$\mu $ RNG: A 300–950 mV, 323 Gbps/W All-Digital Full-Entropy True Random Number Generator in 14 nm FinFET CMOS
Abstract
This paper describes μRNG, an ultra-lightweight all-digital full-entropy true-random number generator (TRNG), fabricated in 14 nm high-k/metal-gate FinFET CMOS, targeted for on-die generation of cryptographic keys in energy-constrained IoT and wearable platforms. The μRNG combines the entropy of multiple independent sources to generate an output bitstream that is indistinguishable from an ideal unbiased entropy source. Three independent self-calibrating all-digital entropy sources, coupled with XOR feedback shift-register based correlation suppressors and an in-line compact Barak-Impagliazzo- Wigderson (BIW) extractor enable ultra-low energy consumption of 3 pJ/full-entropy bit with a dense layout occupying 1008 μm2, while achieving: (i) 162.5 Mbps full-entropy throughput at 1.3 GHz operation, with total power consumption of 1.5 mW and leakage power component of 90 μW, measured at 0.75 V, 25°C, (ii) mutually uncorrelated raw bitstreams from the three entropy sources with phi-coefficient cross-correlation∞> 0.99, (iv) hysteresis-free extracted output for lags 1-1000, with ACF ~0 within 95% confidence bounds of a Gaussian distribution (μ = 0, σ2= 0.002), (v) wide operating supply voltage range of 300-950 mV with throughput scaling to 225 Mbps at 950 mV and robust subthreshold voltage performance of 400 Kbps, 4 μW, measured at 300 mV, 25°C, (vi) peak energy-efficiency of 323 Gbps/W at near-threshold voltage of 400 mV, with full-entropy throughput of 8.6 Mbps, total power consumption of 27 μW, (vii) 6.5× reduction in gate count and 5.4× lower energy consumption compared to conventional AES-based entropy extractors.
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
Intel's improved metastability-based TRNG using in-line decorrelators and a lightweight BIW extractor provided a throughput of 162.5 Mbps at 1.3 GHz operation, with 1.5 mW total power consumption and a 90 μW leakage component.
“Subsequently, Intel improved this TRNG using in-line decorrelators and a lightweight BIW extractor.It demonstrated that this TRNG could provide a throughput of 162.5 Mbps at 1.3 GHz operation, with 1.5 mW total power consumption and a 90 µW leakage component [11].”
From True Random Number Generators Using Electrical Noise (2019) · cites this paper as [11]
Cites
Bassham, L. E., Rukhin, A. L., Soto, J., Nechvatal, J. R., Smid, M. E., Barker, E. B., Leigh, S. D., Levenson, M., Vangel, M., Banks, D. L., et al. (2010) · NIST Special Publication 800-22 Revision 1a · doi:10.6028/nist.sp.800-22r1a · Cited by 3,617 · see citing works
Mathematical Methods of Statistics.
David, F. N., & Cramer, H. L. (1947) · Biometrika · doi:10.2307/2332454 · Cited by 1,782 · see citing works
Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers
Holcomb, D. E., Burleson, W. P., & Fu, K. (2008) · IEEE Transactions on Computers · doi:10.1109/tc.2008.212 · Cited by 846 · see citing works
A Provably Secure True Random Number Generator with Built-In Tolerance to Active Attacks
Sunar, B., Martin, W. J., & Stinson, D. R. (2007) · IEEE Transactions on Computers · doi:10.1109/tc.2007.250627 · Cited by 673 · see citing works
Natarajan, S., Agostinelli, M., Akbar, S. A., Bost, M. C., Bowonder, A., Chikarmane, V., Chouksey, S., Dasgupta, A., Fischer, K., Fu, Q., et al. (2014) · Technical digest - International Electron Devices Meeting/Technical digest · doi:10.1109/iedm.2014.7046976 · Cited by 543 · see citing works
Recommendation for the Entropy Sources Used for Random Bit Generation
Turan, M. S., Barker, E., Kelsey, J., McKay, K. A., Baish, M. L., & Boyle, M. (2018) · NIST Special Publication 800-90B · doi:10.6028/nist.sp.800-90b · Cited by 489 · cited 2× · see citing works
“The Markov test from NIST SP800–90B [26] measures dependencies between consecutive μRNG outputs by estimating the min-entropy present in a given k-long chain of output bits.”
