinie, Daniela Munteanu, Olivier Thomas · 2009 · TechConnect Briefs
- BALLISTIC CARRIER TRANSPORTIN A QUASI-TWO DIMENSIONALNANOSCALEFIELD EFFECT TRANSISTOR(FET)Ismail Saad, Mohammad Taghi Ahmadi, Razali Ismaie, Vijay Kumar Arora · 2008
- Monte Carlo Simulation of p- and n-channel GOI MOSFETs by Solving the QuantumGang Du, Xiaoyan Liu, Zhiliang Xia, Jinfeng Kang, Yi Wang, Ruqi Han, H.Y. Yu, Dim‐Lee Kwong · 2005
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- An experimental study on channel backscattering in high-k/metal gate nMOSFETsHyun Chul Sagong, Chang Yong Kang, Chang-Woo Sohn, Eui-Young Jeong, Do-Young Choi, Sanghyun Lee, Ye-Ram Kim, Jun-Woo Jang, Yoon‐Ha Jeong · 2012 · IEEE International Integrated Reliability Workshop final report
- Monte Carlo modeling of nanometer scale MOSFETsENRICO SANGIORGI, Pierpaolo Palestri, David Esseni, C. Fiegna, L. Selmi · 2007 · International Workshop on Physics of Semiconductor Devices
- Novel aspects of nanoscale transistorsKenji Natori, Takashi Kurusu · 2006 · International Workshop on Nano CMOS (IWNC)
- Investigation of scattering mechanism in nano-scale double gate In0.53Ga0.47As nMOSFETs by a deterministic BTE solverShaoyan Di, Zhiyuan Lun, Pengying Chang, Lei Shen, Kai Zhao, Tiao Lu, Gang Du, Xiaoyan Liu · 2016 · International Conference on Simulation of Semiconductor Processes and Devices