Accurate Complex Refractive Index with Standard Deviation of ZnTe Measured by Terahertz Time Domain Spectroscopy
Abstract
Accurate complex refractive index of ZnTe crystal in terahertz spectral region from 0.2 to 3.5 THz is obtained by measuring three samples with different thickness using transmission terahertz time-domain spectroscopy. Each sample is measured a number of times and the mean and standard deviation (SD) of the complex refractive index are calculated to quantify the random errors in the measurement. The ratios of SD to mean of the real and imaginary parts of the refractive index are approximately 1.0×10-4 and 1.2×10-2 at 1 THz respectively. The absorption coefficient of our ZnTe sample is found to be comparable with or smaller than the values reported in previous literatures.
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According to Edlén's formula, n_air = 1.000266 around 195 THz.
“According to Edlén's formula 43 , n air = 1.000266 around 195 THz.”
From Ultra-precise determination of thicknesses and refractive indices of optically thick dispersive materials by dual-comb spectroscopy (2022) · cites this paper as [43]
Cites
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Detection of Nuclear Spin Isomers of Water Molecules by Terahertz Time-Domain Spectroscopy
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- Authors
- Tripathi, S. R., Aoki, M., Takeda, M., Asahi, T., Hosako, I., & Hiromoto, N.
- Affiliations
- Shizuoka University (JP)
- JX Advanced Metals Corporation (Japan) (JP)
- National Institute of Information and Communications Technology (JP)
- Venue
- Japanese Journal of Applied Physics
- Publisher
- IOP Publishing
- Published
- 2013-03-11
- Volume
- 52
- Issue
- 4R
- Pages
- 042401
- ISSN
- 0021-4922 (ISSN-L)
- 1347-4065
- OpenAlex
- W2067276666
- Cited by
- 31
- References
- 6
- Citations by year
- 2026: 4 · 2025: 4 · 2024: 5 · 2023: 1 · 2022: 2 · 2021: 1 · 2020: 1 · 2019: 4 · 2018: 2 · 2017: 5 · 2014: 2
- FWCI
- 0.40
- Type
- journal article
- Language
- en
- Open access
- closed
- Licence
- Locations
- Japanese Journal of Applied Physics (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Semiconductor Detectors and Materials
- Keywords
- ZnTe, complex refractive index, terahertz spectroscopy, measurement uncertainty, standard deviation, absorption coefficient, semiconductor crystals
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Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
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