MethodA noise-based IC random number generator for applications in cryptography
Petrie, C. S., & Connelly, J. A. (2000) · IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications · doi:10.1109/81.847868 · Cited by 487 · see citing works
Mathew, S. K., Srinivasan, S., Anders, M. A., Kaul, H., Hsu, S. K., Sheikh, F., Agarwal, A., Satpathy, S., & Krishnamurthy, R. K. (2012) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2012.2217631 · Cited by 195 · see citing works
Self-citationNew Methods for Digital Generation and Postprocessing of Random Data
Golic, J. D. J. (2006) · IEEE Transactions on Computers · doi:10.1109/tc.2006.164 · Cited by 188 · see citing works
High-Speed True Random Number Generation with Logic Gates Only
Dichtl, M., & Golić, J. D. (2007) · Lecture Notes in Computer Science · doi:10.1007/978-3-540-74735-2_4 · Cited by 182 · see citing works
Randomness Extraction and Key Derivation Using the CBC, Cascade and HMAC Modes
Dodis, Y., Gennaro, R., Håstad, J., Krawczyk, H., & Rabin, T. (2004) · Lecture notes in computer science · doi:10.1007/978-3-540-28628-8_30 · Cited by 175 · see citing works
Implementation and Testing of High-Speed CMOS True Random Number Generators Based on Chaotic Systems
Pareschi, F., Setti, G., & Rovatti, R. (2010) · IEEE Transactions on Circuits and Systems I Regular Papers · doi:10.1109/tcsi.2010.2052515 · Cited by 147 · see citing works
FPGA Vendor Agnostic True Random Number Generator
Schellekens, D., Preneel, B., & Verbauwhede, I. M. R. (2006) · International Conference on Field Programmable Logic and Applications (FPL) · doi:10.1109/fpl.2006.311206 · Cited by 141 · see citing works
Analysis and Enhancement of Random Number Generator in FPGA Based on Oscillator Rings
Wold, K., & Tan, C. H. (2008) · International Conference on ReConFigurable Computing and FPGAs (ReConFig) · doi:10.1109/reconfig.2008.17 · Cited by 137 · see citing works
Extracting Randomness Using Few Independent Sources
Barak, B., Impagliazzo, R., & Wigderson, A. (2006) · SIAM Journal on Computing · doi:10.1137/s0097539705447141 · Cited by 104 · see citing works
True Random Number Generator circuits based on single- and multi-phase beat frequency detection
Tang, Q., Kim, B., Lao, Y., Parhi, K. K., & Kim, C. H. (2014) · Proceedings of the IEEE 2014 Custom Integrated Circuits Conference · doi:10.1109/cicc.2014.6946136 · Cited by 75 · see citing works
A 3 $\mu$W CMOS True Random Number Generator With Adaptive Floating-Gate Offset Cancellation
Holleman, J., Bridges, S., Otis, B. P., & Diorio, C. (2008) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2008.920327 · Cited by 63 · see citing works
(2002) · Cited by 60 · see citing works
Physical random number generator based on MOS structure after soft breakdown
Yasuda, S., Satake, H., Tanamoto, T., Ohba, R., Uchida, K., & Fujita, S. (2004) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2004.831480 · Cited by 46 · see citing works
Fully Digital Random Bit Generators for Cryptographic Applications
Bucci, M., & Luzzi, R. (2008) · IEEE Transactions on Circuits and Systems I: Regular Papers · doi:10.1109/tcsi.2008.916446 · Cited by 46 · see citing works
Srinivasan, S., Mathew, S. K., Erraguntla, V., & Krishnamurthy, R. K. (2009) · International Conference on VLSI Design · doi:10.1109/vlsi.design.2009.69 · Cited by 41 · see citing works
Self-citationvon Kaenel, V., & Takayanagi, T. (2007) · Custom Integrated Circuits Conference · doi:10.1109/cicc.2007.4405730 · Cited by 21 · see citing works
A 500 mV 650 pW random number generator in 130 nm CMOS for a UWB localization system
De Roover, C., & Steyaert, M. (2010) · 2010 Proceedings of ESSCIRC · doi:10.1109/esscirc.2010.5619875 · Cited by 10 · see citing works
An oscillator-based true random number generator with process and temperature tolerance
Amaki, T., Hashimoto, M., & Onoye, T. (2015) · doi:10.1109/aspdac.2015.7058918 · Cited by 8 · see citing works
Flagged first, then by citations
2 of the 26 references couldn’t be matched to a known paper.
