Cited by 22Anomaly Detection Techniques and ApplicationsIndustrial Vision Systems and Defect DetectionAdvanced Neural Network Applications

PEDENet: Image anomaly localization via patch embedding and density estimation

Open access
Zhang, Kaitai, Wang, Bin, Kuo, C.-C. Jay·2022·Pattern Recognition Letters

Integrity signals

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Crossref · 10.1016/j.patrec.2021.11.030

Cites

36 of 36 references verified0 citation errors · 0 not checkable

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Authors
Zhang, K., Wang, B., & Kuo, C.-C. J.
Affiliations
University of Southern California (US)
Corresponding author
Zhang, Kaitai
Venue
Pattern Recognition Letters
Publisher
Elsevier BV
Published
2022-01
Volume
153
Pages
144-150
ISSN
0167-8655 (ISSN-L)
OpenAlex
W3208578159
Cited by
22
References
36
Citations by year
2026: 3 · 2025: 4 · 2024: 11 · 2023: 4
FWCI
1.33
Type
journal article
Language
en
Open access
Locations
  • Pattern Recognition Letters (publishedVersion)
  • arXiv (Cornell University) (submittedVersion)
  • arXiv (Cornell University)
Topics
  • Physical Sciences › Computer Science › Artificial Intelligence › Anomaly Detection Techniques and Applications
  • Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
  • Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Neural Network Applications
Keywords
unsupervised anomaly detection, patch embedding, density estimation, Gaussian mixture model, cluster membership, location prediction

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