Thermal conductivity measurements of non-metals via combined time- and frequency-domain thermoreflectance without a metal film transducer
Abstract
The thermoreflectance-based techniques time- and frequency-domain thermoreflectance (TDTR and FDTR, respectively) have emerged as robust platforms to measure the thermophysical properties of a wide array of systems on varying length scales. Routine in the implementation of these techniques is the application of a thin metal film on the surface of the sample of interest to serve as an opto-thermal transducer ensuring the measured modulated reflectivity is dominated by the change in thermoreflectance of the sample. Here, we outline a method to directly measure the thermal conductivities of bulk materials without using a metal transducer layer using a standard TDTR/FDTR experiment. A major key in this approach is the use of a thermal model with z-dependent heat source when the optical penetration depth is comparable to the beam sizes and measuring the FDTR response at a long delay time to minimize non-thermoreflectivity contributions to the modulated reflectance signals (such as free carrier excitations). Using this approach, we demonstrate the ability to measure the thermal conductivity on three semiconductors, intrinsic Si (100), GaAs (100), and InSb (100), the results of which are validated with FDTR measurements on the same wafers with aluminum transducers. We outline the major sources of uncertainty in this approach, including frequency dependent heating and precise knowledge of the pump and probe spot sizes. As a result, we discuss appropriate pump-frequency ranges in which to implement this TDTR/FDTR approach and present a procedure to measure the effective spot sizes by fitting the FDTR data of an 80 nm Al/SiO2 sample at a time delay in which the spot size sensitivity dominates an FDTR measurement over the substrate thermal properties. Our method provides a more convenient way to directly measure the thermal conductivities of semiconductors.
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
Many attempts have been made on direct TDTR measurements of semiconductors without metal transducers.
“While many attempts have been made on direct TDTR measurements of semiconductors without metal transducers, 223-227”
From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [223]
Cites
Aspnes, D. E., & Studna, A. A. (1983) · Physical review. B, Condensed matter · doi:10.1103/physrevb.27.985 · Cited by 3,997 · see citing works
Cahill, D. G., Ford, W. K., Goodson, K. E., Mahan, G. D., Majumdar, A., Maris, H. J., Merlin, R. D., & Phillpot, S. R. (2003) · Journal of Applied Physics · doi:10.1063/1.1524305 · Cited by 3,225 · see citing works
Semiconducting and other major properties of gallium arsenide
Blakemore, J. S. (1982) · Journal of Applied Physics · doi:10.1063/1.331665 · Cited by 2,503 · see citing works
Nanoscale thermal transport. II. 2003–2012
Cahill, D. G., Braun, P. V., Chen, G., Clarke, D. R., Fan, S., Goodson, K. E., Keblinski, P., King, W. P., Mahan, G. D., Majumdar, A., et al. (2014) · Applied Physics Reviews · doi:10.1063/1.4832615 · Cited by 1,763 · see citing works
Thermal Conductivity of Silicon and Germanium from 3°K to the Melting Point
Glassbrenner, C. J., & Slack, G. A. (1964) · Physical Review · doi:10.1103/physrev.134.a1058 · Cited by 1,652 · see citing works
Analysis of heat flow in layered structures for time-domain thermoreflectance
Cahill, D. G. (2004) · Review of Scientific Instruments · doi:10.1063/1.1819431 · Cited by 1,543 · see citing works
Analysis of Lattice Thermal Conductivity
Holland, M. G. (1963) · Physical Review · doi:10.1103/physrev.132.2461 · Cited by 1,165 · see citing works
Ultralow Thermal Conductivity in Disordered, Layered WSe <sub>2</sub> Crystals
Chiritescu, C., Cahill, D. G., Nguyen, N., Johnson, D., Bodapati, A., Keblinski, P., & Zschack, P. (2007) · Science · doi:10.1126/science.1136494 · Cited by 854 · see citing works
Heat Transfer Mechanisms During Short-Pulse Laser Heating of Metals
Qiu, T., & Tien, C. L. (1993) · ASME Journal of Heat and Mass Transfer · doi:10.1115/1.2911377 · Cited by 812 · see citing works
Effects of chemical bonding on heat transport across interfaces
Losego, M. D., Grady, M. E., Sottos, N. R., Cahill, D. G., & Braun, P. V. (2012) · Nature Materials · doi:10.1038/nmat3303 · Cited by 701 · see citing works
Femtosecond spectroscopy of electron-electron and electron-phonon energy relaxation in Ag and Au
Groeneveld, R. H. M., Sprik, R., & Lagendijk, A. (1995) · Physical review. B, Condensed matter · doi:10.1103/physrevb.51.11433 · Cited by 674 · see citing works
Schmidt, A. J., Chen, X., & Chen, G. (2008) · Review of Scientific Instruments · doi:10.1063/1.3006335 · Cited by 655 · see citing works