Cited by
Sorted by citations
Memristive technologies for data storage, computation, encryption, and radio-frequency communication
Lanza, M., Sebastian, A., Lu, W. D., Gallo, M. L., Chang, M., Akinwande, D., Puglisi, F. M., Alshareef, H. N., Liu, M., & Roldán, J. B. (2022) · Science · doi:10.1126/science.abj9979 · Cited by 714 · see citing works
Integer factorization using stochastic magnetic tunnel junctions
Borders, W. A., Pervaiz, A. Z., Fukami, S., Camsari, K. Y., Ohno, H., & Datta, S. (2019) · Nature · doi:10.1038/s41586-019-1557-9 · Cited by 637 · see citing works
An Overview of Hardware Security and Trust: Threats, Countermeasures, and Design Tools
Hu, W., Chang, C.-H., Sengupta, A., Bhunia, S., Kastner, R., & Li, H. H. (2020) · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · doi:10.1109/tcad.2020.3047976 · Cited by 226 · see citing works
Satpathy, S. K., Mathew, S. K., Kumar, R., Suresh, V., Anders, M. A., Kaul, H., Agarwal, A., Hsu, S., Krishnamurthy, R. K., & De, V. (2019) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2018.2886350 · Cited by 114 · see citing works
Self-citationTrends in Hardware Security: From Basics to ASICs
Alioto, M. (2019) · IEEE Solid-State Circuits Magazine · doi:10.1109/mssc.2019.2923503 · Cited by 114 · see citing works
Probabilistic Neural Computing with Stochastic Devices
Misra, S., Bland, L. C., Cardwell, S., Incorvia, J. A. C., James, C. D., Kent, A. D., Schuman, C. D., Smith, J. D., & Aimone, J. B. (2022) · Advanced Materials · doi:10.1002/adma.202204569 · Cited by 107 · see citing works
A 82-nW Chaotic Map True Random Number Generator Based on a Sub-Ranging SAR ADC
Kim, M., Ha, U., Lee, K. J., Lee, Y., & Yoo, H.-J. (2017) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2017.2694833 · Cited by 97 · see citing works
Energy-efficient superparamagnetic Ising machine and its application to traveling salesman problems
Si, J., Yang, S., Cen, Y., Chen, J., Huang, Y., Yao, Z., Kim, D.-J., Cai, K., Yoo, J., Fong, X., et al. (2024) · Nature Communications · doi:10.1038/s41467-024-47818-z · Cited by 100 · see citing works
Hardware Designs for Security in Ultra-Low-Power IoT Systems: An Overview and Survey
Yang, K., Blaauw, D. T., & Sylvester, D. (2017) · IEEE Micro · doi:10.1109/mm.2017.4241357 · Cited by 92 · see citing works
True Random Number Generators Using Electrical Noise
Gong, L., Zhang, J., Liu, H., Sang, L., & Wang, Y. (2019) · IEEE Access · doi:10.1109/access.2019.2939027 · Cited by 77 · see citing works
“For their all-digital designs and simple structures, TRNGs using metastable circuits are increasingly popular [11], [55], [68], [70].”
BackgroundLarimian, S., Mahmoodi, M. R., & Strukov, D. B. (2020) · IEEE Transactions on Electron Devices · doi:10.1109/ted.2020.2976632 · Cited by 56 · see citing works
Cao, Y., Zhao, X., Zheng, W., Zheng, Y., & Chang, C.-H. (2021) · IEEE Transactions on Circuits and Systems I Regular Papers · doi:10.1109/tcsi.2021.3087512 · Cited by 51 · see citing works
Stochastic Insulator-to-Metal Phase Transition-Based True Random Number Generator
Jerry, M., Ni, K., Parihar, A., Raychowdhury, A., & Datta, S. (2017) · IEEE Electron Device Letters · doi:10.1109/led.2017.2771812 · Cited by 47 · see citing works
Zhang, R., Wang, X., Liu, K., & Shinohara, H. (2022) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2021.3137312 · Cited by 47 · see citing works
The Odyssey of Entropy: Cryptography
Zolfaghari, B., Bibak, K., & Koshiba, T. (2022) · Entropy · doi:10.3390/e24020266 · Cited by 41 · see citing works
Pazos, S. M., Zheng, W., Zanotti, T., Aguirre, F. L., Becker, T. E., Shen, Y., Zhu, K., Yuan, Y. J., Wirth, G. I., Puglisi, F. M., et al. (2022) · Nanoscale · doi:10.1039/d2nr06222d · Cited by 40 · see citing works
Pammu, A. A., Ho, W., Lwin, N. K. Z., Chong, K., & Gwee, B. (2018) · IEEE Transactions on Information Forensics and Security · doi:10.1109/tifs.2018.2869344 · Cited by 39 · see citing works
