The DOI matches its Crossref record; 17 of the 17 references it cites were found in a registry or an index.
Surface Chemistry for Molecular Layer Deposition of Organic and Hybrid Organic−Inorganic Polymers
Abstract
The fabrication of many devices in modern technology requires techniques for growing thin films. As devices miniaturize, manufacturers will need to control thin film growth at the atomic level. Because many devices have challenging morphologies, thin films must be able to coat conformally on structures with high aspect ratios. Techniques based on atomic layer deposition (ALD), a special type of chemical vapor deposition, allow for the growth of ultra-thin and conformal films of inorganic materials using sequential, self-limiting reactions. Molecular layer deposition (MLD) methods extend this strategy to include organic and hybrid organic-inorganic polymeric materials. In this Account, we provide an overview of the surface chemistry for the MLD of organic and hybrid organic-inorganic polymers and examine a variety of surface chemistry strategies for growing polymer thin films. Previously, surface chemistry for the MLD of organic polymers such as polyamides and polyimides has used two-step AB reaction cycles using homo-bifunctional reactants. However, these reagents can react twice and eliminate active sites on the growing polymer surface. To avoid this problem, we can employ alternative precursors for MLD based on hetero-bifunctional reactants and ring-opening reactions. We can also use surface activation or protected chemical functional groups. In addition, we can combine the reactants for ALD and MLD to grow hybrid organic-inorganic polymers that should display interesting properties. For example, using trimethylaluminum (TMA) and various diols as reactants, we can achieve the MLD of alucone organic-inorganic polymers. We can alter the chemical and physical properties of these organic-inorganic polymers by varying the organic constituent in the diol or blending the alucone MLD films with purely inorganic ALD films to build a nanocomposite or nanolaminate. The combination of ALD and MLD reactants enlarges the number of possible sequential self-limiting surface reactions for film growth. Extensions to three-step ABC reaction cycles also offer many advantages to avoid the use of homo-bifunctional reactants and incorporate new functionality in the thin film. The advances in ALD have helped technological development in many areas, including semiconductor processing and magnetic disk-drive manufacturing. We expect that the advances in MLD will lead to innovations in polymeric thin-film products. Although there are remaining challenges, effective surface chemistry strategies are being developed for MLD that offer the opportunity for future advances in materials and device fabrication.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process
Puurunen, R. L. (2005) · Journal of Applied Physics · doi:10.1063/1.1940727 · Cited by 2,609
Low-Temperature Al2O3 Atomic Layer Deposition
Groner, M. D., Fabreguette, F. H., Elam, J. W., & George, S. M. (2004) · Chemistry of Materials · doi:10.1021/cm0304546 · Cited by 1,403
Self-citationSuntola, T. (1992) · Thin Solid Films · doi:10.1016/0040-6090(92)90874-b · Cited by 1,367
Groner, M. D., Elam, J. W., Fabreguette, F. H., & George, S. M. (2002) · Thin Solid Films · doi:10.1016/s0040-6090(02)00438-8 · Cited by 758
Self-citationSurface Chemistry for Atomic Layer Growth
George, S. M., Ott, A. W., & Klaus, J. W. (1996) · The Journal of Physical Chemistry · doi:10.1021/jp9536763 · Cited by 680
Self-citationAl3O3 thin film growth on Si(100) using binary reaction sequence chemistry
Ott, A. W., Klaus, J. W., Johnson, J. M., & George, S. M. (1997) · Thin Solid Films · doi:10.1016/s0040-6090(96)08934-1 · Cited by 517
Self-citationSurface chemistry of Al2O3 deposition using Al(CH3)3 and H2O in a binary reaction sequence
Dillon, A. C., Ott, A. W., Way, J. D., & George, S. M. (1995) · Surface Science · doi:10.1016/0039-6028(95)90033-0 · Cited by 462
Self-citationRitala, M., & Leskelä, M. (2002) · Handbook of Thin Films · doi:10.1016/b978-012512908-4/50005-9 · Cited by 451
Nucleation and Growth during Al2O3 Atomic Layer Deposition on Polymers
Wilson, C. A., Grubbs, R. K., & George, S. M. (2005) · Chemistry of Materials · doi:10.1021/cm050704d · Cited by 423
Self-citationMolecular Layer Deposition of Alucone Polymer Films Using Trimethylaluminum and Ethylene Glycol
Dameron, A. A., Seghete, D., Burton, B. B., Davidson, S. D., Cavanagh, A. S., Bertrand, J. A., & George, S. M. (2008) · Chemistry of Materials · doi:10.1021/cm7032977 · Cited by 342
Self-citationAtomic Layer Deposition of Al2O3 Films on Polyethylene Particles
Ferguson, J. D., Weimer, A. W., & George, S. M. (2004) · Chemistry of Materials · doi:10.1021/cm040008y · Cited by 195
Self-citationMolecular Layer Deposition of Nylon 66 Films Examined Using in Situ FTIR Spectroscopy
Du, Y., & George, S. M. (2007) · The Journal of Physical Chemistry C · doi:10.1021/jp067041n · Cited by 173
Self-citationAdamczyk, N. M., Dameron, A. A., & George, S. M. (2008) · Langmuir · doi:10.1021/la7025279 · Cited by 173
Self-citationSynthesis of Zeolite As Ordered Multicrystal Arrays
Lee, J. S., Lee, Y.-J., Tae, E. L., Park, Y. S., & Yoon, K. B. (2003) · Science · doi:10.1126/science.1086441 · Cited by 167
Yoon, B., O’Patchen, J., Seghete, D., Cavanagh, A. S., & George, S. M. (2009) · Chemical Vapor Deposition · doi:10.1002/cvde.200806756 · Cited by 135
Self-citationRapid Vapor-Phase Fabrication of Organic−Inorganic Hybrid Superlattices with Monolayer Precision
Lee, B. H., Ryu, M. K., Choi, S., Lee, K.-H., Im, S., & Sung, M. M. (2007) · Journal of the American Chemical Society · doi:10.1021/ja075664o · Cited by 118
Yoon, B., Seghete, D., Cavanagh, A. S., & George, S. M. (2009) · Chemistry of Materials · doi:10.1021/cm9013267 · Cited by 104
Self-citation
Cited by
Wu, F., Misra, M., & Mohanty, A. K. (2021) · Progress in Polymer Science · doi:10.1016/j.progpolymsci.2021.101395 · Cited by 909
Jung, Y. S., Cavanagh, A. S., Dillon, A. C., Groner, M. D., George, S. M., & Lee, S.-H. (2010) · Journal of The Electrochemical Society · doi:10.1149/1.3258274 · Cited by 361
Self-citationAl Zoubi, W., Kamil, M. P., Fatimah, S., Nashrah, N., & Ko, Y. G. (2020) · Progress in Materials Science · doi:10.1016/j.pmatsci.2020.100663 · Cited by 265
Liu, J., Zhu, J., Tian, M., Gu, X., Schmidt, A., & Yang, R. (2013) · Review of Scientific Instruments · doi:10.1063/1.4797479 · Cited by 163
Metadata
- Authors
- George, S. M., Yoon, B., & Dameron, A. A.
- Venue
- Accounts of Chemical Research
- Publisher
- American Chemical Society (ACS)
- Published
- 2009-02-27
- Volume
- 42
- Issue
- 4
- Pages
- 498-508
- ISSN
- 0001-4842 (ISSN-L)
- 1520-4898
- OpenAlex
- W1983373532
- Cited by
- 377
- References
- 17
- FWCI
- 21.91
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.