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Unbalanced currents effect on the thermal characteristic and reliability of parallel connected power switches
Abstract
In many industrial applications, parallel connection of power semiconductor switches is widely used to achieve higher power levels and fault-tolerant operation. But there is a current imbalance between parallel connected switches in practical applications. In this research, the impact of unbalanced currents on the junction temperature and the reliability of parallel connected switches are quantified and analyzed. Markov based reliability model is developed for quantitative assessment of reliability for parallel switches under different current sharing. The Mean Time to Failure (MTTF) is calculated for different conditions to be used as reliability metric for comparison of various conditions. A sensitivity analysis is also presented to show the effect of parameter variation on the junction temperatures of devices and reliability of the system. At last, a downscaled setup has been built up and tested. Experimental results verify the theoretical analysis and confirm procedure. Also, junction temperatures of power semiconductor devices are measured using thermal camera.
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“Current imbalance impacts the junction temperature and, considering this, the reliability of parallel-connected switches is discussed in [56] using the Markov-based reliability model.”
From Paralleling of IGBT Power Semiconductor Devices and Reliability Issues (2023) · cites this paper as [56]
Citations
Cites
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“These includetheuseofhardwareredundancy[17],[18],activethermal control[19],[20],anddevicestateofhealthmonitoring[21], [22],[23].”
Self-citationParalleling of IGBT Power Semiconductor Devices and Reliability Issues
Tripathi, R. N., & Omura, I. (2023) · Electronics · doi:10.3390/electronics12183826 · Cited by 14
Rahimi, T., Jahan, H. K., Abadifard, A., Akbari, M., Ghavidel, P., Farhadi, M., & Hosseini, S. H. (2021) · 2021 IEEE Electrical Power and Energy Conference (EPEC) · doi:10.1109/epec52095.2021.9621756 · Cited by 12
Self-citationFuzzy Lifetime Analysis of a Fault-Tolerant Two-Phase Interleaved Converter
Rahimi, T., Farhadi, M., Loo, K. H., & Pou, J. (2021) · 2021 IEEE 13th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) · doi:10.1109/sdemped51010.2021.9605552 · Cited by 4
Self-citation
Metadata
- Authors
- Rahimi, T., Ding, L., Abadifard, A., Ghavidel, P., Farhadi, M., & Faraji, R.
- Venue
- Case Studies in Thermal Engineering
- Publisher
- Elsevier BV
- Published
- 2021-08
- Volume
- 26
- Pages
- 101134
- ISSN
- 2214-157X
- Cited by
- 13
- References
- 1
- Language
- en
- Licence
- Funders
- China Postdoctoral Science Foundation (2019M662356, 2019M662357)
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