The DOI matches its Crossref record; 15 of the 15 references it cites were found in a registry or an index.
Soft Errors in Advanced Computer Systems
Abstract
As the dimensions and operating voltages of computer electronics shrink to satisfy consumers' insatiable demand for higher density, greater functionality, and lower power consumption, sensitivity to radiation increases dramatically. In terrestrial applications, the predominant radiation issue is the soft error, whereby a single radiation event causes a data bit stored in a device to be corrupted until new data is written to that device. This article comprehensively analyzes soft-error sensitivity in modern systems and shows it to be application dependent. The discussion covers ground-level radiation mechanisms that have the most serious impact on circuit operation along with the effect of technology scaling on soft-error rates in memory and logic.
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Citations
Cites
Basic mechanisms and modeling of single-event upset in digital microelectronics
Dodd, P. E., & Massengill, L. W. (2003) · IEEE Transactions on Nuclear Science · doi:10.1109/tns.2003.813129 · Cited by 1,169
Single event upset at ground level
Normand, E. (1996) · IEEE Transactions on Nuclear Science · doi:10.1109/23.556861 · Cited by 620
Soft error rate mitigation techniques for modern microcircuits
Mavis, D. G., & Eaton, P. H. (2003) · 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) · doi:10.1109/relphy.2002.996639 · Cited by 369
Comparison of error rates in combinational and sequential logic
Buchner, S., Baze, M., Brown, D., McMorrow, D., & Melinger, J. (1997) · IEEE Transactions on Nuclear Science · doi:10.1109/23.659037 · Cited by 244
A New Physical Mechanism for Soft Errors in Dynamic Memories
May, T. C., & Woods, M. H. (1978) · 16th International Reliability Physics Symposium · doi:10.1109/irps.1978.362815 · Cited by 239
The effect of sea level cosmic rays on electronic devices
Ziegler, J. F., & Lanford, W. A. (1981) · Journal of Applied Physics · doi:10.1063/1.329243 · Cited by 141
Single-event effects in SOI technologies and devices
Musseau, O. (1996) · IEEE Transactions on Nuclear Science · doi:10.1109/23.490904 · Cited by 124
A digital CMOS design technique for SEU hardening
Baze, M. P., Buchner, S. P., & McMorrow, D. (2000) · IEEE Transactions on Nuclear Science · doi:10.1109/23.903815 · Cited by 122
Boron compounds as a dominant source of alpha particles in semiconductor devices
Baumann, R., Hossain, T. Z., Murata, S., et al. (1995) · IEEE International Reliability Physics Symposium proceedings · doi:10.1109/relphy.1995.513695 · Cited by 110
Self-citationSRAM SER in 90, 130 and 180 nm bulk and SOI technologies
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Cited by
DRAM errors in the wild: a large-scale field study
Schroeder, B., Pinheiro, E., & Weber, W.-D. (2009) · Proceedings of the eleventh international joint conference on Measurement and modeling of computer systems · doi:10.1145/1555349.1555372 · Cited by 557
Rech, P. (2024) · IEEE Transactions on Nuclear Science · doi:10.1109/tns.2024.3349956 · Cited by 75
Demystifying the System Vulnerability Stack: Transient Fault Effects Across the Layers
Papadimitriou, G., & Gizopoulos, D. (2021) · 2021 ACM/IEEE 48th Annual International Symposium on Computer Architecture (ISCA) · doi:10.1109/isca52012.2021.00075 · Cited by 74
Metadata
- Authors
- Baumann, R.
- Venue
- IEEE Design and Test of Computers
- Published
- 2005-05
- Volume
- 22
- Issue
- 3
- Pages
- 258-266
- ISSN
- 0740-7475 (ISSN-L)
- OpenAlex
- W2152652532
- Cited by
- 831
- References
- 15
- FWCI
- 36.23
- Type
- journal article
- Language
- en
- Open access
- closed
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
