Cited by 521Metamaterials and Metasurfaces ApplicationsTerahertz technology and applicationsMicrowave and Dielectric Measurement Techniques

Thin-film sensing with planar terahertz metamaterials: sensitivity and limitations

Open access
O'Hara, John F., Singh, Ranjan, Brener, Igal, Smirnova, Evgenya, Han, Jiaguang, Taylor, Antoinette J., Zhang, Weili·2008·Optics Express

Abstract

The limiting effects of varying the thickness of a dielectric overlayer on planar double split-ring resonator (SRR) arrays are studied by terahertz time-domain spectroscopy. Uniform dielectric overlayers from 100 nm to 16 mum thick are deposited onto fixed SRR arrays in order to shift the resonance frequency of the electric response. We discuss the bounds of resonance shifting and emphasize the resulting limitations for SRR-based sensing. These results are presented in the context of typical biosensing situations and are compared to previous work and other existing sensing platforms.

Integrity signals

Registry

Crossref · 10.1364/oe.16.001786

Cites

25 of 25 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • Several methods have been reported to lower the detection threshold for terahertz thin-film sensing, such as difference signals, metamaterial resonance shifts, and metal meshes.

    “Various techniques have been reported to improve the detection threshold for THz thin film sensing, e. g., evaluation of difference signals, 3 resonance changes of metamaterials, 4 or the application of metal meshes to enhance the amplitude reduction of the THz bandpass.5”

Cites

Flagged first, then by citations

Cited by

Sorted by citations

Authors
O'Hara, J. F., Singh, R., Brener, I., Smirnova, E., Han, J., Taylor, A. J., & Zhang, W.
Affiliations
  • Oklahoma State University (US)
  • Sandia National Laboratories (US)
  • Los Alamos National Laboratory (US)
Venue
Optics Express
Published
2008
Volume
16
Issue
3
Pages
1786
ISSN
1094-4087 (ISSN-L)
OpenAlex
W2026644949
Cited by
521
References
25
Citations by year
2026: 18 · 2025: 13 · 2024: 19 · 2023: 26 · 2022: 31 · 2021: 26 · 2020: 26 · 2019: 43 · 2018: 31 · 2017: 35 · 2016: 34 · 2015: 28 · 2014: 33 · 2013: 31 · 2012: 52
FWCI
9.56
Type
journal article
Language
en
Open access
Locations
  • Optics Express (publishedVersion)
  • PubMed (publishedVersion)
Funders
  • National Science Foundation
  • U.S. Department of Energy
  • National Nuclear Security Administration
  • Basic Energy Sciences
  • Office of Experimental Program to Stimulate Competitive Research
  • Sandia National Laboratories
  • Los Alamos National Laboratory
Topics
  • Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Metamaterials and Metasurfaces Applications
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
Keywords
terahertz metamaterials, split ring resonator, resonant frequency shift, biosensing, sensitivity limits, terahertz time-domain spectroscopy
MeSH terms
Computer Simulation, Materials Testing, Membranes, Artificial, Models, Theoretical, Refractometry, Sensitivity and Specificity, Reproducibility of Results, Biosensing Techniques

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review