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Transistor matching in analog CMOS applications
Abstract
This paper gives an overview of MOSFET mismatch effects that form a performance/yield limitation for many designs. After a general description of (mis)matching, a comparison over past and future process generations is presented. The application of the matching model in CAD and analog circuit design is discussed. Mismatch effects gain importance as critical dimensions and CMOS power supply voltages decrease.
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Citations
Cited by
Device mismatch and tradeoffs in the design of analog circuits
Kinget, P. R. (2005) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2005.848021 · Cited by 478
An Orthogonal Current-Reuse Amplifier for Multi-Channel Sensing
Johnson, B., & Molnar, A. (2013) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2013.2257478 · Cited by 80
Noise, Distortion and Mismatch
(2017) · Systematic Design of Analog CMOS Circuits · doi:10.1017/9781108125840.004 · Cited by 1
Metadata
- Authors
- Pelgrom, M. J. M., Tuinhout, H. P., & Vertregt, M.
- Venue
- International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217)
- Publisher
- IEEE
- Published
- 2002-11-27
- Pages
- 915-918
- ISSN
- 0163-1918 (ISSN-L)
- OpenAlex
- W2536505949
- Cited by
- 306
- References
- 0
- FWCI
- 27.32
- Type
- conference paper
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: Transistor matching in analog CMOS applications. https://app.cochat.ai/papers/10.1109/iedm.1998.746503
- The paper
- Pelgrom, M. J. M., Tuinhout, H. P., & Vertregt, M. (2002). Transistor matching in analog CMOS applications. International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217). https://doi.org/10.1109/iedm.1998.746503
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
