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High-Resolution Scanning X-ray Diffraction Microscopy
Open accessAbstract
Coherent diffractive imaging (CDI) and scanning transmission x-ray microscopy (STXM) are two popular microscopy techniques that have evolved quite independently. CDI promises to reach resolutions below 10 nanometers, but the reconstruction procedures put stringent requirements on data quality and sample preparation. In contrast, STXM features straightforward data analysis, but its resolution is limited by the spot size on the specimen. We demonstrate a ptychographic imaging method that bridges the gap between CDI and STXM by measuring complete diffraction patterns at each point of a STXM scan. The high penetration power of x-rays in combination with the high spatial resolution will allow investigation of a wide range of complex mesoscopic life and material science specimens, such as embedded semiconductor devices or cellular networks.
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Citations
Cited by
Bultreys, T., De Boever, W., & Cnudde, V. (2016) · Earth-Science Reviews · doi:10.1016/j.earscirev.2016.02.001 · Cited by 474
Further improvements to the ptychographical iterative engine
Maiden, A., Johnson, D., & Li, P. (2017) · Optica · doi:10.1364/optica.4.000736 · Cited by 452
X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution
Holler, M., Diaz, A., Guizar-Sicairos, M., Karvinen, P., Färm, E., Härkönen, E., Ritala, M., Menzel, A., Raabe, J., & Bunk, O. (2014) · Scientific Reports · doi:10.1038/srep03857 · Cited by 357
Self-citationThree-Dimensional Visualization of a Human Chromosome Using Coherent X-Ray Diffraction
Nishino, Y., Takahashi, Y., Imamoto, N., Ishikawa, T., & Maeshima, K. (2009) · Physical Review Letters · doi:10.1103/physrevlett.102.018101 · Cited by 306
Power profiles of multifocal contact lenses and their interpretation
Plainis, S., Atchison, D. A., & Charman, W. N. (2013) · Optometry and Vision Science · doi:10.1097/opx.0000000000000030 · Cited by 115
Metadata
- Authors
- Thibault, P., Dierolf, M., Menzel, A., Bunk, O., David, C., & Pfeiffer, F.
- Venue
- Science
- Published
- 2008-07-18
- Volume
- 321
- Issue
- 5887
- Pages
- 379-382
- ISSN
- 0036-8075 (ISSN-L)
- 1095-9203
- OpenAlex
- W2009741028
- Cited by
- 1,321
- References
- 0
- FWCI
- 50.44
- Type
- journal article
- Language
- en
- Open access
- green
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- Thibault, P., Dierolf, M., Menzel, A., Bunk, O., David, C., & Pfeiffer, F. (2008). High-Resolution Scanning X-ray Diffraction Microscopy. Science. https://doi.org/10.1126/science.1158573
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