Measurement of thermal conductivity in proton irradiated silicon
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Many attempts have been made on direct TDTR measurements of semiconductors without metal transducers.
“While many attempts have been made on direct TDTR measurements of semiconductors without metal transducers, 223-227”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [225]
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- Authors
- Khafizov, M., Yablinsky, C., Allen, T. R., & Hurley, D. H.
- Affiliations
- Idaho National Laboratory (US)
- University of Wisconsin–Madison (US)
- Corresponding author
- Khafizov, Marat
- Venue
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Publisher
- Elsevier BV
- Published
- 2014-04
- Volume
- 325
- Pages
- 11-14
- ISSN
- 0168-583X (ISSN-L)
- OpenAlex
- W1994981272
- Cited by
- 36
- References
- 19
- Citations by year
- 2026: 1 · 2025: 1 · 2023: 2 · 2022: 3 · 2021: 7 · 2020: 3 · 2019: 3 · 2018: 5 · 2017: 1 · 2016: 3 · 2015: 3 · 2014: 4
- FWCI
- 1.66
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (publishedVersion)
- Funders
- U.S. Department of Energy
- Office of Science
- Basic Energy Sciences
- Energy Frontier Research Centers
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Physical Sciences › Materials Science › Materials Chemistry › Fusion materials and technologies
- Keywords
- thermal conductivity, proton irradiation, silicon, monocrystalline silicon, radiation damage, extended defects, structural defects, heat transport, high-temperature irradiation
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