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Cited by 438

The DOI matches its Crossref record; 22 of the 22 references it cites were found in a registry or an index.

Resolution scaling in STED microscopy

Open access
Harke, Benjamin, Keller, Jan, Ullal, Chaitanya K., Westphal, Volker, Schönle, Andreas, Hell, Stefan W.·2008·Optics Express

Abstract

We undertake a comprehensive study of the inverse square root dependence of spatial resolution on the saturation factor in stimulated emission depletion (STED) microscopy and generalize it to account for various focal depletion patterns. We used an experimental platform featuring a high quality depletion pattern which results in operation close to the optimal optical performance. Its superior image brightness and uniform effective resolution <25 nm are evidenced by imaging both isolated and self-organized convectively assembled fluorescent beads. For relevant saturation values, the generalized square-root law is shown to predict the practical resolution with high accuracy.

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Crossref · 10.1364/oe.16.004154

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Metadata

Authors
Harke, B., Keller, J., Ullal, C. K., Westphal, V., Schönle, A., & Hell, S. W.
Venue
Optics Express
Published
2008-03-12
Volume
16
Issue
6
Pages
4154
ISSN
1094-4087 (ISSN-L)
OpenAlex
W2034951110
Cited by
438
References
22
FWCI
12.98
Type
journal article
Language
en
Open access
gold

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CoChat. (2026). Citation check: Resolution scaling in STED microscopy. https://app.cochat.ai/papers/10.1364/oe.16.004154
The paper
Harke, B., Keller, J., Ullal, C. K., Westphal, V., Schönle, A., & Hell, S. W. (2008). Resolution scaling in STED microscopy. Optics Express. https://doi.org/10.1364/oe.16.004154

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.