Regner, K. T., Sellan, D. P., Su, Z., Amon, C. H., McGaughey, A. J. H., & Malen, J. A. (2013) · Nature Communications · doi:10.1038/ncomms2630 · Cited by 646 · see citing works
Coherent Phonon Heat Conduction in Superlattices
Luckyanova, M. N., Garg, J., Esfarjani, K., Jandl, A., Bulsara, M. T., Schmidt, A. J., Minnich, A. J., Chen, S., Dresselhaus, M. S., Ren, Z., et al. (2012) · Science · doi:10.1126/science.1225549 · Cited by 630 · see citing works
Coherent Phonon Generation and Detection by Picosecond Light Pulses
Thomsen, C., Strait, J., Vardeny, Z., Maris, H. J., Tauc, J., & Hauser, J. J. (1984) · Physical Review Letters · doi:10.1103/physrevlett.53.989 · Cited by 581 · see citing works
Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths
Minnich, A. J., Johnson, J. A., Schmidt, A. J., Esfarjani, K., Dresselhaus, M. S., Nelson, K. A., & Chen, G. (2011) · Physical Review Letters · doi:10.1103/physrevlett.107.095901 · Cited by 556 · see citing works
A frequency-domain thermoreflectance method for the characterization of thermal properties
Schmidt, A. J., Cheaito, R., & Chiesa, M. (2009) · Review of Scientific Instruments · doi:10.1063/1.3212673 · Cited by 543 · see citing works
Self-citationTransient thermoreflectance from thin metal films
Paddock, C. A., & Eesley, G. L. (1986) · Journal of Applied Physics · doi:10.1063/1.337642 · Cited by 530 · see citing works
Crossover from incoherent to coherent phonon scattering in epitaxial oxide superlattices
Ravichandran, J., Yadav, A. K., Cheaito, R., Rossen, P. B., Soukiassian, A., Suresha, S. J., Duda, J. C., Foley, B. M., Lee, C.-H., Zhu, Y., et al. (2014) · Nature Materials · doi:10.1038/nmat3826 · Cited by 514 · see citing works
Self-citationThermal conductance of epitaxial interfaces
Costescu, R. M., Wall, M. A., & Cahill, D. G. (2003) · Physical Review B · doi:10.1103/physrevb.67.054302 · Cited by 486 · see citing works
Capinski, W. S., Maris, H. J., Ruf, T., Cardona, M., Ploog, K., & Katzer, D. S. (1999) · Physical Review B · doi:10.1103/physrevb.59.8105 · Cited by 471 · see citing works
Probing ultrafast carrier and phonon dynamics in semiconductors
Othonos, A. (1998) · Journal of Applied Physics · doi:10.1063/1.367411 · Cited by 461 · see citing works
Thermal Conductance of Hydrophilic and Hydrophobic Interfaces
Ge, Z., Cahill, D. G., & Braun, P. V. (2006) · Physical Review Letters · doi:10.1103/physrevlett.96.186101 · Cited by 455 · see citing works
Siemens, M. E., Li, Q., Yang, R., Nelson, K. A., Anderson, E. H., Murnane, M. M., & Kapteyn, H. C. (2010) · Nature Materials · doi:10.1038/nmat2568 · Cited by 443 · see citing works
Johnson, J. A., Maznev, A. A., Cuffe, J., Eliason, J. K., Minnich, A. J., Kehoe, T., Torres, C. M. S., Chen, G., & Nelson, K. A. (2013) · Physical Review Letters · doi:10.1103/physrevlett.110.025901 · Cited by 421 · see citing works
Femtosecond pump-probe reflectivity study of silicon carrier dynamics
Sabbah, A. J., & Riffe, D. M. (2002) · Physical review. B, Condensed matter · doi:10.1103/physrevb.66.165217 · Cited by 416 · see citing works
Generation of nonequilibrium electron and lattice temperatures in copper by picosecond laser pulses
Eesley, G. L. (1986) · Physical review. B, Condensed matter · doi:10.1103/physrevb.33.2144 · Cited by 373 · see citing works
Ultra-Low Thermal Conductivity in W/Al <sub>2</sub> O <sub>3</sub> Nanolaminates
Costescu, R. M., Cahill, D. G., Fabreguette, F. H., Sechrist, Z. A., & George, S. M. (2004) · Science · doi:10.1126/science.1093711 · Cited by 353 · see citing works
Empirical temperature dependence of the refractive index of semiconductors
Herve, P. J., & Vandamme, L. K. J. (1995) · Journal of Applied Physics · doi:10.1063/1.359248 · Cited by 313 · see citing works
Observation of Nonequilibrium Electron Heating in Copper
Eesley, G. L. (1983) · Physical Review Letters · doi:10.1103/physrevlett.51.2140 · Cited by 305 · see citing works
Hopkins, P. E. (2013) · ISRN Mechanical Engineering · doi:10.1155/2013/682586 · Cited by 302 · see citing works
Self-citationManipulating Thermal Conductance at Metal–Graphene Contacts via Chemical Functionalization
Hopkins, P. E., Baraket, M., Barnat, E. V., Beechem, T. E., Kearney, S. P., Duda, J. C., Robinson, J. T., & Walton, S. G. (2012) · Nano Letters · doi:10.1021/nl203060j · Cited by 266 · see citing works
Self-citationThermomodulation Spectra of Al, Au, and Cu
Rosei, R., & LYNCH, D. W. (1972) · Physical review. B, Solid state · doi:10.1103/physrevb.5.3883 · Cited by 263 · see citing works
Thermal-wave detection and thin-film thickness measurements with laser beam deflection
Opsal, J., Rosencwaig, A., & Willenborg, D. L. (1983) · Applied Optics · doi:10.1364/ao.22.003169 · Cited by 245 · see citing works
Anisotropic failure of Fourier theory in time-domain thermoreflectance experiments
