Near-zero-index behavior in indium antimonide revealed by phase-corrected terahertz reflection spectroscopy
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We developed a phase correction method for broadband terahertz time-domain spectroscopy in reflection geometry, which allows us to obtain quantitative and accurate values for the complex refractive index of materials. The process is analytical, based on the Kramers-Kronig relations, and does not require any computationally intensive algorithms. We validate it by extracting the refractive index of silicon, obtaining the nominal value with an accuracy better than 2.5\% over the 0.25--3.5 THz range, and better than 0.6\% in the 1--2 THz range. We use the method to experimentally observe that an undoped InSb crystal shows a refractive index of $n<1$ between 1 and 2 THz, in proximity to the plasma frequency of the material where, the amplitude of the group velocity goes as low as 0.08$c$.
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The reflection coefficient for InSb is measured at normal incidence geometry in the companion paper [30].
“The reflection coefficient for InSb is measured at normal incidence geometry in the companion paper [30].”
From Robust phase correction techniques for terahertz time-domain reflection spectroscopy (2024) · cites this paper as [30]
In the companion paper, the approach is applicable to Si and InSb samples measured at normal incidence.
“In the companion paper Ref. [30] we show the applicability of our approach to the cases of Si and InSb samples, measured at normal incidence.”
From Robust phase correction techniques for terahertz time-domain reflection spectroscopy (2024) · cites this paper as [30]
The results match the values obtained for normal incidence measurements as reported in the companion Letter [30].
“This also shows that the results match the values obtained for normal incidence measurements as reported in our companion Letter [30].”
From Robust phase correction techniques for terahertz time-domain reflection spectroscopy (2024) · cites this paper as [30]
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- Authors
- Jatkar, K. D., Yeh, T.-T., Pancaldi, M., & Bonetti, S.
- Affiliations
- Stockholm University (SE)
- Ca' Foscari University of Venice (IT)
- Venue
- arXiv
- Publisher
- arXiv
- Published
- 2024
- ISSN
- 2331-8422 (ISSN-L)
- arXiv
- 2412.21073
- OpenAlex
- W4405957699
- Cited by
- 0
- References
- 0
- Type
- posted content
- Language
- en
- Open access
- green
- arxiv.org
- Licence
- Locations
- arXiv (Cornell University) (submittedVersion, cc-by)
- Figshare (submittedVersion, public-domain)
- arXiv (Cornell University) (cc-by)
- Funders
- Knut och Alice Wallenbergs Stiftelse (2019.0068)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Metamaterials and Metasurfaces Applications
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Laser-Matter Interactions and Applications
- Keywords
- near-zero refractive index, indium antimonide, phase correction, complex refractive index, Kramers-Kronig relations, silicon, plasma frequency, group velocity, terahertz metamaterials
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