Cited by 91Anomaly Detection Techniques and ApplicationsIndustrial Vision Systems and Defect DetectionAdvanced Neural Network Applications

Learning Unsupervised Metaformer for Anomaly Detection

Wu, Jhih-Ciang, Chen, Ding-Jie, Fuh, Chiou-Shann, Liu, Tyng-Luh·2021·2021 IEEE/CVF International Conference on Computer Vision (ICCV)

Abstract

Anomaly detection (AD) aims to address the task of classification or localization of image anomalies. This paper addresses two pivotal issues of reconstruction-based approaches to AD in images, namely, model adaptation and reconstruction gap. The former generalizes an AD model to tackling a broad range of object categories, while the latter provides useful clues for localizing abnormal regions. At the core of our method is an unsupervised universal model, termed as Metaformer, which leverages both meta-learned model parameters to achieve high model adaptation capability and instance-aware attention to emphasize the focal regions for localizing abnormal regions, i.e., to explore the reconstruction gap at those regions of interest. We justify the effectiveness of our method with SOTA results on the MVTec AD dataset of industrial images and highlight the adaptation flexibility of the universal Metaformer with multi-class and few-shot scenarios.

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Crossref · 10.1109/iccv48922.2021.00433

Cites

37 of 37 references verified0 citation errors · 0 not checkable

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  • Few-shot anomaly detection is still in its infancy.

    “Few-shot anomaly detection (FSAD) [139, 140] is still in its infancy.”

    From Deep Industrial Image Anomaly Detection: A Survey (2024) · cites this paper as [139]

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Authors
Wu, J.-C., Chen, D.-J., Fuh, C.-S., & Liu, T.-L.
Affiliations
  • Institute of Information Science, Academia Sinica (TW)
  • National Taiwan University (TW)
Venue
2021 IEEE/CVF International Conference on Computer Vision (ICCV)
Publisher
IEEE
Published
2021-10
Pages
4349-4358
OpenAlex
W3202233540
Cited by
91
References
37
Citations by year
2026: 8 · 2025: 29 · 2024: 31 · 2023: 18 · 2022: 5
FWCI
6.24
Type
conference paper
Language
en
Open access
closed
Locations
IEEE/CVF International Conference on Computer Vision (ICCV) (publishedVersion)
Topics
  • Physical Sciences › Computer Science › Artificial Intelligence › Anomaly Detection Techniques and Applications
  • Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
  • Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Neural Network Applications
Keywords
image anomaly detection, MetaFormer, model adaptation, anomaly localization, few-shot learning, multi-class anomaly detection, MVTec AD

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