Wilson, R. B., & Cahill, D. G. (2014) · Nature Communications · doi:10.1038/ncomms6075 · Cited by 244 · see citing works
Oh, D.-W., Ko, C., Ramanathan, S., & Cahill, D. G. (2010) · Applied Physics Letters · doi:10.1063/1.3394016 · Cited by 239 · see citing works
Hopkins, P. E., Phinney, L. M., Serrano, J. R., & Beechem, T. E. (2010) · Physical Review B · doi:10.1103/physrevb.82.085307 · Cited by 206 · see citing works
Self-citationA new regime of nanoscale thermal transport: Collective diffusion increases dissipation efficiency
Hoogeboom-Pot, K. M., Hernandez-Charpak, J. N., Gu, X., Frazer, T. D., Anderson, E. H., Chao, W., Falcone, R. W., Yang, R., Murnane, M. M., Kapteyn, H. C., et al. (2015) · Proceedings of the National Academy of Sciences · doi:10.1073/pnas.1503449112 · Cited by 202 · see citing works
Auger recombination in intrinsic GaAs
Strauß, U., Rühle, W. W., & Köhler, K. (1993) · Applied Physics Letters · doi:10.1063/1.108817 · Cited by 193 · see citing works
Hopkins, P. E., Serrano, J. R., Phinney, L. M., Kearney, S. P., Grasser, T. W., & Harris, C. T. (2010) · ASME Journal of Heat and Mass Transfer · doi:10.1115/1.4000993 · Cited by 192 · see citing works
Self-citationThermal property microscopy with frequency domain thermoreflectance
Yang, J., Maragliano, C., & Schmidt, A. J. (2013) · Review of Scientific Instruments · doi:10.1063/1.4824143 · Cited by 176 · see citing works
Application of scanning electron microscopy to determination of surface recombination velocity: GaAs
Jastrzȩbski, L., Lagowski, J. J., & Gatos, H. C. (1975) · Applied Physics Letters · doi:10.1063/1.88276 · Cited by 176 · see citing works
Cheaito, R., Duda, J. C., Beechem, T. E., Hattar, K., Ihlefeld, J. F., Medlin, D. L., Rodriguez, M. A., Campion, M. J., Piekos, E. S., & Hopkins, P. E. (2012) · Physical Review Letters · doi:10.1103/physrevlett.109.195901 · Cited by 175 · see citing works
Self-citationUniversal phonon mean free path spectra in crystalline semiconductors at high temperature
Freedman, J. P., Leach, J. H., Preble, E. A., Sitar, Z., Davis, R. F., & Malen, J. A. (2013) · Scientific Reports · doi:10.1038/srep02963 · Cited by 171 · see citing works
Liu, J., Zhu, J., Tian, M., Gu, X., Schmidt, A., & Yang, R. (2013) · Review of Scientific Instruments · doi:10.1063/1.4797479 · Cited by 163 · see citing works
Piesbergen, U. (1963) · Zeitschrift für Naturforschung A · doi:10.1515/zna-1963-0206 · Cited by 161 · see citing works
Thermal and plasma wave depth profiling in silicon
Opsal, J., & Rosencwaig, A. (1985) · Applied Physics Letters · doi:10.1063/1.96105 · Cited by 144 · see citing works
Zeng, L., Collins, K. C., Hu, Y., Luckyanova, M. N., Maznev, A. A., Huberman, S., Chiloyan, V., Zhou, J., Huang, X., Nelson, K. A., et al. (2015) · Scientific Reports · doi:10.1038/srep17131 · Cited by 140 · see citing works
Influence of Interfacial Mixing on Thermal Boundary Conductance Across a Chromium/Silicon Interface
Hopkins, P. E., Norris, P. M., Stevens, R. J., Beechem, T. E., & Graham, S. L. (2008) · ASME Journal of Heat and Mass Transfer · doi:10.1115/1.2897344 · Cited by 139 · see citing works
Self-citationUltralow thermal conductivity of fullerene derivatives
Wang, X., Liman, C. D., Treat, N. D., Chabinyc, M. L., & Cahill, D. G. (2013) · Physical Review B · doi:10.1103/physrevb.88.075310 · Cited by 132 · see citing works
Majumdar, S., Suarez, J. S., Schiffres, S. N., Ong, W., Higgs, C. F., McGaughey, A. J. H., & Malen, J. A. (2015) · Nano Letters · doi:10.1021/nl504844d · Cited by 129 · see citing works
The influence of interface bonding on thermal transport through solid–liquid interfaces
Harikrishna, H., Ducker, W. A., & Huxtable, S. T. (2013) · Applied Physics Letters · doi:10.1063/1.4812749 · Cited by 125 · see citing works
Feldman, A. (1999) · High Temperatures-High Pressures · doi:10.1068/htrt171 · Cited by 125 · see citing works
Controlling thermal conductance through quantum dot roughening at interfaces
Hopkins, P. E., Duda, J. C., Petz, C. W., & Floro, J. A. (2011) · Physical Review B · doi:10.1103/physrevb.84.035438 · Cited by 123 · see citing works
Self-citationZheng, X., Cahill, D. G., Krasnochtchekov, P., Averback, R. S., & Zhao, J.-C. (2007) · Acta Materialia · doi:10.1016/j.actamat.2007.05.037 · Cited by 117 · see citing works
Regner, K. T., Majumdar, S., & Malen, J. A. (2013) · Review of Scientific Instruments · doi:10.1063/1.4808055 · Cited by 116 · see citing works
Thermoreflectance of metal transducers for time-domain thermoreflectance
Wang, Y., Park, J. Y., Koh, Y. K., & Cahill, D. G. (2010) · Journal of Applied Physics · doi:10.1063/1.3457151 · Cited by 112 · see citing works
Chen, P., Katcho, N. A., Feser, J. P., Li, W., Glaser, M., Schmidt, O. G., Cahill, D. G., Mingo, N., & Rastelli, A. (2013) · Physical Review Letters · doi:10.1103/physrevlett.111.115901 · Cited by 107 · see citing works
