The DOI matches its Crossref record; 9 of the 9 references it cites were found in a registry or an index.
Ultrahigh-quality silicon carbide single crystals
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Citations
Cites
Comparison of 6H-SiC, 3C-SiC, and Si for power devices
Bhatnagar, M., & Baliga, B. J. (1993) · IEEE Transactions on Electron Devices · doi:10.1109/16.199372 · Cited by 1,120
Capillary equilibria of dislocated crystals
Frank, F. C. (1951) · Acta Crystallographica · doi:10.1107/s0365110x51001690 · Cited by 627
Step-controlled epitaxial growth of SiC: High quality homoepitaxy
Matsunami, H., & Kimoto, T. (1997) · Materials Science and Engineering: R: Reports · doi:10.1016/s0927-796x(97)00005-3 · Cited by 613
Investigation of growth processes of ingots of silicon carbide single crystals
Tairov, Y. M., & Tsvetkov, V. F. (1978) · Journal of Crystal Growth · doi:10.1016/0022-0248(78)90169-0 · Cited by 594
Growth of Silicon Crystals Free from Dislocations
Dash, W. C. (1959) · Journal of Applied Physics · doi:10.1063/1.1702390 · Cited by 379
Long Term Operation of 4.5kV PiN and 2.5kV JBS Diodes
Lendenmann, H., Dahlquist, F., Johansson, N., et al. (2001) · Materials science forum · doi:10.4028/www.scientific.net/msf.353-356.727 · Cited by 263
Neudeck, P. G., Huang, W., & Dudley, M. (1998) · Solid-State Electronics · doi:10.1016/s0038-1101(98)00211-1 · Cited by 94
Sublimation-Grown Semi-Insulating SiC for High Frequency Devices
Müller, S. G., Brady, M. F., Brixius, W. H., et al. (2003) · Materials science forum · doi:10.4028/www.scientific.net/msf.433-436.39 · Cited by 59
Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes
Stahlbush, R. E., Fedison, J. B., Arthur, S., et al. (2002) · Materials science forum · doi:10.4028/www.scientific.net/msf.389-393.427 · Cited by 29
Cited by
Material Science and Device Physics in SiC Technology for High-Voltage Power Devices
Kimoto, T. (2015) · Japanese Journal of Applied Physics · doi:10.7567/jjap.54.040103 · Cited by 1,176
A silicon carbide room-temperature single-photon source
Castelletto, S., Johnson, B. C., Ivády, V., Stavrias, N., Umeda, T., Gali, A., & Ohshima, T. (2014) · Nature Materials · doi:10.1038/nmat3806 · Cited by 592
Multifunctional SiC@SiO2 Nanofiber Aerogel with Ultrabroadband Electromagnetic Wave Absorption
Song, L., Zhang, F., Chen, Y., Guan, L., Zhu, Y., Chen, M., Wang, H., Putra, B. R., Zhang, R., & Fan, B. (2022) · Nano-Micro Letters · doi:10.1007/s40820-022-00905-6 · Cited by 438
Present Status and Future Prospect of Widegap Semiconductor High-Power Devices
Okumura, H. (2006) · Japanese Journal of Applied Physics · doi:10.1143/jjap.45.7565 · Cited by 347
Hamada, K., Nagao, M., Ajioka, M., & Kawai, F. (2015) · IEEE Transactions on Electron Devices · doi:10.1109/ted.2014.2359240 · Cited by 271
Metadata
- Authors
- Nakamura, D., Gunjishima, I., Yamaguchi, S., Ito, T., Okamoto, A., Kondo, H., Onda, S., & Takatori, K.
- Venue
- Nature
- Published
- 2004-08
- Volume
- 430
- Issue
- 7003
- Pages
- 1009-1012
- ISSN
- 0028-0836 (ISSN-L)
- 1476-4687
- OpenAlex
- W2082246719
- Cited by
- 433
- References
- 9
- FWCI
- 32.37
- Type
- journal article
- Language
- en
- Open access
- closed
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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
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- CoChat. (2026). Citation check: Ultrahigh-quality silicon carbide single crystals. https://app.cochat.ai/papers/10.1038/nature02810
- The paper
- Nakamura, D., Gunjishima, I., Yamaguchi, S., Ito, T., Okamoto, A., Kondo, H., Onda, S., & Takatori, K. (2004). Ultrahigh-quality silicon carbide single crystals. Nature. https://doi.org/10.1038/nature02810
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
