Cited by 28Advancements in Photolithography TechniquesNanofabrication and Lithography TechniquesBlock Copolymer Self-Assembly

The DOI matches its Crossref record; 40 of the 40 references it cites were found in a registry or an index.

Organic solvent-free water-developable sugar resist material derived from biomass in green lithography

Overview

Integrity signals

Registry

Crossref · 10.1016/j.mee.2014.02.026

Cites

40 of 40 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • Advanced computational lithography is necessary for proper design of masks for high-NA systems, as is the case for lower-NA ones.

    “Advanced computational lithography is necessary for proper design of masks for high-NA systems, as is the case for lower-NA ones 114 .”

    From Extreme ultraviolet lithography (2024) · cites this paper as [114]

  • For HVM, further research and development will be necessary for improved light sources with higher power, optimized masks and mask materials, higher-resolution photoresists below 10 nm HP, more powerful computational lithography, and better control of stochastic processes.

    “For HVM, further research and development will be necessary for improved light sources with h igher power, optimized masks and mask materials, higher -resolution photoresists below 10 nm HP, more powerful computational lithography 114 , and a better control of stochastic processes.”

    From Extreme ultraviolet lithography (2024) · cites this paper as [114]

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Metadata

Authors
Takei, S., Oshima, A., Ichikawa, T., Sekiguchi, A., Kashiwakura, M., Kozawa, T., Tagawa, S., Oyama, T. G., Ito, S., & Miyasaka, H.
Affiliations
  • Toyama Prefectural University (JP)
  • The Institute of Scientific and Industrial Research, The University of Osaka (JP)
  • The University of Osaka (JP)
Corresponding author
Takei, Satoshi
Venue
Microelectronic Engineering
Publisher
Elsevier BV
Published
2014-06
Volume
122
Pages
70-76
ISSN
0167-9317 (ISSN-L)
OpenAlex
W2022945686
Cited by
28
References
40
Citations by year
2024: 2 · 2023: 2 · 2022: 2 · 2020: 1 · 2019: 2 · 2018: 6 · 2017: 5 · 2016: 3 · 2015: 4 · 2014: 1
FWCI
2.30
Type
journal article
Language
en
Open access
closed
Locations
Microelectronic Engineering (publishedVersion)
Funders
  • Asahi Glass Foundation
  • Japan Society for the Promotion of Science (23681023, 26107002)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advancements in Photolithography Techniques
  • Physical Sciences › Materials Science › Surfaces, Coatings and Films › Nanofabrication and Lithography Techniques
  • Physical Sciences › Materials Science › Materials Chemistry › Block Copolymer Self-Assembly
Keywords
biomass-derived materials, electron beam lithography, thermal stability, tacticity

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

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