Systematically controlling Kapitza conductance via chemical etching
Duda, J. C., & Hopkins, P. E. (2012) · Applied Physics Letters · doi:10.1063/1.3695058 · Cited by 98 · see citing works
Self-citationExceptionally Low Thermal Conductivities of Films of the Fullerene Derivative PCBM
Duda, J. C., Hopkins, P. E., Shen, Y., & Gupta, M. C. (2013) · Physical Review Letters · doi:10.1103/physrevlett.110.015902 · Cited by 97 · see citing works
Self-citationCheaito, R., Gaskins, J. T., Caplan, M. E., Donovan, B., Foley, B. M., Giri, A., Duda, J. C., Szwejkowski, C. J., Constantin, C., Brown‐Shaklee, H. J., et al. (2015) · Physical Review B · doi:10.1103/physrevb.91.035432 · Cited by 97 · see citing works
Self-citationAnisotropy of the Thermal Conductivity in GaAs/AlAs Superlattices
Luckyanova, M. N., Johnson, J. A., Maznev, A. A., Garg, J., Jandl, A., Bulsara, M. T., Fitzgerald, E. A., Nelson, K. A., & Chen, G. (2013) · Nano Letters · doi:10.1021/nl4001162 · Cited by 96 · see citing works
Enhancing solid-liquid interface thermal transport using self-assembled monolayers
Tian, Z., Marconnet, A., & Chen, G. (2015) · Applied Physics Letters · doi:10.1063/1.4921758 · Cited by 95 · see citing works
High-average-power femtosecond pulse generation in the blue using BiB_3O_6
Ghotbi, M., Ebrahimzadeh, M., Majchrowski, A., Michalski, E., & Kityk, I. V. (2004) · Optics Letters · doi:10.1364/ol.29.002530 · Cited by 92 · see citing works
Effect of dislocation density on thermal boundary conductance across GaSb/GaAs interfaces
Hopkins, P. E., Duda, J. C., Clark, S. P., Hains, C. P., Rotter, T. J., Phinney, L. M., & Balakrishnan, G. (2011) · Applied Physics Letters · doi:10.1063/1.3581041 · Cited by 91 · see citing works
Self-citationThermal conductance imaging of graphene contacts
Yang, J., Ziade, E., Maragliano, C., Crowder, R., Wang, X., Stefancich, M., Chiesa, M., Swan, A. K., & Schmidt, A. J. (2014) · Journal of Applied Physics · doi:10.1063/1.4889928 · Cited by 91 · see citing works
Thermal transport in organic semiconducting polymers
Duda, J. C., Hopkins, P. E., Shen, Y., & Gupta, M. C. (2013) · Applied Physics Letters · doi:10.1063/1.4812234 · Cited by 89 · see citing works
Self-citationSabbah, A. J., & Riffe, D. M. (2000) · Journal of Applied Physics · doi:10.1063/1.1316047 · Cited by 89 · see citing works
Ambipolar diffusion of photoexcited carriers in bulk GaAs
Ruzicka, B. A., Werake, L. K., Samassekou, H., & Zhao, H. (2010) · Applied Physics Letters · doi:10.1063/1.3533664 · Cited by 86 · see citing works
Foley, B. M., Hernandez, S. C., Duda, J. C., Robinson, J. T., Walton, S. G., & Hopkins, P. E. (2015) · Nano Letters · doi:10.1021/acs.nanolett.5b00381 · Cited by 84 · see citing works
Self-citationUltralow Thermal Conductivity in Organoclay Nanolaminates Synthesized via Simple Self-Assembly
Losego, M. D., Blitz, I. P., Vaia, R. A., Cahill, D. G., & Braun, P. V. (2013) · Nano Letters · doi:10.1021/nl4007326 · Cited by 82 · see citing works
Subpicosecond surface-restricted carrier and thermal dynamics by transient reflectivity measurements
Tanaka, T., Harata, A., & Sawada, T. (1997) · Journal of Applied Physics · doi:10.1063/1.365713 · Cited by 77 · see citing works
Schmidt, A. J. (2013) · Annual Review of Heat Transfer · doi:10.1615/annualrevheattransfer.v16.60 · Cited by 74 · see citing works
Influence of intraband transitions on the electron thermoreflectance response of metals
Smith, A. N., & Norris, P. M. (2001) · Applied Physics Letters · doi:10.1063/1.1351523 · Cited by 74 · see citing works
Accurate interband-Auger-recombination rates in silicon
Laks, D. B., Neumark, G. F., & Pantelides, S. T. (1990) · Physical review. B, Condensed matter · doi:10.1103/physrevb.42.5176 · Cited by 70 · see citing works
Advances in Studying Phonon Mean Free Path Dependent Contributions to Thermal Conductivity
Regner, K. T., Freedman, J. P., & Malen, J. A. (2015) · Nanoscale and Microscale Thermophysical Engineering · doi:10.1080/15567265.2015.1045640 · Cited by 67 · see citing works
Cheaito, R., Gorham, C. S., Misra, A., Hattar, K., & Hopkins, P. E. (2015) · Journal of materials research/Pratt's guide to venture capital sources · doi:10.1557/jmr.2015.11 · Cited by 63 · see citing works
Self-citationHonorato, E. L., Chiritescu, C., Xiao, P., Cahill, D. G., Marsh, G., & Abram, T. J. (2008) · Journal of Nuclear Materials · doi:10.1016/j.jnucmat.2008.04.007 · Cited by 59 · see citing works
Heat Transport between Au Nanorods, Surrounding Liquids, and Solid Supports
Park, J., Huang, J., Wang, W., Murphy, C. J., & Cahill, D. G. (2012) · The Journal of Physical Chemistry C · doi:10.1021/jp308130d · Cited by 57 · see citing works
Picosecond acoustics as a non-destructive tool for the characterization of very thin films
Thomsen, C., Maris, H. J., & Tauc, J. (1987) · Thin Solid Films · doi:10.1016/0040-6090(87)90366-x · Cited by 55 · see citing works
