Cited by 216Anomaly Detection Techniques and ApplicationsIndustrial Vision Systems and Defect DetectionDomain Adaptation and Few-Shot Learning

Registration Based Few-Shot Anomaly Detection

Open access
Huang, Chaoqin, Guan, Haoyan, Jiang, Aofan, Zhang, Ya, Spratling, Michael, Wang, Yan-Feng·2022·Lecture Notes in Computer Science

Integrity signals

Registry

Crossref · 10.1007/978-3-031-20053-3_18

Cites

35 of 35 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • There are two settings in few-shot anomaly detection: meta-learning and vanilla few-shot image learning.

    “There are two settings in FSAD. The first setting is meta-learning [141] .”

    From Deep Industrial Image Anomaly Detection: A Survey (2024) · cites this paper as [141]

Cites

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4 of the 39 references couldn’t be matched to a known paper.

Cited by

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Authors
Huang, C., Guan, H., Jiang, A., Zhang, Y., Spratling, M., & Wang, Y.-F.
Affiliations
  • National University of Singapore (SG)
  • King's College London (GB)
  • Shanghai Jiao Tong University (CN)
Corresponding author
Zhang, Ya
Venue
Lecture Notes in Computer Science
Published
2022
Pages
303-319
ISSN
  • 0302-9743 (ISSN-L)
  • 1611-3349
OpenAlex
W4312298392
Cited by
216
References
39
Citations by year
2026: 60 · 2025: 71 · 2024: 64 · 2023: 21
FWCI
21.57
Type
conference paper
Language
en
Open access
Locations
  • Lecture notes in computer science (publishedVersion)
  • arXiv (Cornell University) (submittedVersion)
  • arXiv (Cornell University)
Funders
  • Science and Technology Commission of Shanghai Municipality (BP0719010, 18DZ2270700)
  • National Key Research and Development Program of China (BP0719010)
Topics
  • Physical Sciences › Computer Science › Artificial Intelligence › Anomaly Detection Techniques and Applications
  • Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
  • Physical Sciences › Computer Science › Artificial Intelligence › Domain Adaptation and Few-Shot Learning
Keywords
few-shot anomaly detection, image registration, anomaly detection, MVTec

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

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