A 500 mV 650 pW random number generator in 130 nm CMOS for a UWB localization system
Abstract
This paper presents an ultra low power random number generator (RNG) for a UWB RFID and Localization system. It amplifies noise by using a chain of identical inverters to generate a serial output stream of random bits. The circuit consumes only 0.65nW from a supply voltage VDD= 0.5V. The degree of randomness of the output bitstream is examined with the NIST tests.
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A 440-nA True Random Number Generator for Passive RFID Tags
Balachandran, G. K., & Barnett, R. E. (2008) · IEEE Transactions on Circuits and Systems I Regular Papers · doi:10.1109/tcsi.2008.927220 · Cited by 48 · see citing works
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True Random Number Generators Using Electrical Noise
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“Hence, some researches focused on these problems were carried out, including Si nano-devices [15], identical inverters [16], oxide breakdown [17], [18] and random telegraph noise [19].”
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- Authors
- De Roover, C., & Steyaert, M.
- Affiliations
- KU Leuven (BE)
- ORCID
- Steyaert, Michiel
- Venue
- 2010 Proceedings of ESSCIRC
- Publisher
- IEEE
- Published
- 2010-09
- Pages
- 278-281
- ISSN
- 1930-8833 (ISSN-L)
- OpenAlex
- W2004694319
- Cited by
- 10
- References
- 7
- Citations by year
- 2025: 1 · 2021: 1 · 2019: 1 · 2018: 2 · 2016: 3 · 2015: 1 · 2012: 1
- FWCI
- 0.44
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- European Solid-State Circuits Conference (ESSCIRC) (publishedVersion)
- Funders
- National Institute of Standards and Technology
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Low-power high-performance VLSI design
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Radio Frequency Integrated Circuit Design
- Physical Sciences › Engineering › Biomedical Engineering › Analog and Mixed-Signal Circuit Design
- Keywords
- random number generators, ultra-low power, ultra-wideband, UWB positioning, noise amplification, inverter chain, 130 nm CMOS, NIST randomness tests
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