Su, Z., Huang, L., Liu, F., Freedman, J. P., Porter, L. M., Davis, R. F., & Malen, J. A. (2012) · Applied Physics Letters · doi:10.1063/1.4718354 · Cited by 51 · see citing works
Christofides, C., Vitkin, I. A., & Mandelis, A. (1990) · Journal of Applied Physics · doi:10.1063/1.345449 · Cited by 51 · see citing works
Limits to Fourier theory in high thermal conductivity single crystals
Wilson, R. B., & Cahill, D. G. (2015) · Applied Physics Letters · doi:10.1063/1.4935987 · Cited by 50 · see citing works
Spatially resolved defect mapping in semiconductors using laser-modulated thermoreflectance
Guidotti, D., & van Driel, H. M. (1985) · Applied Physics Letters · doi:10.1063/1.96272 · Cited by 48 · see citing works
Laser-induced free-carrier and temperature gratings in silicon
Eichler, H. J., Massmann, F., Biselli, E., Richter, K., Glotz, M., Konetzke, L., & Yang, A. X. (1987) · Physical review. B, Condensed matter · doi:10.1103/physrevb.36.3247 · Cited by 45 · see citing works
Su, Z., Freedman, J. P., Leach, J. H., Preble, E. A., Davis, R. F., & Malen, J. A. (2013) · Journal of Applied Physics · doi:10.1063/1.4808238 · Cited by 43 · see citing works
Giri, A., Niemelä, J., Szwejkowski, C. J., Karppinen, M. J., & Hopkins, P. E. (2016) · Physical review. B./Physical review. B · doi:10.1103/physrevb.93.024201 · Cited by 40 · see citing works
Self-citationThermal boundary conductance response to a change in Cr∕Si interfacial properties
Hopkins, P. E., & Norris, P. M. (2006) · Applied Physics Letters · doi:10.1063/1.2357585 · Cited by 40 · see citing works
Self-citationEnhanced room temperature electronic and thermoelectric properties of the dilute bismuthide InGaBiAs
Dongmo, P., Zhong, Y., Attia, P. M., Bomberger, C. C., Cheaito, R., Ihlefeld, J. F., Hopkins, P. E., & Zide, J. M. O. (2012) · Journal of Applied Physics · doi:10.1063/1.4761996 · Cited by 37 · see citing works
Self-citationModeling optical absorption for thermoreflectance measurements
Yang, J., Ziade, E., & Schmidt, A. J. (2016) · Journal of Applied Physics · doi:10.1063/1.4943176 · Cited by 37 · see citing works
Measurement of thermal conductivity in proton irradiated silicon
Khafizov, M., Yablinsky, C., Allen, T. R., & Hurley, D. H. (2014) · Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms · doi:10.1016/j.nimb.2014.02.003 · Cited by 36 · see citing works
Giri, A., & Hopkins, P. E. (2015) · Journal of Applied Physics · doi:10.1063/1.4936606 · Cited by 35 · see citing works
Self-citationVitkin, I. A., Christofides, C., & Mandelis, A. (1990) · Journal of Applied Physics · doi:10.1063/1.345450 · Cited by 35 · see citing works
Non-diffusive thermal transport in GaAs at micron length scales
Johnson, J. A., Eliason, J. K., Maznev, A. A., Luo, T., & Nelson, K. A. (2015) · Journal of Applied Physics · doi:10.1063/1.4933285 · Cited by 33 · see citing works
Thermal interface conductance across metal alloy–dielectric interfaces
Freedman, J. P., Yu, X., Davis, R. F., Gellman, A. J., & Malen, J. A. (2016) · Physical review. B./Physical review. B · doi:10.1103/physrevb.93.035309 · Cited by 33 · see citing works
Hopkins, P. E. (2009) · Journal of Applied Physics · doi:10.1063/1.3117486 · Cited by 33 · see citing works
Self-citationThermal flux limited electron Kapitza conductance in copper-niobium multilayers
Cheaito, R., Hattar, K., Gaskins, J. T., Yadav, A. K., Duda, J. C., Beechem, T. E., Ihlefeld, J. F., Piekos, E. S., Baldwin, J. K., Misra, A., et al. (2015) · Applied Physics Letters · doi:10.1063/1.4913420 · Cited by 28 · see citing works
Self-citationRegner, K. T., Wei, L. C., & Malen, J. A. (2015) · Journal of Applied Physics · doi:10.1063/1.4937995 · Cited by 26 · see citing works
Hopkins, P. E. (2010) · Physical Review B · doi:10.1103/physrevb.81.035413 · Cited by 25 · see citing works
Self-citationTime resolved imaging of carrier and thermal transport in silicon
Hurley, D. H., Wright, O. B., Matsuda, O., & Shinde, S. L. (2010) · Journal of Applied Physics · doi:10.1063/1.3272827 · Cited by 25 · see citing works
Two-layer model for photomodulated thermoreflectance of semiconductor wafers
Christofides, C., Diakonos, F. Κ., Seas, A. A., Christou, C., Nestoros, M., & Mandelis, A. (1996) · Journal of Applied Physics · doi:10.1063/1.362970 · Cited by 24 · see citing works
Ezzahri, Y., Grauby, S., Dilhaire, S., Rampnoux, J., & Claeys, W. (2007) · Journal of Applied Physics · doi:10.1063/1.2403236 · Cited by 23 · see citing works
Phonon transmission across interfaces and the Kapitza resistance
Maris, H. J. (1979) · Physical review. B, Condensed matter · doi:10.1103/physrevb.19.1443 · Cited by 21 · see citing works
Dynamics of the plasma and thermal waves in surface-modified semiconductors (invited)
