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Comparison of error rates in combinational and sequential logic
Abstract
A pulsed laser was used to demonstrate that, for transients much shorter than the clock period, error rates in sequential logic were independent of frequency, whereas error rates in combinational logic were linearly dependent on frequency. In addition, by measuring the error rate as a function of laser pulse energy for fixed clock frequency, the logarithmic dependence of the SEU vulnerable time period prior to the clock edge in combinational logic was established. A mixed mode circuit simulator program was used to successfully model the dynamic response of the logic circuit to pulses of laser light.
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Citations
Cited by
Radiation-induced soft errors in advanced semiconductor technologies
Baumann, R. C. (2005) · IEEE Transactions on Device and Materials Reliability · doi:10.1109/tdmr.2005.853449 · Cited by 1,549
Modeling the effect of technology trends on the soft error rate of combinational logic
Shivakumar, P., Kistler, M., Keckler, S. W., Burger, D., & Alvisi, L. (2003) · Proceedings International Conference on Dependable Systems and Networks · doi:10.1109/dsn.2002.1028924 · Cited by 1,449
Soft Errors in Advanced Computer Systems
Baumann, R. (2005) · IEEE Design and Test of Computers · doi:10.1109/mdt.2005.69 · Cited by 831
Characterizing the effects of transient faults on a high-performance processor pipeline
Wang, N. J., Quek, J., Rafacz, T. M., & Patel, S. J. (2004) · International Conference on Dependable Systems and Networks, 2004 · doi:10.1109/dsn.2004.1311877 · Cited by 397
Soft error rate mitigation techniques for modern microcircuits
Mavis, D. G., & Eaton, P. H. (2003) · 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) · doi:10.1109/relphy.2002.996639 · Cited by 369
Metadata
- Authors
- Buchner, S., Baze, M., Brown, D., McMorrow, D., & Melinger, J.
- Venue
- IEEE Transactions on Nuclear Science
- Published
- 1997-12
- Volume
- 44
- Issue
- 6
- Pages
- 2209-2216
- ISSN
- 0018-9499 (ISSN-L)
- 1558-1578
- OpenAlex
- W2113626924
- Cited by
- 244
- References
- 0
- FWCI
- 4.52
- Type
- journal article
- Language
- en
- Open access
- closed
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- Buchner, S., Baze, M., Brown, D., McMorrow, D., & Melinger, J. (1997). Comparison of error rates in combinational and sequential logic. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/23.659037
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