Unified Analog PUF and TRNG Based on Current-Steering DAC and VCO
Danesh, M., Venkatasubramaniyan, A. B., Kapoor, G., Ramesh, N., Sadasivuni, S., Chandrasekaran, S. T., & Sanyal, A. (2020) · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · doi:10.1109/tvlsi.2020.3011648 · Cited by 38 · see citing works
A 108 F2/Bit Fully Reconfigurable RRAM PUF Based on Truly Random Dynamic Entropy of Jitter Noise
Zhao, Q., Zheng, W., Zhao, X., Cao, Y., Zhang, F., & Law, M. K. (2020) · IEEE Transactions on Circuits and Systems I Regular Papers · doi:10.1109/tcsi.2020.3008407 · Cited by 37 · see citing works
Japa, A., Majumder, M. K., Sahoo, S. K., Vaddi, R., & Kaushik, B. K. (2021) · IEEE Circuits and Systems Magazine · doi:10.1109/mcas.2021.3092532 · Cited by 35 · see citing works
Cryptographic transistor for true random number generator with low power consumption
Kim, S.-I., You, H.-J., Kim, M.-S., An, U.-S., Kim, M.-S., Lee, D. H., Ryu, S.-T., & Choi, Y.-K. (2024) · Science Advances · doi:10.1126/sciadv.adk6042 · Cited by 33 · see citing works
An Overview of Spintronic True Random Number Generator
Fu, Z., Tang, Y., Zhao, X., Lü, K., Dong, Y., Shukla, A., Zhu, Z., & Yang, Y. (2021) · Frontiers in Physics · doi:10.3389/fphy.2021.638207 · Cited by 33 · see citing works
Nano-Intrinsic True Random Number Generation: A Device to Data Study
Kim, J., Nili, H., Truong, N. D., Ahmed, T., Yang, J., Jeong, D. S., Sriram, S., Ranasinghe, D. C., Ippolito, S. J., Chun, H., et al. (2019) · IEEE Transactions on Circuits and Systems I Regular Papers · doi:10.1109/tcsi.2019.2895045 · Cited by 31 · see citing works
A Fully Digital True Random Number Generator With Entropy Source Based in Frequency Collapse
Serrano, R., Duran, C., Hoang, T.-T., Sarmiento, M., Nguyen, K.-D., Tsukamoto, A., Suzaki, K., & Pham, C. (2021) · IEEE Access · doi:10.1109/access.2021.3099534 · Cited by 27 · see citing works
Pamula, V. R., Sun, X., Kim, S., Rahman, F. U., Zhang, B., & Sathe, V. (2018) · IEEE Solid-State Circuits Letters · doi:10.1109/lssc.2019.2896777 · Cited by 27 · see citing works
Carreira, L. B., Danielson, P., Rahimi, A. A., Luppe, M., & Gupta, S. (2020) · IEEE Transactions on Circuits and Systems I Regular Papers · doi:10.1109/tcsi.2019.2960694 · Cited by 26 · see citing works
Park, J., Kim, B., & Sim, J. (2022) · IEEE Transactions on Circuits & Systems II Express Briefs · doi:10.1109/tcsii.2022.3184950 · Cited by 25 · see citing works
Jitter-Quantizing-Based TRNG Robust Against PVT Variations
Lu, Y., Liang, H., Yao, L., Wang, X., Qi, H., Yi, M., Jiang, C., & Huang, Z. (2020) · IEEE Access · doi:10.1109/access.2020.3000231 · Cited by 23 · see citing works
0.36-mW, 52-Mbps True Random Number Generator Based on a Stochastic Delta–Sigma Modulator
Chandrasekaran, S. T., Karnam, V. E. G., & Sanyal, A. (2020) · IEEE Solid-State Circuits Letters · doi:10.1109/lssc.2020.3010901 · Cited by 22 · see citing works
Fully Synthesizable Unified True Random Number Generator and Cryptographic Core
Taneja, S., & Alioto, M. (2021) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2021.3090247 · Cited by 22 · see citing works
Classification of random number generator applications in IoT: A comprehensive taxonomy
Seyhan, K., & Akleylek, S. (2022) · Journal of Information Security and Applications · doi:10.1016/j.jisa.2022.103365 · Cited by 21 · see citing works
Hybrid CMOS-RRAM True Random Number Generator Exploiting Coupled Entropy Sources
Equbal, M. S., Ketkar, T., & Sahay, S. (2023) · IEEE Transactions on Electron Devices · doi:10.1109/ted.2023.3241122 · Cited by 21 · see citing works
A 10-Gb/s True Random Number Generator Using ML-Resistant Middle Square Method
Kim, J., & Chae, H. (2024) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2023.3346428 · Cited by 21 · see citing works
True Random Number Generator Based on the Variability of the High Resistance State of RRAMs
