Informative knowledge distillation for image anomaly segmentation
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Previous teacher-student architecture anomaly detection methods suffer from overfitting as a result of inconsistency between neural network capacity and knowledge amount.
“Previous teacher-student architecture anomaly detection methods suffer from overfitting as a result of inconsistency between neural network capacity and knowledge amount.”
From Deep Industrial Image Anomaly Detection: A Survey (2024) · cites this paper as [15]
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Industrial Image Anomaly Detection via Synthetic-Anomaly Contrastive Distillation
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Outlier Exposure in Visual Industrial Anomaly Detection - Survey
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Self-citationGlobal-Regularized Neighborhood Regression for Efficient Zero-Shot Texture Anomaly Detection
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Self-citationEnhancing Zero-Shot Anomaly Detection: CLIP-SAM Collaboration with Cascaded Prompts
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RoCA: Robust Contrastive Adaptation for unsupervised anomaly detection
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Unsupervised Prediction of Blastocyst Development from Oocyte Images
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Learning to Be a Transformer to Pinpoint Anomalies
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Image Anomaly Detection via Reverse Informative Distillation
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- Authors
- Cao, Y., Wan, Q., Shen, W., & Gao, L.
- Affiliations
- State Key Laboratory of Digital Manufacturing Equipment and Technology (CN)
- Corresponding author
- Shen, Weiming
- Venue
- Knowledge-Based Systems
- Publisher
- Elsevier BV
- Published
- 2022-07
- Volume
- 248
- Pages
- 108846
- ISSN
- 0950-7051 (ISSN-L)
- OpenAlex
- W4224999518
- Semantic Scholar
- 4caabcee97045960308fc8372a611d36211e5b14
- Cited by
- 130
- References
- 45
- Citations by year
- 2026: 25 · 2025: 35 · 2024: 49 · 2023: 19 · 2022: 2
- FWCI
- 8.64
- Type
- journal article
- Language
- en
- Open access
- closed
- Licence
- Locations
- Knowledge-Based Systems (publishedVersion)
- Funders
- Fundamental Research Funds for the Central Universities (2021GCRC058)
- Topics
- Physical Sciences › Computer Science › Artificial Intelligence › Anomaly Detection Techniques and Applications
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Neural Network Applications
- Keywords
- unsupervised anomaly detection, overfitting, hard sample mining, MVTec AD
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