The DOI matches its Crossref record; 14 of the 14 references it cites were found in a registry or an index.
A 28 nm Configurable Memory (TCAM/BCAM/SRAM) Using Push-Rule 6T Bit Cell Enabling Logic-in-Memory
Abstract
Conventional content addressable memory (BCAM and TCAM) uses specialized 10T/16T bit cells that are significantly larger than 6T SRAM cells. A new BCAM/TCAM is proposed that can operate with standard push-rule 6T SRAM cells, reducing array area by 2-5× and allowing reconfiguration of the SRAM as a CAM. In this way, chip area and overall capacitance can be reduced, leading to higher energy efficiency for search operations. In addition, the configurable memory can perform bit-wise logical operations: “AND” and “NOR” on two or more words stored within the array. Thus, the configurable memory with CAM and logical function capability can be used to off-load specific computational operations to the memory, improving system performance and efficiency. Using a 6T 28 nm FDSOI SRAM bit cell, the 64×64 (4 kb) BCAM achieves 370 MHz at 1 V and consumes 0.6 fJ/search/bit. A logical operation between two 64 bit words achieves 787 MHz at 1 V.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Content-Addressable Memory (CAM) Circuits and Architectures: A Tutorial and Survey
Pagiamtzis, K., & Sheikholeslami, A. (2006) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2005.864128 · Cited by 1,228
Patterson, D., Anderson, T., Cardwell, N., Fromm, R., Keeton, K., Kozyrakis, C., Thomas, R., & Yelick, K. (1997) · IEEE Micro · doi:10.1109/40.592312 · Cited by 665
Smart Memories: a modular reconfigurable architecture
Mai, K., Paaske, T., Jayasena, N., Ho, R., Dally, W. J., & Horowitz, M. (2000) · Proceedings of the 27th annual international symposium on Computer architecture - ISCA '00 · doi:10.1145/339647.339673 · Cited by 371
1 Mb 0.41 µm² 2T-2R Cell Nonvolatile TCAM With Two-Bit Encoding and Clocked Self-Referenced Sensing
Li, J., Montoye, R. K., Ishii, M., & Chang, L. (2014) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2013.2292055 · Cited by 204
A Case for Intelligent RAM: IRAM
Patterson, D. A., Anderson, T. E., Cardwell, N., Fromm, R., Keeton, K., Kozyrakis, C. E., Thomas, R., & Yelick, K. (1997) · Cited by 153
A 3D-stacked logic-in-memory accelerator for application-specific data intensive computing
Zhu, Q., Akin, B., Sumbul, H. E., Sadi, F., Hoe, J. C., Pileggi, L., & Franchetti, F. (2013) · IEEE International D Systems Integration Conference · doi:10.1109/3dic.2013.6702348 · Cited by 120
A 65 nm 0.165 fJ/Bit/Search 256$\,\times\,$144 TCAM Macro Design for IPv6 Lookup Tables
Huang, P.-T., & Hwang, W. (2010) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2010.2082270 · Cited by 91
A 250-MHz 18-Mb Full Ternary CAM With Low-Voltage Matchline Sensing Scheme in 65-nm CMOS
Hayashi, I., Amano, T., Watanabe, N., Yano, Y., Kuroda, Y., Shirata, M., DOSAKA, K., Nii, K., 野田, 英., & Kawai, H. (2013) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2013.2274888 · Cited by 86
MTJ-based nonvolatile logic-in-memory circuit, future prospects and issues
Matsunaga, S., Hayakawa, J., Ikeda, S., et al. (2009) · Design, Automation, and Test in Europe · doi:10.1109/date.2009.5090704 · Cited by 72
13.6 A 28nm 400MHz 4-parallel 1.6Gsearch/s 80Mb ternary CAM
Nii, K., Amano, T., Watanabe, N., Yamawaki, M., Kenji, Y., Mihoko, W., & Hayashi, I. (2014) · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · doi:10.1109/isscc.2014.6757417 · Cited by 63
Cited by
Memory devices and applications for in-memory computing
Sebastian, A., Le Gallo, M., Khaddam-Aljameh, R., & Eleftheriou, E. (2020) · Nature Nanotechnology · doi:10.1038/s41565-020-0655-z · Cited by 2,289
X-SRAM: Enabling In-Memory Boolean Computations in CMOS Static Random Access Memories
Agrawal, A., Jaiswal, A., Lee, C., & Roy, K. (2018) · IEEE Transactions on Circuits and Systems I: Regular Papers · doi:10.1109/tcsi.2018.2848999 · Cited by 325
Wang, J., Wang, X., Eckert, C., Subramaniyan, A., Das, R., Blaauw, D., & Sylvester, D. (2020) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2019.2939682 · Cited by 244
Self-citationXue, C.-X., Chiu, Y.-C., Liu, T.-W., Huang, T.-Y., Liu, J.-S., Chang, T.-W., Kao, H.-Y., Wang, J.-H., Wei, S.-Y., Lee, C.-Y., et al. (2020) · Nature Electronics · doi:10.1038/s41928-020-00505-5 · Cited by 181
Computing in memory with FeFETs
Reis, D., Niemier, M., & Hu, X. S. (2018) · Proceedings of the International Symposium on Low Power Electronics and Design · doi:10.1145/3218603.3218640 · Cited by 102
Metadata
- Authors
- Jeloka, S., Akesh, N. B., Sylvester, D., & Blaauw, D.
- Venue
- IEEE Journal of Solid-State Circuits
- Published
- 2016-04
- Volume
- 51
- Issue
- 4
- Pages
- 1009-1021
- ISSN
- 0018-9200 (ISSN-L)
- 1558-173X
- OpenAlex
- W2331783522
- Cited by
- 361
- References
- 14
- FWCI
- 32.90
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: A 28 nm Configurable Memory (TCAM/BCAM/SRAM) Using Push-Rule 6T Bit Cell Enabling Logic-in-Memory. https://app.cochat.ai/papers/10.1109/jssc.2016.2515510
- The paper
- Jeloka, S., Akesh, N. B., Sylvester, D., & Blaauw, D. (2016). A 28 nm Configurable Memory (TCAM/BCAM/SRAM) Using Push-Rule 6T Bit Cell Enabling Logic-in-Memory. IEEE Journal of Solid-State Circuits. https://doi.org/10.1109/jssc.2016.2515510
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.