Akbari, M., Mirzakuchaki, S., Arumí, D., Manich, S., Gómez‐Pau, Á., Campabadal, F., González, M. B., & Rodriguez-Montanes, R. (2023) · IEEE Access · doi:10.1109/access.2023.3290896 · Cited by 19 · see citing works
Choi, W., Kwon, O., Lee, J., Oh, S., Heo, S., Ban, S., Seo, Y., Kim, D., & Hwang, H. (2024) · Applied Physics Reviews · doi:10.1063/5.0183292 · Cited by 17 · see citing works
Koh, D., Wang, Q., McGoldrick, B. C., Chou, C.-T., Liu, L., & Baldo, M. A. (2025) · Nano Letters · doi:10.1021/acs.nanolett.4c05728 · Cited by 17 · see citing works
Encrypted Physical Layer Communications Using Synchronized Hyperchaotic Maps
Tang, X., & Mandal, S. (2021) · IEEE Access · doi:10.1109/access.2021.3051810 · Cited by 16 · see citing works
Random Number Generation Using Inertial Measurement Unit Signals for On-Body IoT Devices
Sun, Y., & Lo, B. P. L. (2018) · Living in the Internet of Things: Cybersecurity of the IoT · doi:10.1049/cp.2018.0028 · Cited by 16 · see citing works
Hardware-Efficient Post-Processing Architectures for True Random Number Generators
Rožić, V., & Verbauwhede, I. M. R. (2018) · IEEE Transactions on Circuits & Systems II Express Briefs · doi:10.1109/tcsii.2018.2881559 · Cited by 16 · see citing works
Provably Secure Randomness Generation from Switching Probability of Magnetic Tunnel Junctions
Ng, H. J., Yang, S., Yao, Z., Yang, H., & Lim, C. C. W. (2023) · Physical Review Applied · doi:10.1103/physrevapplied.19.034077 · Cited by 15 · see citing works
Lin, B., Gao, B., Pang, Y., Tang, J., Qian, H., & Wu, H. (2020) · IEEE Journal of the Electron Devices Society · doi:10.1109/jeds.2020.3019266 · Cited by 14 · see citing works
Design and Implementation of a Secure RISC-V Microprocessor
Stangherlin, K., & Sachdev, M. (2022) · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · doi:10.1109/tvlsi.2022.3203307 · Cited by 14 · see citing works
Wei, X., Xiu, L., & Cai, Y. (2023) · IEEE Transactions on Information Forensics and Security · doi:10.1109/tifs.2023.3322602 · Cited by 14 · see citing works
Defeating Silicon Reverse Engineering Using a Layout-Level Standard Cell Camouflage
Gomez, H., Duran, C., & Roa, E. (2019) · IEEE Transactions on Consumer Electronics · doi:10.1109/tce.2018.2890616 · Cited by 14 · see citing works
Enabling Ubiquitous Hardware Security via Energy-Efficient Primitives and Systems : (Invited Paper)
Alioto, M., & Taneja, S. (2019) · Custom Integrated Circuits Conference · doi:10.1109/cicc.2019.8780123 · Cited by 14 · see citing works
The Unpredictability Analysis of Boolean Chaos
Gong, L., Zhang, J., Sang, L., Liu, H., & Wang, Y. (2019) · IEEE Transactions on Circuits & Systems II Express Briefs · doi:10.1109/tcsii.2019.2949571 · Cited by 14 · see citing works
Fully 2D Materials‐Based Resistive Switching Circuits for Advanced Data Encryption
Han, T., Aguirre, F. L., Zhu, K., Yuan, B., Pazos, S. M., Zhang, N., Wang, S., Li, S., & Lanza, M. (2024) · Advanced Functional Materials · doi:10.1002/adfm.202403029 · Cited by 13 · see citing works
A Robust and Healthy Against PVT Variations TRNG Based on Frequency Collapse
Serrano, R., Duran, C., Sarmiento, M., Hoang, T.-T., Tsukamoto, A., Suzaki, K., & Pham, C. (2022) · IEEE Access · doi:10.1109/access.2022.3167690 · Cited by 13 · see citing works
Becle, E., Prenat, G., Talatchian, P., Anghel, L., & Prejbeanu, L. (2022) · IEEE Transactions on Circuits and Systems I Regular Papers · doi:10.1109/tcsi.2022.3173030 · Cited by 13 · see citing works
Alioto, M. (2022) · IEEE Open Journal of the Solid-State Circuits Society · doi:10.1109/ojsscs.2022.3223274 · Cited by 15 · see citing works
A Strong Physically Unclonable Function With >2⁸⁰ CRPs and <1.4% BER Using Passive ReRAM Technology
Mahmoodi, M. R., Fahimi, Z., Larimian, S., Nili, H., Kim, H., & Strukov, D. B. (2020) · IEEE Solid-State Circuits Letters · doi:10.1109/lssc.2020.3010255 · Cited by 13 · see citing works
