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Cited by 948

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

Measuring and modeling anisotropic reflection

Open access
Ward, Gregory J.·1992·Proceedings of the 19th annual conference on Computer graphics and interactive techniques

Abstract

A new device for measuring the spatial reflectancedistributionsof surfaces is introduced, along with a new mathematical model of sniaorropic reflectance.The reflectance model presented is both simple and accurate, permitting efficient reflectance data reduction rasd reproduction.Tire validity of the model is substantiated with comparisons to complete meaarsremems of surface reflectance functions gathered with the novel retlectometry device.This new device uses imaging technology to capture the entire hemisphem of reflected directions simttkarreously, which greatly accelerates the reflectance data gathering process, making it pssible to measure dozens of surfaces in the time that it used to take to do one.Example measurements and simulations are shown.and a table of fitted parameters for several surfaces is presented.

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Metadata

Authors
Ward, G. J.
Venue
Proceedings of the 19th annual conference on Computer graphics and interactive techniques
Publisher
ACM
Published
1992-07
Pages
265-272
OpenAlex
W2144736368
Cited by
948
References
1
FWCI
19.54
Type
conference paper
Language
en
Open access
bronze

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CoChat. (2026). Citation check: Measuring and modeling anisotropic reflection. https://app.cochat.ai/papers/10.1145/133994.134078
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Ward, G. J. (1992). Measuring and modeling anisotropic reflection. Proceedings of the 19th annual conference on Computer graphics and interactive techniques. https://doi.org/10.1145/133994.134078

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.