Cited by 551Anomaly Detection Techniques and ApplicationsIndustrial Vision Systems and Defect DetectionAdvanced Neural Network Applications

Patch SVDD: Patch-Level SVDD for Anomaly Detection and Segmentation

Open access
Yi, Jihun, Yoon, Sungroh·2021·Lecture Notes in Computer Science

Integrity signals

Registry

Crossref · 10.1007/978-3-030-69544-6_23

Cites

28 of 28 references verified0 citation errors · 0 not checkable

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  • Existing unsupervised anomaly detection methods train separate models for different object classes.

    “Despite the rapid advance of unsupervised anomaly detection, existing methods require to train separate models for different objects.”

    From A Unified Model for Multi-Class Anomaly Detection (2022) · cites this paper as [49]

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Authors
Yi, J., & Yoon, S.
Affiliations
Seoul National University (KR)
Corresponding author
Yoon, Sungroh
Venue
Lecture Notes in Computer Science
Published
2021
Pages
375-390
ISSN
  • 0302-9743 (ISSN-L)
  • 1611-3349
OpenAlex
W3106848223
Cited by
551
References
28
Citations by year
2026: 52 · 2025: 107 · 2024: 150 · 2023: 127 · 2022: 75 · 2021: 40
FWCI
43.65
Type
conference paper
Language
en
Open access
Locations
  • Lecture notes in computer science (publishedVersion)
  • arXiv (Cornell University) (submittedVersion)
  • arXiv (Cornell University)
Topics
  • Physical Sciences › Computer Science › Artificial Intelligence › Anomaly Detection Techniques and Applications
  • Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
  • Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Neural Network Applications
Keywords
image anomaly detection, anomaly segmentation, support vector data description, self-supervised learning, Deep SVDD, MVTec AD, industrial visual inspection

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

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