De-Correlation and De-Bias Post-Processing Circuits for True Random Number Generator
Zhang, R., Zhang, H., Wang, X., Ziyang, Y., Liu, K., Nishizawa, S., Niitsu, K., & Shinohara, H. (2024) · IEEE Transactions on Circuits and Systems I Regular Papers · doi:10.1109/tcsi.2024.3421663 · Cited by 12 · see citing works
0.6–1.2 V, 0.22 pJ/bit True Random Number Generator Based on SAR ADC
Jayaraj, A., Gujarathi, N. N., Venkatesh, I., & Sanyal, A. (2019) · IEEE Transactions on Circuits & Systems II Express Briefs · doi:10.1109/tcsii.2019.2949775 · Cited by 12 · see citing works
Ogasahara, Y., Hori, Y., Katashita, T., Iizuka, T., Awano, H., Ikeda, M., & Koike, H. (2019) · Integration · doi:10.1016/j.vlsi.2019.12.002 · Cited by 11 · see citing works
Beware of Discarding Used SRAMs: Information is Stored Permanently
Hovanes, J., Zhong, Y., & Guin, U. (2022) · IEEE Physical Assurance and Inspection of Electronics (PAINE) · doi:10.1109/paine56030.2022.10014900 · Cited by 10 · see citing works
Zhang, R., Wang, X., & Shinohara, H. (2021) · IEICE Transactions on Electronics · doi:10.1587/transele.2020cdp0006 · Cited by 10 · see citing works
Japa, A., Majumder, M. K., Sahoo, S. K., & Vaddi, R. (2021) · International Journal of Circuit Theory and Applications · doi:10.1002/cta.3030 · Cited by 10 · see citing works
A Novel 0.04 pJ/bit Dynamic TRNG using Bit Reconfigurable Ring Oscillators
Williams, S., Khalil, K., & Bayoumi, M. (2024) · IEEE SoutheastCon · doi:10.1109/southeastcon52093.2024.10500289 · Cited by 10 · see citing works
Practical attack on a quantum random-number generator via injection of source-signal fluctuations
Zhang, B., Li, L., Xu, Y., Tan, Z., Shi, J., Huang, P., Wang, T., & Zeng, G. (2025) · Physical Review Applied · doi:10.1103/k3c9-ngt1 · Cited by 9 · see citing works
The Cost of a True Random Bit—On the Electronic Cost Gain of ASIC Time-Domain-Based TRNGs
Klein, N., Harel, E., & Levi, I. (2021) · Cryptography · doi:10.3390/cryptography5030025 · Cited by 9 · see citing works
A Compact and Power-Efficient Noise Generator for Stochastic Simulations
Zhao, H., Sarpeshkar, R., & Mandal, S. (2022) · IEEE Transactions on Circuits and Systems I Regular Papers · doi:10.1109/tcsi.2022.3199561 · Cited by 8 · see citing works
Japa, A., Majumder, M. K., Sahoo, S. K., & Vaddi, R. (2019) · IET Circuits Devices & Systems · doi:10.1049/iet-cds.2018.5297 · Cited by 9 · see citing works
An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs
Xu, X., Liang, H., Zhou, K., Ma, G., Huang, Z., Yi, M., Ni, T., & Lu, Y. (2018) · Proceedings - Asian Test Symposium/Proceedings · doi:10.1109/ats.2018.00022 · Cited by 8 · see citing works
Low area overhead DPA countermeasure exploiting tunnel transistor‐based random number generator
Japa, A., Majumder, M. K., Sahoo, S. K., & Vaddi, R. (2020) · IET Circuits Devices & Systems · doi:10.1049/iet-cds.2019.0504 · Cited by 7 · see citing works
Li, X., Wang, Y., Yi-ming, Y., Lv, S., Luo, Q., Wang, X., Xu, X., Lei, D., & Zhang, F. (2023) · IEEE Transactions on Electron Devices · doi:10.1109/ted.2023.3288839 · Cited by 6 · see citing works
33-200Mbps, 3pJ/Bit True Random Number Generator Based on CT Delta-Sigma Modulator
Chandrasekaran, S. T., Jayaraj, A., Ramesh, N., & Sanyal, A. (2021) · IEEE International Symposium on Circuits and Systems proceedings · doi:10.1109/iscas51556.2021.9401507 · Cited by 5 · see citing works
Kumar, D., Anand, R., Singh, S. V., Misra, P. K., Srivastava, A. K., & Goswami, M. (2020) · IET Circuits Devices & Systems · doi:10.1049/iet-cds.2019.0318 · Cited by 5 · see citing works
Gomez, H., Arenas, J., & Roa, E. (2020) · IET Circuits Devices & Systems · doi:10.1049/iet-cds.2019.0535 · Cited by 5 · see citing works
Tight-ES-TRNG: Improved Construction and Robustness Analysis
Levi, I., Bellizia, D., & Standaert, F. (2022) · SN Computer Science · doi:10.1007/s42979-022-01219-5 · Cited by 4 · see citing works
