Phase-sensitive time-domain terahertz reflection spectroscopy
Abstract
An approach to time-domain terahertz reflection spectroscopy is proposed and demonstrated. It allows one to obtain very accurately the relative phase of a reflected THz wave form, and consequently the complex dielectric function can be precisely extracted. The relevant setup was demonstrated to allow measurements of a variety of samples: we present results for doped silicon and for ferroelectric SrBi2Ta2O9 (bulk ceramics as well as thin film on sapphire substrates).
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Measurements of the phase of the electric field in reflection geometry are extremely sensitive to the relative alignment of sample and reference.
“However, measurements of the phase of the electric field in reflection geometry are extremely sensitive to the relative alignment of sample and reference [18, 19].”
From Robust phase correction techniques for terahertz time-domain reflection spectroscopy (2024) · cites this paper as [18]
Inaccurate positioning produces large errors in the results and increases the complexity of postprocessing for data extraction.
“Inaccurate positioning produces large errors in the results, increasing the complexity of postprocessing for data extraction.”
From Robust phase correction techniques for terahertz time-domain reflection spectroscopy (2024) · cites this paper as [18]
Existing experimental techniques to circumvent phase sensitivity in reflection geometry are often material-specific and cannot be universally applied to all sample types.
“Despite their effectiveness, these techniques often tend to be material-specific and cannot be universally applied to all sample types.”
From Robust phase correction techniques for terahertz time-domain reflection spectroscopy (2024) · cites this paper as [18]
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Self-citationTofani, S., Fuscaldo, W., Ritacco, T., Beccherelli, R., & Zografopoulos, D. C. (2025) · IEEE Transactions on Terahertz Science and Technology · doi:10.1109/tthz.2025.3629861 · Cited by 1 · see citing works
Giant and Helical Exciton Dipole from Berry Curvature in Flat Chern Bands
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Influence of Window Function on Characterization of Materials in Terahertz Spectroscopy
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Phase-aligned reference-acquisition method for terahertz imaging
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Time-domain terahertz spectrometer for angular reflection measurements
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Broadband Terahertz Spectroscopy
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Terahertz Waves in Archaeology
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Investigation of metamaterials for terahertz frequency range
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Robust phase correction techniques for terahertz time-domain reflection spectroscopy
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“[18, 19, 25, 26].”
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Tunable materials and structures for terahertz spectral range
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- Authors
- Pashkin, A., Kempa, M., Němec, H., Kadlec, F., & Kužel, P.
- Affiliations
- Czech Academy of Sciences (CZ)
- Venue
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Published
- 2003-11-01
- Volume
- 74
- Issue
- 11
- Pages
- 4711-4717
- ISSN
- 0034-6748 (ISSN-L)
- 1089-7623
- OpenAlex
- W2093552121
- Cited by
- 114
- References
- 14
- Citations by year
- 2026: 5 · 2025: 2 · 2024: 4 · 2023: 2 · 2022: 11 · 2021: 7 · 2020: 4 · 2019: 4 · 2018: 4 · 2017: 5 · 2016: 7 · 2015: 4 · 2014: 3 · 2013: 8 · 2012: 6
- FWCI
- 6.36
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Review of Scientific Instruments (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Laser-Matter Interactions and Applications
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
- Keywords
- terahertz time-domain spectroscopy, phase-sensitive measurement, dielectric function, doped silicon, SrBi2Ta2O9, ferroelectric ceramics
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