The DOI matches its Crossref record; 17 of the 17 references it cites were found in a registry or an index.
Giant Electroresistance of Super-tetragonal BiFeO3-Based Ferroelectric Tunnel Junctions
Abstract
Ferroelectric tunnel junctions enable a nondestructive readout of the ferroelectric state via a change of resistance induced by switching the ferroelectric polarization. We fabricated submicrometer solid-state ferroelectric tunnel junctions based on a recently discovered polymorph of BiFeO3 with giant axial ratio ("T-phase"). Applying voltage pulses to the junctions leads to the highest resistance changes (OFF/ON ratio >10,000) ever reported with ferroelectric tunnel junctions. Along with the good retention properties, this giant effect reinforces the interest in nonvolatile memories based on ferroelectric tunnel junctions. We also show that the changes in resistance scale with the nucleation and growth of ferroelectric domains in the ultrathin BiFeO3 (imaged by piezoresponse force microscopy), thereby suggesting potential as multilevel memory cells and memristors.
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Cites
Strukov, D. B., Snider, G. S., Stewart, D. R., & Williams, R. S. (2008) · Nature · doi:10.1038/nature06932 · Cited by 11,828
Applications of Modern Ferroelectrics
Scott, J. F. (2007) · Science · doi:10.1126/science.1129564 · Cited by 3,258
Conduction at domain walls in oxide multiferroics
Seidel, J., Martin, L. W., He, Q., Zhan, Q., Chu, Y.-H., Rother, A., Hawkridge, M. E., Maksymovych, P., Yu, P., Gajek, M., et al. (2009) · Nature Materials · doi:10.1038/nmat2373 · Cited by 1,427
Chanthbouala, A., Garcia, V., Cherifi, R. O., Bouzehouane, K., Fusil, S., Moya, X., Xavier, S., Yamada, H., Deranlot, C., Mathur, N. D., et al. (2012) · Nature Materials · doi:10.1038/nmat3415 · Cited by 1,220
Self-citationGiant tunnel electroresistance for non-destructive readout of ferroelectric states
Garcia, V., Fusil, S., Bouzehouane, K., Enouz-Vedrenne, S., Mathur, N. D., Barthélémy, A., & Bibes, M. (2009) · Nature · doi:10.1038/nature08128 · Cited by 945
Self-citationTunneling Across a Ferroelectric
Tsymbal, E. Y., & Kohlstedt, H. (2006) · Science · doi:10.1126/science.1126230 · Cited by 897
Solid-state memories based on ferroelectric tunnel junctions
Chanthbouala, A., Crassous, A., Garcia, V., Bouzehouane, K., Fusil, S., Moya, X., Allibe, J., Dlubak, B., Grollier, J., Xavier, S., et al. (2012) · Nature Nanotechnology · doi:10.1038/nnano.2011.213 · Cited by 628
Self-citationEffect of Epitaxial Strain on the Spontaneous Polarization of Thin Film Ferroelectrics
Ederer, C., & Spaldin, N. A. (2005) · Physical Review Letters · doi:10.1103/physrevlett.95.257601 · Cited by 608
Tunneling Electroresistance Effect in Ferroelectric Tunnel Junctions at the Nanoscale
Gruverman, A., Wu, D., Lu, H., Wang, Y., Jang, H. W., Folkman, C. M., Zhuravlev, M. Y., Felker, D., Rzchowski, M., Eom, C.-B., et al. (2009) · Nano Letters · doi:10.1021/nl901754t · Cited by 603
Reversible electrical switching of spin polarization in multiferroic tunnel junctions
Pantel, D., Goetze, S., Hesse, D., & Alexe, M. (2012) · Nature Materials · doi:10.1038/nmat3254 · Cited by 472
Theoretical current-voltage characteristics of ferroelectric tunnel junctions
Kohlstedt, H., Pertsev, N. A., Rodríguez Contreras, J., & Waser, R. (2005) · Physical Review B · doi:10.1103/physrevb.72.125341 · Cited by 438
Conduction through 71° Domain Walls in BiFeO3 Thin Films
Farokhipoor, S., & Noheda, B. (2011) · Physical Review Letters · doi:10.1103/physrevlett.107.127601 · Cited by 376
Ferroelectric Tunnel Memristor
Kim, D. J., Lu, H., Ryu, S., Bark, C.-W., Eom, C.-B., Tsymbal, E. Y., & Gruverman, A. (2012) · Nano Letters · doi:10.1021/nl302912t · Cited by 354
Yin, Y. W., Burton, J. D., Kim, Y.-M., Borisevich, A. Y., Pennycook, S. J., Yang, S. M., Noh, T. W., Gruverman, A., Li, X. G., Tsymbal, E. Y., et al. (2013) · Nature Materials · doi:10.1038/nmat3564 · Cited by 327
Ferroelectric and multiferroic tunnel junctions
Tsymbal, E. Y., Gruverman, A., Garcia, V., Bibes, M., & Barthélémy, A. (2012) · MRS Bulletin · doi:10.1557/mrs.2011.358 · Cited by 215
Self-citationRoom-Temperature Ferroelectric Resistive Switching in Ultrathin Pb(Zr0.2Ti0.8)O3 Films
Pantel, D., Goetze, S., Hesse, D., & Alexe, M. (2011) · ACS Nano · doi:10.1021/nn2018528 · Cited by 171
Nanoscale ferroelectric tunnel junctions based on ultrathin BaTiO3 film and Ag nanoelectrodes
Gao, X., Liu, J., Au, K. M., & Dai, J. (2012) · Applied Physics Letters · doi:10.1063/1.4756918 · Cited by 69
Cited by
Resistive switching materials for information processing
Wang, Z., Wu, H., Burr, G. W., Hwang, C. S., Wang, K. L., Xia, Q., & Yang, J. J. (2020) · Nature Reviews Materials · doi:10.1038/s41578-019-0159-3 · Cited by 1,214
A comprehensive review on emerging artificial neuromorphic devices
Zhu, J., Zhang, T., Yang, Y., & Huang, R. (2020) · Applied Physics Reviews · doi:10.1063/1.5118217 · Cited by 758
Learning through ferroelectric domain dynamics in solid-state synapses
Boyn, S., Grollier, J., Lecerf, G., Xu, B., Locatelli, N., Fusil, S., Girod, S., Carrétéro, C., Garcia, K., Xavier, S., et al. (2017) · Nature Communications · doi:10.1038/ncomms14736 · Cited by 600
Self-citationThe Future of Memristors: Materials Engineering and Neural Networks
Sun, K., Chen, J., & Yan, X. (2021) · Advanced Functional Materials · doi:10.1002/adfm.202006773 · Cited by 482
BiFeO3epitaxial thin films and devices: past, present and future
Sando, D., Barthélémy, A., & Bibes, M. (2014) · Journal of Physics: Condensed Matter · doi:10.1088/0953-8984/26/47/473201 · Cited by 353
Self-citation
Metadata
- Authors
- Yamada, H., Garcia, V., Fusil, S., Boyn, S., Marinova, M., Gloter, A., Xavier, S., Grollier, J., Jacquet, E., Carrétéro, C., Deranlot, C., Bibes, M., & Barthélémy, A.
- Venue
- ACS Nano
- Publisher
- American Chemical Society (ACS)
- Published
- 2013-05-13
- Volume
- 7
- Issue
- 6
- Pages
- 5385-5390
- ISSN
- 1936-0851 (ISSN-L)
- 1936-086X
- OpenAlex
- W2028252106
- Cited by
- 275
- References
- 17
- FWCI
- 16.58
- Type
- journal article
- Language
- en
- Open access
- closed
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