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The DOI matches its Crossref record; 11 of the 11 references it cites were found in a registry or an index.

Interference model for back-focal-plane displacement detection in optical tweezers

Gittes, Frederick, Schmidt, Christoph F.·1998·Optics Letters

Abstract

The lateral position of an optically trapped object in a microscope can be monitored with a quadrant photodiode to within nanometers or better by measurement of intensity shifts in the back focal plane of the lens that is collimating the outgoing laser light. This detection is largely independent of the position of the trap in the field of view. We provide a model for the essential mechanism of this type of detection, giving a simple, closed-form analytic solution with simplifying assumptions. We identify intensity shifts as first-order far-field interference between the outgoing laser beam and scattered light from the trapped particle, where the latter is phase advanced owing to the Gouy phase anomaly. This interference also reflects momentum transfer to the particle, giving the spring constant of the trap. Our response formula is compared with the results of experiments.

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Metadata

Authors
Gittes, F., & Schmidt, C. F.
Venue
Optics Letters
Published
1998-01-01
Volume
23
Issue
1
Pages
7
ISSN
  • 0146-9592 (ISSN-L)
  • 1539-4794
OpenAlex
W2138103294
Cited by
623
References
11
FWCI
4.42
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Interference model for back-focal-plane displacement detection in optical tweezers. https://app.cochat.ai/papers/10.1364/ol.23.000007
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Gittes, F., & Schmidt, C. F. (1998). Interference model for back-focal-plane displacement detection in optical tweezers. Optics Letters. https://doi.org/10.1364/ol.23.000007

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