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Mushroom-Type phase change memory with projection liner: An array-level demonstration of conductance drift and noise mitigation
Abstract
Phase change memory (PCM) is rapidly emerging as a promising candidate for building non-von Neumann accelerators for deep neural networks (DNN) based on in-memory computing. However, conductance drift and noise are key challenges for the reliable storage of synaptic weights in such accelerators. We demonstrate, for the first time, conductance drift and noise mitigation by integrating a projection liner into multilevel mushroom-type PCM devices. While the projection liner has little effect on SET-state drift (crystalline phase), it substantially reduces drift for RESET states (amorphous phase) and improves the overall noise across SET and RESET states. Further improvement in drift is demonstrated by combining projection liner with a low-drift GeSbTe (GST) phase-change material variant. Lower drift and lower device-to-device drift variability for devices with projection liner are confirmed with large-scale experiments of over 1,000 devices. Moreover, we demonstrate using 10,000 projected PCM devices that tighter closed-loop programming distributions can be achieved, which is critical for in-memory computing based accelerators for applications such as DNN inference. Simulations show that the lower drift and device-to-device drift variability significantly increase the inference life span of PCM-based DNN accelerators.
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Conductances can evolve over time after programming.
“Worse yet, conductances can evolve over time after programming35–37.”
From Hardware-aware training for large-scale and diverse deep learning inference workloads using in-memory computing-based accelerators (2023) · cites this paper as [37]
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Accurate deep neural network inference using computational phase-change memory
Joshi, V., Le Gallo, M., Haefeli, S., Boybat, I., Nandakumar, S. R., Piveteau, C., Dazzi, M., Rajendran, B., Sebastian, A., & Eleftheriou, E. (2020) · Nature Communications · doi:10.1038/s41467-020-16108-9 · Cited by 490
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Rasch, M. J., Mackin, C., Le Gallo, M., Chen, A., Fasoli, A., Odermatt, F., Li, N., Nandakumar, S. R., Narayanan, P., Tsai, H., et al. (2023) · Nature Communications · doi:10.1038/s41467-023-40770-4 · Cited by 213
“Whereas QAT gets challenging as precision is deterministically reduced, MVM approximation in AIMC is tied to non-deterministic signal-to-noise ratio.”
BackgroundSelf-citationNarayanan, P., Ambrogio, S., Okazaki, A., Hosokawa, K., Tsai, H., Nomura, A., Yasuda, T., Mackin, C., Lewis, S. C., Friz, A., et al. (2021) · IEEE Transactions on Electron Devices · doi:10.1109/ted.2021.3115993 · Cited by 85
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Metadata
- Authors
- Bruce, R. L., Sarwat, S. G., Boybat, I., Cheng, C.-W., Kim, W., Nandakumar, S. R., Mackin, C., Philip, T., Liu, Z., Brew, K., Gong, N., Ok, I., Adusumilli, P., Spoon, K., Ambrogio, S., Kersting, B., Bohnstingl, T., Gallo, M. L., Simon, A., Li, N., Saraf, I., Han, J.-P., Gignac, L., Papalia, J. M., Yamashita, T., Saulnier, N., Burr, G. W., Tsai, H., Sebastian, A., Narayanan, V., & BrightSky, M.
- Affiliations
- IBM (United States) (US)
- IBM Research - Zurich (CH)
- IBM Research - Almaden (US)
- IBM Research ‐ Albany NanoTech,Albany,NY,12203
- ORCID
- Venue
- 2021 IEEE International Reliability Physics Symposium (IRPS)
- Publisher
- IEEE
- Published
- 2021-03
- Pages
- 1-6
- ISSN
- 0735-0791 (ISSN-L)
- OpenAlex
- W3157048205
- Cited by
- 23
- References
- 1
- Citations by year
- 2026: 3 · 2025: 2 · 2023: 8 · 2022: 8 · 2021: 2
- FWCI
- 7.06
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- IEEE International Reliability Physics Symposium proceedings (publishedVersion)
- Funders
- IBM
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Memory and Neural Computing
- Physical Sciences › Materials Science › Materials Chemistry › Phase-change materials and chalcogenides
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
- Keywords
- phase-change memory, conductance drift, noise mitigation, multilevel memory, GeSbTe, amorphous phase, in-memory computing, DNN accelerators, synaptic weight storage, device-to-device variation
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