A Low Power CMOS Variable True Random Number Generator for LDPC Decoders
Nebhen, J. (2020) · Lecture notes in electrical engineering · doi:10.1007/978-981-15-4775-1_53 · Cited by 4 · see citing works
Elmitwalli, E., Ni, K., & Köse, S. (2021) · IEEE Access · doi:10.1109/access.2021.3120047 · Cited by 4 · see citing works
Metastability with Emerging Reconfigurable Transistors: Exploiting Ambipolarity for Throughput
Bhattacharjee, A., Rai, S., Rupani, A., Raitza, M., & Kumar, A. S. (2021) · IFIP/IEEE International Conference on Very Large Scale Integration · doi:10.1109/vlsi-soc53125.2021.9607015 · Cited by 4 · see citing works
True random number generators in modern cryptography: A review
Sharma, P., Naz, S. F., & Shah, A. P. (2026) · Memories - Materials Devices Circuits and Systems · doi:10.1016/j.memori.2026.100138 · Cited by 3 · see citing works
A Fully-Integrated CMOS Hyperchaotic Map for Obfuscated IoT Communications
Gu, B., Tang, X., Chen, C., & Mandal, S. (2021) · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · doi:10.1109/mwscas47672.2021.9531714 · Cited by 3 · see citing works
A High Throughput True Random Number Generator using Metastability and Chaos
Rohail, H., & Ramzan, R. M. (2022) · IEEE Interregional NEWCAS Conference (NEWCAS) · doi:10.1109/newcas52662.2022.9842126 · Cited by 3 · see citing works
Zhang, R., Zhang, H., Wang, X., Ziyang, Y., Liu, K., & Shinohara, H. (2023) · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · doi:10.1109/mwscas57524.2023.10406056 · Cited by 3 · see citing works
High speed true random number generator with a new structure of coarse-tuning PDL in FPGA
Fang, H., Wang, P., Cheng, X., & Zhou, K. (2018) · Journal of Semiconductors · doi:10.1088/1674-4926/39/3/035001 · Cited by 3 · see citing works
Gunasekaran, M., Jayaram, S., & Gunasekaran, S. (2025) · Analog Integrated Circuits and Signal Processing · doi:10.1007/s10470-025-02392-2 · Cited by 2 · see citing works
A comprehensive study on resistive random access memory based true random number generators
Zahoor, F. (2025) · Computers & Electrical Engineering · doi:10.1016/j.compeleceng.2025.110901 · Cited by 2 · see citing works
Random Telegraph Noise-Based True Random Number Generator for Fully Integrated Systems
Wirth, G. I., Alves, P. A. B., & da Silva, R. (2023) · Fluctuation and Noise Letters · doi:10.1142/s021947752350027x · Cited by 2 · see citing works
Cheng, K. M., Chen, Y., Crovetti, P., Martins, R. P., & Mak, P. (2024) · International Journal of Circuit Theory and Applications · doi:10.1002/cta.4065 · Cited by 2 · see citing works
PriML: An Electro-Optical Accelerator for Private Machine Learning on Encrypted Data
Zheng, M., Chen, F., Jiang, L., & Lou, Q. (2023) · International Symposium on Quality Electronic Design (ISQED) · doi:10.1109/isqed57927.2023.10129302 · Cited by 2 · see citing works
Entropy Sources from Tunnelling in Standard CMOS Structures
Keledjian, J., & Lehmann, T. (2024) · Circuits Systems and Signal Processing · doi:10.1007/s00034-024-02683-5 · Cited by 1 · see citing works
Aghdam, F. A., Erfanimehr, M., Ahmadi, H., Zarghami, A., Madani, S. A., & Rostami, A. (2024) · IEEE Access · doi:10.1109/access.2024.3513874 · Cited by 1 · see citing works
Kim, S.-I., Chin, H.-S., Han, J.-A., Kim, S., Kim, J., Lee, S., Lee, D. H., Kim, M., Ryu, S., & Choi, Y. (2025) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.5c18669 · Cited by 1 · see citing works
High-Speed Energy-Efficient True Random Number Generator Using Self-Compensating Comparator
Huang, X., & Islam, M. (2025) · IEEE Interregional NEWCAS Conference (NEWCAS) · doi:10.1109/newcas64648.2025.11107106 · Cited by 1 · see citing works
Embedded true random number generators enabled by hexagonal boron nitride memristors
Pazos, S. M., Zanotti, T., Zheng, W., Shen, Y., Zhu, K., Yuan, Y. J., Puglisi, F. M., Roldán, J. B., & Lanza, M. (2024) · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · doi:10.1109/ipfa61654.2024.10691091 · Cited by 1 · see citing works
