Cited by 102Physical Unclonable Functions (PUFs) and Hardware SecurityLow-power high-performance VLSI designCryptographic Implementations and Security

$\mu $ RNG: A 300–950 mV, 323 Gbps/W All-Digital Full-Entropy True Random Number Generator in 14 nm FinFET CMOS

Mathew, Sanu K., Johnston, David, Satpathy, Sudhir, Suresh, Vikram, Newman, Paul, Anders, Mark A., Kaul, Himanshu, Agarwal, Amit +3 more·2016·IEEE Journal of Solid-State Circuits

Abstract

This paper describes μRNG, an ultra-lightweight all-digital full-entropy true-random number generator (TRNG), fabricated in 14 nm high-k/metal-gate FinFET CMOS, targeted for on-die generation of cryptographic keys in energy-constrained IoT and wearable platforms. The μRNG combines the entropy of multiple independent sources to generate an output bitstream that is indistinguishable from an ideal unbiased entropy source. Three independent self-calibrating all-digital entropy sources, coupled with XOR feedback shift-register based correlation suppressors and an in-line compact Barak-Impagliazzo- Wigderson (BIW) extractor enable ultra-low energy consumption of 3 pJ/full-entropy bit with a dense layout occupying 1008 μm2, while achieving: (i) 162.5 Mbps full-entropy throughput at 1.3 GHz operation, with total power consumption of 1.5 mW and leakage power component of 90 μW, measured at 0.75 V, 25°C, (ii) mutually uncorrelated raw bitstreams from the three entropy sources with phi-coefficient cross-correlation∞> 0.99, (iv) hysteresis-free extracted output for lags 1-1000, with ACF ~0 within 95% confidence bounds of a Gaussian distribution (μ = 0, σ2= 0.002), (v) wide operating supply voltage range of 300-950 mV with throughput scaling to 225 Mbps at 950 mV and robust subthreshold voltage performance of 400 Kbps, 4 μW, measured at 300 mV, 25°C, (vi) peak energy-efficiency of 323 Gbps/W at near-threshold voltage of 400 mV, with full-entropy throughput of 8.6 Mbps, total power consumption of 27 μW, (vii) 6.5× reduction in gate count and 5.4× lower energy consumption compared to conventional AES-based entropy extractors.

Integrity signals

Registry

Crossref · 10.1109/jssc.2016.2558490

Cites

24 of 24 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • Intel's improved metastability-based TRNG using in-line decorrelators and a lightweight BIW extractor provided a throughput of 162.5 Mbps at 1.3 GHz operation, with 1.5 mW total power consumption and a 90 μW leakage component.

    “Subsequently, Intel improved this TRNG using in-line decorrelators and a lightweight BIW extractor.It demonstrated that this TRNG could provide a throughput of 162.5 Mbps at 1.3 GHz operation, with 1.5 mW total power consumption and a 90 µW leakage component [11].”

    From True Random Number Generators Using Electrical Noise (2019) · cites this paper as [11]

Cites

Flagged first, then by citations

2 of the 26 references couldn’t be matched to a known paper.

Cited by

Sorted by citations

Authors
Mathew, S. K., Johnston, D., Satpathy, S., Suresh, V., Newman, P., Anders, M. A., Kaul, H., Agarwal, A., Hsu, S. K., Chen, G., & Krishnamurthy, R. K.
Affiliations
Intel (United States) (US)
Venue
IEEE Journal of Solid-State Circuits
Published
2016-07
Volume
51
Issue
7
Pages
1695-1704
ISSN
  • 0018-9200 (ISSN-L)
  • 1558-173X
OpenAlex
W2401371495
Cited by
102
References
26
Citations by year
2026: 5 · 2025: 10 · 2024: 12 · 2023: 9 · 2022: 15 · 2021: 14 · 2020: 14 · 2019: 13 · 2018: 7 · 2017: 3
FWCI
11.62
Type
journal article
Language
en
Open access
closed
Locations
IEEE Journal of Solid-State Circuits (publishedVersion)
Topics
  • Physical Sciences › Computer Science › Hardware and Architecture › Physical Unclonable Functions (PUFs) and Hardware Security
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Low-power high-performance VLSI design
  • Physical Sciences › Computer Science › Artificial Intelligence › Cryptographic Implementations and Security
Keywords
true random number generator, low-power electronics, near-threshold operation, subthreshold operation, wide supply voltage range, energy efficiency, cryptographic key generation, Internet of Things, wearable devices, 14nm FinFET

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review