Hwang, Cheol Seong
Seoul National University
12 papers on CoChatORCID 0000-0002-6254-9758
Most cited papers
- Verified
Atomic structure of conducting nanofilaments in TiO2 resistive switching memory
Kwon, D.-H., Kim, K. M., Jang, J. H., Jeon, J. M., Lee, M. H., Kim, G. H., Li, X.-S., Park, G.-S., Lee, B., Han, S., et al. (2010) · Nature Nanotechnology
Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices
Cited by 2,092
- Verified
Multifunctional wearable devices for diagnosis and therapy of movement disorders
Son, D., Lee, J., Qiao, S., Ghaffari, R., Kim, J., Lee, J. E., Song, C., Kim, S. J., Lee, D. J., Jun, S. W., et al. (2014) · Nature Nanotechnology
Advanced Sensor and Energy Harvesting MaterialsNeuroscience and Neural Engineering
Cited by 1,462
- Verified
Resistive switching materials for information processing
Wang, Z., Wu, H., Burr, G. W., Hwang, C. S., Wang, K. L., Xia, Q., & Yang, J. J. (2020) · Nature Reviews Materials
Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices
Cited by 1,214
- Verified
Highly Uniform, Electroforming‐Free, and Self‐Rectifying Resistive Memory in the Pt/Ta2O5/HfO2‐x/TiN Structure
Yoon, J. H., Song, S. J., Yoo, I., Seok, J. Y., Yoon, K. J., Kwon, D. E., Park, T. H., & Hwang, C. S. (2014) · Advanced Functional Materials
Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices
Cited by 277
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Low-Power, Self-Rectifying, and Forming-Free Memristor with an Asymmetric Programing Voltage for a High-Density Crossbar Application
Kim, K. M., Zhang, J., Graves, C., Yang, J. J., Choi, B. J., Hwang, C. S., Li, Z., & Williams, R. S. (2016) · Nano Letters
Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices
Cited by 246
- Verified
Nociceptive Memristor
Kim, Y., Kwon, Y. J., Kwon, D. E., Yoon, K. J., Yoon, J. H., Yoo, S., Kim, H. J., Park, T. H., Han, J., Kim, K. M., et al. (2018) · Advanced Materials
Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices
Cited by 217
- Verified · note
Pt/Ta2O5/HfO2−x/Ti Resistive Switching Memory Competing with Multilevel NAND Flash
Yoon, J. H., Kim, K. M., Song, S. J., Seok, J. Y., Yoon, K. J., Kwon, D. E., Park, T. H., Kwon, Y. J., Shao, X., & Hwang, C. S. (2015) · Advanced Materials
Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices
Cited by 175
- Verified
Fluorite-structure antiferroelectrics
Park, M. H., & Hwang, C. S. (2019) · Reports on Progress in Physics
Ferroelectric and Negative Capacitance DevicesFerroelectric and Piezoelectric Materials
Cited by 69
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Defect-Engineered Electroforming-Free Analog HfOx Memristor and Its Application to the Neural Network
Kim, G. S., Song, H., Lee, Y. K., Kim, J. H., Kim, W., Park, T. H., Kim, H. J., Min Kim, K., & Hwang, C. S. (2019) · ACS Applied Materials & Interfaces
Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices
Cited by 64
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A True Random Number Generator Using Threshold‐Switching‐Based Memristors in an Efficient Circuit Design
Woo, K. S., Wang, Y., Kim, J., Kim, Y., Kwon, Y. J., Yoon, J. H., Kim, W., & Hwang, C. S. (2019) · Advanced Electronic Materials
Advanced Memory and Neural ComputingPhysical Unclonable Functions (PUFs) and Hardware Security
Cited by 64
- Verified
A Combination of a Volatile‐Memristor‐Based True Random‐Number Generator and a Nonlinear‐Feedback Shift Register for High‐Speed Encryption
Woo, K. S., Wang, Y., Kim, Y., Kim, J., Kim, W., & Hwang, C. S. (2020) · Advanced Electronic Materials
Advanced Memory and Neural ComputingPhysical Unclonable Functions (PUFs) and Hardware Security
Cited by 52
- Verified
Extension of Two-Port Sneak Current Cancellation Scheme to 3-D Vertical RRAM Crossbar Array
Bae, W., Yoon, K. J., Hwang, C. S., & Jeong, D.-K. (2017) · IEEE Transactions on Electron Devices
Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices
Cited by 15
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