Cited by 115Terahertz technology and applicationsLaser-Matter Interactions and ApplicationsMicrowave and Dielectric Measurement Techniques

Phase-sensitive time-domain terahertz reflection spectroscopy

Pashkin, A., Kempa, M., Němec, H., Kadlec, F., Kužel, P.·2003·Review of Scientific Instruments

Abstract

An approach to time-domain terahertz reflection spectroscopy is proposed and demonstrated. It allows one to obtain very accurately the relative phase of a reflected THz wave form, and consequently the complex dielectric function can be precisely extracted. The relevant setup was demonstrated to allow measurements of a variety of samples: we present results for doped silicon and for ferroelectric SrBi2Ta2O9 (bulk ceramics as well as thin film on sapphire substrates).

Integrity signals

Registry

Crossref · 10.1063/1.1614878

Cites

14 of 14 references verified0 citation errors · 0 not checkable

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  • Measurements of the phase of the electric field in reflection geometry are extremely sensitive to the relative alignment of sample and reference.

    “However, measurements of the phase of the electric field in reflection geometry are extremely sensitive to the relative alignment of sample and reference [18, 19].”
  • Inaccurate positioning produces large errors in the results and increases the complexity of postprocessing for data extraction.

    “Inaccurate positioning produces large errors in the results, increasing the complexity of postprocessing for data extraction.”
  • Existing experimental techniques to circumvent phase sensitivity in reflection geometry are often material-specific and cannot be universally applied to all sample types.

    “Despite their effectiveness, these techniques often tend to be material-specific and cannot be universally applied to all sample types.”

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Authors
Pashkin, A., Kempa, M., Němec, H., Kadlec, F., & Kužel, P.
Affiliations
Czech Academy of Sciences (CZ)
Venue
Review of Scientific Instruments
Published
2003-11-01
Volume
74
Issue
11
Pages
4711-4717
ISSN
  • 0034-6748 (ISSN-L)
  • 1089-7623
OpenAlex
W2093552121
Cited by
114
References
14
Citations by year
2026: 5 · 2025: 2 · 2024: 4 · 2023: 2 · 2022: 11 · 2021: 7 · 2020: 4 · 2019: 4 · 2018: 4 · 2017: 5 · 2016: 7 · 2015: 4 · 2014: 3 · 2013: 8 · 2012: 6
FWCI
6.36
Type
journal article
Language
en
Open access
closed
Locations
Review of Scientific Instruments (publishedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Laser-Matter Interactions and Applications
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
Keywords
terahertz time-domain spectroscopy, phase-sensitive measurement, dielectric function, doped silicon, SrBi2Ta2O9, ferroelectric ceramics

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