The DOI matches its Crossref record.
Chemical Etching of Silicon
Open accessAbstract
The etch rate of silicon in solutions of various compositions selected from the system , , , and has been investigated over the temperature range 0° to 50 °C. The activation energy of the etching process has been found to be different in the different composition regions. In the high region values of about 4 kcal/mole have been observed and interpreted as characteristic of a diffusion governed reaction. In compositions containing or diluents the activation energy increases, and two values are found. In the high region two values are also observed, one in the range of 10–14 kcal/mole, and the other in the range of about 20 kcal/mole. The significance of the various values of the activation energy is discussed.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Anisotropic etching of silicon
Bean, K. E. (1978) · IEEE Transactions on Electron Devices · doi:10.1109/t-ed.1978.19250 · Cited by 803
Bulk micromachining of silicon
Kovacs, G. T. A., Maluf, N. I., & Petersen, K. E. (1998) · Proceedings of the IEEE · doi:10.1109/5.704259 · Cited by 733
A wafer-scale etching technique for high aspect ratio implantable MEMS structures
Bhandari, R., Negi, S., Rieth, L., & Solzbacher, F. (2010) · Sensors and Actuators A: Physical · doi:10.1016/j.sna.2010.06.011 · Cited by 71
Metadata
- Authors
- Schwartz, B., & Robbins, H.
- Venue
- Journal of The Electrochemical Society
- Publisher
- The Electrochemical Society
- Published
- 1961
- Volume
- 108
- Issue
- 4
- Pages
- 365
- ISSN
- 0013-4651 (ISSN-L)
- OpenAlex
- W1560798185
- Cited by
- 190
- References
- 0
- FWCI
- 0.00
- Type
- journal article
- Language
- en
- Open access
- bronze
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Chemical Etching of Silicon. https://app.cochat.ai/papers/10.1149/1.2428090
- The paper
- Schwartz, B., & Robbins, H. (1961). Chemical Etching of Silicon. Journal of The Electrochemical Society. https://doi.org/10.1149/1.2428090
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.