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Cited by 410

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

Impact of different dopants on the switching properties of ferroelectric hafniumoxide

Open access
Schroeder, Uwe, Yurchuk, Ekaterina, Müller, Johannes, Martin, Dominik, Schenk, Tony, Polakowski, Patrick, Adelmann, Christoph, Popovici, Mihaela I., Kalinin, Sergei V., Mikolajick, Thomas·2014·Japanese Journal of Applied Physics

Abstract

The wake-up behavior of ferroelectric thin film capacitors based on doped hafnium oxide dielectrics in TiN-based metal–insulator–metal structures is reported. After field cycling a remanent polarization up to 40 µC/cm 2 and a high coercive field of about 1 MV/cm was observed. Doping of HfO 2 by different dopants with a crystal radius ranging from 54 pm (Si) to 132 pm (Sr) was evaluated. In all cases, an improved polarization–voltage hysteresis after wake-up cycling is visible. For smaller dopant atoms like Si and Al stronger pinching of the polarization hysteresis appeared with increasing dopant concentration and proved to be stable during cycling.

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Crossref · 10.7567/jjap.53.08le02

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Metadata

Authors
Schroeder, U., Yurchuk, E., Müller, J., Martin, D., Schenk, T., Polakowski, P., Adelmann, C., Popovici, M. I., Kalinin, S. V., & Mikolajick, T.
Venue
Japanese Journal of Applied Physics
Published
2014-07-10
Volume
53
Issue
8S1
Pages
08LE02
ISSN
  • 0021-4922 (ISSN-L)
  • 1347-4065
OpenAlex
W1990324180
Cited by
410
References
1
FWCI
10.26
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: Impact of different dopants on the switching properties of ferroelectric hafniumoxide. https://app.cochat.ai/papers/10.7567/jjap.53.08le02
The paper
Schroeder, U., Yurchuk, E., Müller, J., Martin, D., Schenk, T., Polakowski, P., Adelmann, C., Popovici, M. I., Kalinin, S. V., & Mikolajick, T. (2014). Impact of different dopants on the switching properties of ferroelectric hafniumoxide. Japanese Journal of Applied Physics. https://doi.org/10.7567/jjap.53.08le02

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