Cited by 126Advanced Semiconductor Detectors and MaterialsAdvanced Optical Sensing TechnologiesSemiconductor Lasers and Optical Devices

Performance and design of InGaAs/InP photodiodes for single-photon counting at 155 µm

Hiskett, Philip A., Buller, Gerald S., Loudon, Alison Y., Smith, Jason M., Gontijo, Ivair, Walker, Andrew C., Townsend, Paul D., Robertson, Michael J.·2000·Applied Optics

Abstract

The performance of selected, commercially available InGaAs/InP avalanche photodiodes operating in a photon-counting mode at an incident wavelength of 1.55 microm is described. A discussion on the optimum operating conditions and their relationship to the electric field distribution within the device is presented.

Integrity signals

Registry

Crossref · 10.1364/ao.39.006818

Cites

35 of 35 references verified0 citation errors · 0 not checkable

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  • Photon-counting devices based on III-V semiconductors are now available in the near-infrared window.

    “Photon-counting devices based on III-V semiconductors now become available in the near-IR window (Hiskett et al 2000, Rarity et al 2000, Stucki et al 2001).”

    From Single-photon sources (2005) · cites this paper as Hiskett et al 2000

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Authors
Hiskett, P. A., Buller, G. S., Loudon, A. Y., Smith, J. M., Gontijo, I., Walker, A. C., Townsend, P. D., & Robertson, M. J.
Affiliations
  • Heriot-Watt University (GB)
  • University of California, Los Angeles (US)
Venue
Applied Optics
Published
2000-12-20
Volume
39
Issue
36
Pages
6818
ISSN
  • 0003-6935 (ISSN-L)
  • 1539-4522
OpenAlex
W2162636026
Cited by
126
References
35
Citations by year
2026: 2 · 2025: 1 · 2024: 5 · 2023: 1 · 2022: 4 · 2021: 1 · 2020: 3 · 2019: 5 · 2018: 3 · 2017: 3 · 2016: 4 · 2015: 4 · 2014: 3 · 2013: 5 · 2012: 3
FWCI
6.92
Type
journal article
Language
en
Open access
closed
Locations
  • Applied Optics (publishedVersion)
  • PubMed (publishedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Semiconductor Detectors and Materials
  • Physical Sciences › Physics and Astronomy › Instrumentation › Advanced Optical Sensing Technologies
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Semiconductor Lasers and Optical Devices
Keywords
InGaAs/InP avalanche photodiode, single photon counting, 1550 nm, electric field distribution, operating conditions, photodiode design

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

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