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Cited by 245

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

Thermal-wave detection and thin-film thickness measurements with laser beam deflection

Opsal, Jon, Rosencwaig, Allan, Willenborg, David L.·1983·Applied Optics

Abstract

A new technique has been developed that employs highly focused laser beams for both generating and detecting thermal waves in the megahertz frequency regime. This technique includes a comprehensive 3-D depth-profiling theoretical model; it has been used to measure the thickness of both transparent and opaque thin films with high spatial resolution. Thickness sensitivities of ±2% over the 500–25,000-Å range have been obtained for Al and SiO2 films on Si substrates.

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Crossref · 10.1364/ao.22.003169

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Metadata

Authors
Opsal, J., Rosencwaig, A., & Willenborg, D. L.
Venue
Applied Optics
Published
1983-10-15
Volume
22
Issue
20
Pages
3169
ISSN
  • 0003-6935 (ISSN-L)
  • 1539-4522
OpenAlex
W2087772914
Cited by
245
References
1
FWCI
14.72
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Thermal-wave detection and thin-film thickness measurements with laser beam deflection. https://app.cochat.ai/papers/10.1364/ao.22.003169
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Opsal, J., Rosencwaig, A., & Willenborg, D. L. (1983). Thermal-wave detection and thin-film thickness measurements with laser beam deflection. Applied Optics. https://doi.org/10.1364/ao.22.003169

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

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