Salnick, A., & Opsal, J. (2003) · Review of Scientific Instruments · doi:10.1063/1.1517154 · Cited by 16 · see citing works
Thermoreflectance dependence on Fermi surface electron number density perturbations
Hopkins, P. E. (2010) · Applied Physics Letters · doi:10.1063/1.3292212 · Cited by 13 · see citing works
Self-citationWärmeleitfähigkeit, elektrische Leitfähigkeit, Hall-Effekt und Thermospannung von InSb
Steigmeier, E. F. (1961) · Repository for Publications and Research Data (ETH Zurich) · doi:10.3929/ethz-a-000092437 · Cited by 6 · see citing works
Flagged first, then by citations
Cited by
Sorted by citations
Jiang, P., Qian, X., & Yang, R. (2018) · Journal of Applied Physics · doi:10.1063/1.5046944 · Cited by 424 · see citing works
A steady-state thermoreflectance method to measure thermal conductivity
Braun, J. L., OLSON, D. H. L., Gaskins, J. T., & Hopkins, P. E. (2019) · Review of Scientific Instruments · doi:10.1063/1.5056182 · Cited by 160 · see citing works
Self-citationSandell, S., Chávez‐Ángel, E., Sachat, A. E., He, J., Torres, C. M. S., & Maire, J. K. (2020) · Journal of Applied Physics · doi:10.1063/5.0020239 · Cited by 124 · see citing works
Braun, J. L., & Hopkins, P. E. (2017) · Journal of Applied Physics · doi:10.1063/1.4982915 · Cited by 103 · see citing works
Self-citationOLSON, D. H. L., Braun, J. L., & Hopkins, P. E. (2019) · Journal of Applied Physics · doi:10.1063/1.5120310 · Cited by 90 · see citing works
Self-citationYuan, C., Hanus, R. C., & Graham, S. L. (2022) · Journal of Applied Physics · doi:10.1063/5.0122200 · Cited by 82 · see citing works
Braun, J. L., Szwejkowski, C. J., Giri, A., & Hopkins, P. E. (2017) · ASME Journal of Heat and Mass Transfer · doi:10.1115/1.4038713 · Cited by 69 · see citing works
Self-citationQian, X., Ding, Z., Shin, J., Schmidt, A. J., & Chen, G. (2020) · Review of Scientific Instruments · doi:10.1063/5.0003770 · Cited by 66 · see citing works
Scott, E. A., Hattar, K., Rost, C. M., Gaskins, J. T., Fazli, M., Ganski, C., Li, C., Bai, T., Wang, Y., Esfarjani, K., et al. (2018) · Physical Review Materials · doi:10.1103/physrevmaterials.2.095001 · Cited by 56 · see citing works
Self-citationSeyf, H. R., Gordiz, K., DeAngelis, F., & Henry, A. S. (2019) · Journal of Applied Physics · doi:10.1063/1.5081722 · Cited by 44 · see citing works
Koh, Y. R., Hoque, M. S. B., Ahmad, H., OLSON, D. H. L., Liu, Z., Shi, J., Wang, Y., Huynh, K., Hoglund, E. R., Aryana, K., et al. (2021) · Physical Review Materials · doi:10.1103/physrevmaterials.5.104604 · Cited by 41 · see citing works
Self-citationGiftBTE: an efficient deterministic solver for non-gray phonon Boltzmann transport equation
Hu, Y., Jia, R., Xu, J., Sheng, Y., Wen, M., Lin, J., Shen, Y., & Bao, H. (2023) · Journal of Physics Condensed Matter · doi:10.1088/1361-648x/acfdea · Cited by 40 · see citing works
Thermal conductivity measurements of sub-surface buried substrates by steady-state thermoreflectance
Hoque, M. S. B., Koh, Y. R., Aryana, K., Hoglund, E. R., Braun, J. L., OLSON, D. H. L., Gaskins, J. T., Ahmad, H., Elahi, M. M. M., Hite, J. K., et al. (2021) · Review of Scientific Instruments · doi:10.1063/5.0049531 · Cited by 38 · see citing works
Self-citationQuantitative study on thermoreflectance linear relation
Meng, B., Ma, Y., Wang, X., & Yuan, C. (2023) · Journal of Applied Physics · doi:10.1063/5.0164110 · Cited by 36 · see citing works
Mohan, R., Khan, S., Wilson, R., & Hopkins, P. (2025) · Nature Reviews Methods Primers · doi:10.1038/s43586-025-00425-8 · Cited by 38 · see citing works
Self-citationFournier, D., Marangolo, M., & Frétigny, C. (2020) · Journal of Applied Physics · doi:10.1063/5.0019025 · Cited by 27 · see citing works
Rost, C. M., Braun, J., Ferri, K., Backman, L., Giri, A., Opila, E. J., Maria, J.-P., & Hopkins, P. E. (2017) · Applied Physics Letters · doi:10.1063/1.5006648 · Cited by 24 · see citing works
Self-citationMeasuring sub-surface spatially varying thermal conductivity of silicon implanted with krypton
Pfeifer, T. W., Tomko, J. A., Hoglund, E. R., Scott, E. A., Hattar, K., Huynh, K., Liao, M. E., Goorsky, M. S., & Hopkins, P. E. (2022) · Journal of Applied Physics · doi:10.1063/5.0094876 · Cited by 23 · see citing works
Self-citationThermal transport in metal halide perovskites and other third-generation photovoltaic materials
Chen, D., Li, S., Li, B., & Guo, P. (2024) · Applied Physics Reviews · doi:10.1063/5.0226632 · Cited by 21 · see citing works
Tuning Electrical, Optical, and Thermal Properties through Cation Disorder in Cu2ZnSnS4
Ye, K., Siah, S. C., Erslev, P. T., Akey, A. J., Settens, C. M., Hoque, M. S. B., Braun, J. L., Hopkins, P. E., Teeter, G. R., Buonassisi, T., et al. (2019) · Chemistry of Materials · doi:10.1021/acs.chemmater.9b02287 · Cited by 21 · see citing works
Self-citationSimultaneous measurement of thermal conductivity and heat capacity by flash thermal imaging methods