A System for Generating Non-Uniform Random Variates using Graphene Field-Effect Transistors
Tye, N., Meech, J. T., Bilgin, B. A., & Stanley‐Marbell, P. (2020) · IEEE International Conference on Application-specific Systems, Architectures and Processors (ASAP) · doi:10.1109/asap49362.2020.00026 · Cited by 1 · see citing works
Ng, Y. C., Leung, B., Kononenko, M., & Safavi‐Naeini, S. (2018) · arXiv (Cornell University) · doi:10.48550/arxiv.1808.04851
Santos, M. L., Guilherme, J. M. C., & Horta, N. C. G. (2019) · Lecture notes in electrical engineering · doi:10.1007/978-3-030-15978-8_7
Analog Seizure Detection for Implanted Responsive NeurostimulationPreprint
Zaki, A. A., Parker, N. C., Kim, T.-Y., Ishak, S., Stovall, T. E., Peng, G., Dave, H., Harvey, J. H., Nourani, M., Hu, X., et al. (2021) · arXiv (Cornell University) · doi:10.48550/arxiv.2106.06590
Information-Theoretic Cryptography: Life Cycle, Ecosystem, and the Promise of Quantum-Inspired AI
Zolfaghari, B., Nemati, H., Yanai, N., & Bibak, K. (2023) · Springer eBooks · doi:10.1007/978-3-031-44807-2_6
A Lightweight Post-Processing Method for Voltage-Controlled MTJ based True Random Number Generator
Wang, Z., Chen, R., Gu, Y., Lee, A., Wu, D., & Kou, X. (2024) · IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) · doi:10.1109/apccas62602.2024.10808866
Metastability-based random number generator with current-controlled offset compensation
Talay, Y. (2025) · Analog Integrated Circuits and Signal Processing · doi:10.1007/s10470-024-02298-5
A Synthesizable Thyristor-Like Leakage-Based True Random Number Generator
Kim, S. H., Kim, J. H., & Lee, J. (2025) · Design, Automation, and Test in Europe · doi:10.23919/date64628.2025.10993119
Kim, J., & Chen, V. (2025) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2025.3602728
Zhang, R., Cao, Y., Zhang, H., Cheng, Q., Nishizawa, S., Niitsu, K., & Shinohara, H. (2025) · IEEE Transactions on Circuits and Systems I Regular Papers · doi:10.1109/tcsi.2025.3621604
Self-Compensating StrongARM Latch for High-Speed Energy-Efficient True Random Number Generators
Huang, X., & Islam, M. (2026) · IEEE Transactions on Circuits and Systems I Regular Papers · doi:10.1109/tcsi.2025.3643984
SecureCoin: Preserving Confidentiality in Decentralized Hardware Power Management
Piersma, R., Swaminathan, K., Cochet, M., Bose, P. K., & Sethumadhavan, S. (2026) · IEEE International Symposium on Hardware Oriented Security and Trust (HOST) · doi:10.1109/host68814.2026.11604879
- Authors
- Mathew, S. K., Johnston, D., Satpathy, S., Suresh, V., Newman, P., Anders, M. A., Kaul, H., Agarwal, A., Hsu, S. K., Chen, G., & Krishnamurthy, R. K.
- Affiliations
- Intel (United States) (US)
- ORCID
- Venue
- IEEE Journal of Solid-State Circuits
- Published
- 2016-07
- Volume
- 51
- Issue
- 7
- Pages
- 1695-1704
- ISSN
- 0018-9200 (ISSN-L)
- 1558-173X
- OpenAlex
- W2401371495
- Cited by
- 102
- References
- 26
- Citations by year
- 2026: 5 · 2025: 10 · 2024: 12 · 2023: 9 · 2022: 15 · 2021: 14 · 2020: 14 · 2019: 13 · 2018: 7 · 2017: 3
- FWCI
- 11.62
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- IEEE Journal of Solid-State Circuits (publishedVersion)
- Topics
- Physical Sciences › Computer Science › Hardware and Architecture › Physical Unclonable Functions (PUFs) and Hardware Security
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Low-power high-performance VLSI design
- Physical Sciences › Computer Science › Artificial Intelligence › Cryptographic Implementations and Security
- Keywords
- true random number generator, low-power electronics, near-threshold operation, subthreshold operation, wide supply voltage range, energy efficiency, cryptographic key generation, Internet of Things, wearable devices, 14nm FinFET
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review