Cited by 23Advanced Memory and Neural ComputingPhase-change materials and chalcogenidesFerroelectric and Negative Capacitance Devices

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

Mushroom-Type phase change memory with projection liner: An array-level demonstration of conductance drift and noise mitigation

Abstract

Phase change memory (PCM) is rapidly emerging as a promising candidate for building non-von Neumann accelerators for deep neural networks (DNN) based on in-memory computing. However, conductance drift and noise are key challenges for the reliable storage of synaptic weights in such accelerators. We demonstrate, for the first time, conductance drift and noise mitigation by integrating a projection liner into multilevel mushroom-type PCM devices. While the projection liner has little effect on SET-state drift (crystalline phase), it substantially reduces drift for RESET states (amorphous phase) and improves the overall noise across SET and RESET states. Further improvement in drift is demonstrated by combining projection liner with a low-drift GeSbTe (GST) phase-change material variant. Lower drift and lower device-to-device drift variability for devices with projection liner are confirmed with large-scale experiments of over 1,000 devices. Moreover, we demonstrate using 10,000 projected PCM devices that tighter closed-loop programming distributions can be achieved, which is critical for in-memory computing based accelerators for applications such as DNN inference. Simulations show that the lower drift and device-to-device drift variability significantly increase the inference life span of PCM-based DNN accelerators.

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Crossref · 10.1109/irps46558.2021.9405191

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Research works printed but not linked: 22

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Metadata

Authors
Bruce, R. L., Sarwat, S. G., Boybat, I., Cheng, C.-W., Kim, W., Nandakumar, S. R., Mackin, C., Philip, T., Liu, Z., Brew, K., Gong, N., Ok, I., Adusumilli, P., Spoon, K., Ambrogio, S., Kersting, B., Bohnstingl, T., Gallo, M. L., Simon, A., Li, N., Saraf, I., Han, J.-P., Gignac, L., Papalia, J. M., Yamashita, T., Saulnier, N., Burr, G. W., Tsai, H., Sebastian, A., Narayanan, V., & BrightSky, M.
Affiliations
  • IBM (United States) (US)
  • IBM Research - Zurich (CH)
  • IBM Research - Almaden (US)
  • IBM Research ‐ Albany NanoTech,Albany,NY,12203
Venue
2021 IEEE International Reliability Physics Symposium (IRPS)
Publisher
IEEE
Published
2021-03
Pages
1-6
ISSN
0735-0791 (ISSN-L)
OpenAlex
W3157048205
Cited by
23
References
1
Citations by year
2026: 3 · 2025: 2 · 2023: 8 · 2022: 8 · 2021: 2
FWCI
7.06
Type
conference paper
Language
en
Open access
closed
Locations
IEEE International Reliability Physics Symposium proceedings (publishedVersion)
Funders
IBM
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Memory and Neural Computing
  • Physical Sciences › Materials Science › Materials Chemistry › Phase-change materials and chalcogenides
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
Keywords
phase-change memory, conductance drift, noise mitigation, multilevel memory, GeSbTe, amorphous phase, in-memory computing, DNN accelerators, synaptic weight storage, device-to-device variation

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