Tao, N. P., Li, X. L., & Sun, J. G. (2017) · Review of Scientific Instruments · doi:10.1063/1.4985633 · Cited by 21 · see citing works
Transient and local two-phase heat transport at macro-scales to nano-scales
Mehrvand, M., & Putnam, S. A. (2018) · Communications Physics · doi:10.1038/s42005-018-0018-3 · Cited by 21 · see citing works
Machine learned interatomic potentials for modeling interfacial heat transport in Ge/GaAs
Wyant, S., Rohskopf, A., & Henry, A. S. (2021) · Computational Materials Science · doi:10.1016/j.commatsci.2021.110836 · Cited by 19 · see citing works
Yuan, C., Meng, B., Mao, Y., Wu, M., Jia, F., Yang, L., Ma, X., & Hao, Y. (2022) · ACS Applied Electronic Materials · doi:10.1021/acsaelm.2c01163 · Cited by 19 · see citing works
Transducerless time domain reflectance measurement of semiconductor thermal properties
Warkander, S., & Wu, J. (2022) · Journal of Applied Physics · doi:10.1063/5.0069360 · Cited by 16 · see citing works
Li, S., Dai, Z., Li, L., Padture, N. P., & Guo, P. (2022) · Review of Scientific Instruments · doi:10.1063/5.0083763 · Cited by 16 · see citing works
Zheng, Q., Chalise, D., Jia, M., Zeng, Y., Zeng, M., Saeidi‐Javash, M., Tanvir, A. N. M., Uahengo, G., Kaur, S., Garay, J. E., et al. (2022) · Applied Physics Reviews · doi:10.1063/5.0079842 · Cited by 16 · see citing works
Xu, K., Guo, J., Raciti, G., Goñi, A. R., Alonso, M. I., Borrisé, X., Zardo, I., Campoy‐Quiles, M., & Reparaz, J. S. (2023) · International Journal of Heat and Mass Transfer · doi:10.1016/j.ijheatmasstransfer.2023.124376 · Cited by 15 · see citing works
Understanding the sensitivity of the two-temperature model for electron–phonon coupling measurements
Naldo, S. B., Bernotas, A., & Donovan, B. (2020) · Journal of Applied Physics · doi:10.1063/5.0019719 · Cited by 15 · see citing works
Pfeifer, T. W., Schonfeld, H. B., Scott, E. A., Aller, H. T., Gaskins, J. T., OLSON, D. H. L., Braun, J. L., Graham, S. L., & Hopkins, P. E. (2025) · Annual Review of Materials Research · doi:10.1146/annurev-matsci-080423-010435 · Cited by 13 · see citing works
Self-citationСтаростин, А. А., Shangin, V. V., Lonchakov, A. T., Kotov, A. N., & Bobin, S. B. (2020) · Annalen der Physik · doi:10.1002/andp.201900586 · Cited by 12 · see citing works
Laser repetition rate in time-domain thermoreflectance techniques
Larkin, L. S., Smoyer, J. L., & Norris, P. M. (2017) · International Journal of Heat and Mass Transfer · doi:10.1016/j.ijheatmasstransfer.2017.02.047 · Cited by 12 · see citing works
Ma, Y., Wu, M., Zhang, H., Sun, H., & Yuan, C. (2024) · Materials Today Physics · doi:10.1016/j.mtphys.2024.101367 · Cited by 11 · see citing works
Seeking non-Fourier heat transfer with ultrabroad band thermoreflectance spectroscopy
Zenji, A., Pernot, G., Lacroix, D., Rampnoux, J., Bourgeois, O., Grauby, S., & Dilhaire, S. (2024) · Communications Materials · doi:10.1038/s43246-024-00572-7 · Cited by 10 · see citing works
Li, X., Li, A., Shi, H., Yao, Y., Ye, Z., Wen, Z., Ren, L., Zeng, X., Xu, J., Han, M., et al. (2024) · Measurement · doi:10.1016/j.measurement.2024.115648 · Cited by 8 · see citing works
Size and shape effects on the measured peak temperatures of nanoscale hotspots
Pickel, A. D., & Dames, C. (2020) · Journal of Applied Physics · doi:10.1063/5.0012167 · Cited by 8 · see citing works
Wang, X., Jeong, M., McGaughey, A. J. H., & Malen, J. A. (2022) · Review of Scientific Instruments · doi:10.1063/5.0080119 · Cited by 8 · see citing works
Lundh, J. S., Pavlidis, G., Sasaki, K., Centrone, A., Spencer, J. A., Masten, H. N., Currie, M., Jacobs, A. G., Konishi, K., Kuramata, A., et al. (2024) · Applied Physics Letters · doi:10.1063/5.0177609 · Cited by 7 · see citing works
Song, Q., Warkander, S., & Huberman, S. (2024) · Physical Review Applied · doi:10.1103/physrevapplied.21.034044 · Cited by 6 · see citing works
Hamaoui, G., Villarreal, E., Ban, H., Chirtoc, M., & Horny, N. (2020) · Journal of Applied Physics · doi:10.1063/5.0020411 · Cited by 6 · see citing works
Zhong, H., Peng, Y., Lin, F., Niyikiza, A. B., Pan, F., Qin, C., Chen, J., Hadjiev, V. G., Deng, L., Ren, Z., et al. (2025) · Research · doi:10.34133/research.0971 · Cited by 5 · see citing works
Resonant enhancement of the thermoreflectance response of silicon nanodisks
Wang, X., Shi, C., Zheng, Q., & Thompson, D. (2025) · Applied Physics Letters · doi:10.1063/5.0276240 · Cited by 5 · see citing works
Akura, Y., Matsunaga, Y., Liu, L., Ikeda, Y., Shimofuri, M., Banerjee, A., Tsuchiya, T., & Hirotani, J. (2025) · Review of Scientific Instruments · doi:10.1063/5.0272055 · Cited by 4 · see citing works
Polydimethylsiloxane (PDMS)-assisted non-destructive transient thermoreflectance characterizations
Zhou, S., Meng, B., & Yuan, C. (2024) · Review of Scientific Instruments · doi:10.1063/5.0188808 · Cited by 4 · see citing works
