Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 168

The DOI matches its Crossref record.

Compliant thin film patterns of stiff materials as platforms for stretchable electronics

Open access
Li, Teng, Suo, Zhigang, Lacour, Stéphanie P., Wagner, Sigurd·2005·Journal of Materials Research

Abstract

A thin film of a stiff material, patterned as a serpentine on a flat elastomeric substrate, can elongate substantially when the substrate is pulled. We showed that the film elongates by twisting out of plane, accommodated by the compliance of the substrate and the pattern of the film. Consequently, large elongations of the substrate induce small strains in the film, even when the width of the film is much larger than its thickness. Such a wide serpentine, or other compliant patterns of stiff materials, can serve as a platform on which electronic circuits can be fabricated. This architecture will make electronics elastically stretchable.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1557/jmr.2005.0422

Cites

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cited by

See all 168

Metadata

Authors
Li, T., Suo, Z., Lacour, S. P., & Wagner, S.
Venue
Journal of Materials Research
Published
2005-12-01
Volume
20
Issue
12
Pages
3274-3277
ISSN
  • 0884-1616 (ISSN-L)
  • 0884-2914
  • 2044-5326
OpenAlex
W2054338813
Cited by
168
References
0
FWCI
2.54
Type
journal article
Language
en
Open access
green

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Compliant thin film patterns of stiff materials as platforms for stretchable electronics. https://app.cochat.ai/papers/10.1557/jmr.2005.0422
The paper
Li, T., Suo, Z., Lacour, S. P., & Wagner, S. (2005). Compliant thin film patterns of stiff materials as platforms for stretchable electronics. Journal of Materials Research. https://doi.org/10.1557/jmr.2005.0422

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.