Laser heating with doughnut-shaped beams
Jian, C., Ye, Z., & Pickel, A. D. (2022) · Journal of Applied Physics · doi:10.1063/5.0103369 · Cited by 4 · see citing works
Observation of second sound in a rapidly varying temperature field in Ge
Beardo, A., López-Suárez, M., Pérez, L. A., Sendra, L., Alonso, M. I., Melis, C., Bafaluy, J., Camacho, J., Colombo, L., Rurali, R., et al. (2021) · Science Advances · doi:10.1126/sciadv.abg4677 · Cited by 3 · see citing works
Characterization of AlF3-passivated aluminum mirrors using non-contact thermal metrology
Jones, A. H., Gaskins, J. T., Hopkins, P. E., Walton, S. G., Boris, D. R., Murphy, J. P., Marcos, L. R.-D., Hoyo, J. G. D., & Quijada, M. A. (2025) · Review of Scientific Instruments · doi:10.1063/5.0241547 · Cited by 3 · see citing works
Self-citationProgress in measuring, modeling, and manipulating thermal boundary conductance
Norris, P. M., Larkin, L. S., Le, N. Q., Polanco, C. A., Smoyer, J. L., & Zhang, J. (2021) · Advances in heat transfer · doi:10.1016/bs.aiht.2021.07.001 · Cited by 4 · see citing works
Delayed auger recombination in silicon measured by time-resolved X-ray scattering
Jo, W., Landahl, E. C., Kim, S., Lee, D. R., & Lee, S. (2018) · Current Applied Physics · doi:10.1016/j.cap.2018.05.013 · Cited by 3 · see citing works
Lonchakov, A. T., Старостин, А. А., Shangin, V. V., Bobin, S. B., & Kotov, A. N. (2023) · Journal of Applied Physics · doi:10.1063/5.0151345 · Cited by 2 · see citing works
Hoque, M. S. B., Brummel, I. A., Hoglund, E. R., Dionne, C. J., Aryana, K., Tomko, J. A., Gaskins, J. T., Hirt, D., Smith, S. W., Beechem, T. E., et al. (2023) · Physical Review Materials · doi:10.1103/physrevmaterials.7.025401 · Cited by 2 · see citing works
Self-citationThermoreflectance Detection of Point Defects Resulting from Focused Ion Beam Milling
Pfeifer, T. W., Hoglund, E. R., Ievlev, A. V., & Hopkins, P. E. (2026) · Advanced Engineering Materials · doi:10.1002/adem.202500373 · Cited by 1 · see citing works
Self-citationGiri, A. (2016) · doi:10.18130/v3n61n
Self-citationSteady State Temperature Influence on Modulated Photothermal Radiometry
Corona, J., & Kandadai, N. (2025) · IEEE Open Journal of Instrumentation and Measurement · doi:10.1109/ojim.2025.3643076
Light propagation and heat conduction across multilayered structures in pump-probe thermoreflectance
Guo, X., Yang, H., Yao, Y., Liu, T., Yang, R., & Qian, X. (2026) · Materials Today Physics · doi:10.1016/j.mtphys.2026.102018
Seeking for non-Fourier heat transfer with thermoreflectance
Zenji, A. (2022) · theses.fr (ABES) · doi:10.70675/9667875bz39edz4748z8b49z2f92f27c680a
Measuring the Mechanical Response of Materials at Extreme Temperatures with Localized Heating
Jalali, S. I. A., & Hemker, K. J. (2026) · Annual Review of Materials Research · doi:10.1146/annurev-matsci-072924-115933
Kim, C., Lee, M., & Seol, J. H. (2026) · SSRN Electronic Journal · doi:10.2139/ssrn.7202139
Liu, T., Chen, F., Li, J., & Tong, C. (2026) · Advanced Scientific Instruments · doi:10.1016/j.asi.2026.100037
Wang, D., Munro, T., & Ban, H. (2026) · SSRN Electronic Journal · doi:10.2139/ssrn.7303209
Transducer-free probing of thermal transport in semiconducting molecular and polymer thin films
Kocoj, C. A., Chen, D., Makala, M., Yang, S., Zhang, Y., Jang, H., Xia, Y., Jurchescu, O. D., & Guo, P. (2026) · npj Thermal Science and Engineering · doi:10.1038/s44435-026-00016-3
Interfacial thermal transport spectroscopy: a review of theory and experiment
Xu, Y., Xiang, X., Liu, W., Zhu, Y., Hu, Y., Li, M., Ma, H., Cao, B., & Zhou, Y. (2026) · Physical Chemistry Chemical Physics · doi:10.1039/d6cp02619b
- Authors
- Wang, L., Cheaito, R., Braun, J. L., Giri, A., & Hopkins, P. E.
- Affiliations
- University of Virginia (US)
- Venue
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Published
- 2016-09-01
- Volume
- 87
- Issue
- 9
- Pages
- 094902-094902
- ISSN
- 0034-6748 (ISSN-L)
- 1089-7623
- OpenAlex
- W2523563190
- Cited by
- 63
- References
- 106
- Citations by year
- 2026: 8 · 2025: 7 · 2024: 7 · 2023: 5 · 2022: 9 · 2021: 6 · 2020: 7 · 2019: 4 · 2018: 4 · 2017: 5 · 2016: 1
- FWCI
- 2.08
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Review of Scientific Instruments (publishedVersion)
- PubMed (publishedVersion)
- Funders
- Office of Naval Research (N00014-15-12769)
- Air Force Office of Scientific Research (FA9550-15-1-0079)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Physical Sciences › Engineering › Civil and Structural Engineering › Thermal Radiation and Cooling Technologies
- Keywords
- thermal conductivity, time-domain thermoreflectance, frequency-domain thermoreflectance, silicon, GaAs, indium antimonide, optical penetration depth, measurement uncertainty
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review