The DOI matches its Crossref record; 50 of the 50 references it cites were found in a registry or an index.
Present Status and Future Prospect of Widegap Semiconductor High-Power Devices
Open accessAbstract
High-power device technology is a key technological factor for wireless communication, which is one of the information network infrastructures in the 21st century, as well as power electronics innovation, which contributes considerably to solving the energy saving problem in the future energy network. Widegap semiconductors, such as SiC and GaN, are strongly expected as high-power high-frequency devices and high-power switching devices owing to their material properties. In this paper, the present status and future prospect of these widegap semiconductor high-power devices are reviewed, in the context of applications in wireless communication and power electronics.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
AlGaN/GaN HEMTs—An Overview of Device Operation and Applications
Mishra, U. K., Parikh, P., & Wu, Y.-F. (2002) · Proceedings of the IEEE · doi:10.1109/jproc.2002.1021567 · Cited by 2,312
The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs
Vetury, R., Zhang, N. Q., Keller, S., & Mishra, U. K. (2001) · IEEE Transactions on Electron Devices · doi:10.1109/16.906451 · Cited by 1,453
30-W/mm GaN HEMTs by Field Plate Optimization
Wu, Y.-F., Saxler, A., Moore, M., Smith, R. P., Sheppard, S., Chavarkar, P. M., Wisleder, T., Mishra, U. K., & Parikh, P. (2004) · IEEE Electron Device Letters · doi:10.1109/led.2003.822667 · Cited by 1,104
High electron mobility transistor based on a GaN-Al x Ga1−x N heterojunction
Asif Khan, M., Bhattarai, A., Kuznia, J. N., & Olson, D. T. (1993) · Applied Physics Letters · doi:10.1063/1.109775 · Cited by 911
Chung, G. Y., Tin, C. C., Williams, J. R., McDonald, K., Chanana, R. K., Weller, R. A., Pantelides, S. T., Feldman, L. C., Holland, O. W., Das, M. K., et al. (2001) · IEEE Electron Device Letters · doi:10.1109/55.915604 · Cited by 641
Optimum semiconductors for high-power electronics
Shenai, K., Scott, R. S., & Baliga, B. J. (1989) · IEEE Transactions on Electron Devices · doi:10.1109/16.34247 · Cited by 617
Investigation of growth processes of ingots of silicon carbide single crystals
Tairov, Y. M., & Tsvetkov, V. F. (1978) · Journal of Crystal Growth · doi:10.1016/0022-0248(78)90169-0 · Cited by 594
Very-high power density AlGaN/GaN HEMTs
Wu, Y.-F., Kapolnek, D., Ibbetson, J. P., Parikh, P., Keller, B. P., & Mishra, U. K. (2001) · IEEE Transactions on Electron Devices · doi:10.1109/16.906455 · Cited by 568
Semiconductors for high-voltage, vertical channel field-effect transistors
Baliga, B. J. (1982) · Journal of Applied Physics · doi:10.1063/1.331646 · Cited by 470
Silicon carbide high-power devices
Weitzel, C. E., Palmour, J. W., Carter, C. H., Moore, K., Nordquist, K. K., Allen, S., Thero, C., & Bhatnagar, M. (1996) · IEEE Transactions on Electron Devices · doi:10.1109/16.536819 · Cited by 443
Cited by
Material Science and Device Physics in SiC Technology for High-Voltage Power Devices
Kimoto, T. (2015) · Japanese Journal of Applied Physics · doi:10.7567/jjap.54.040103 · Cited by 1,176
Metadata
- Authors
- Okumura, H.
- Venue
- Japanese Journal of Applied Physics
- Publisher
- IOP Publishing
- Published
- 2006-10-01
- Volume
- 45
- Issue
- 10R
- Pages
- 7565
- ISSN
- 0021-4922 (ISSN-L)
- 1347-4065
- OpenAlex
- W2086023756
- Cited by
- 347
- References
- 50
- FWCI
- 10.12
- Type
- journal article
- Language
- en
- Open access
- bronze
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Present Status and Future Prospect of Widegap Semiconductor High-Power Devices. https://app.cochat.ai/papers/10.1143/jjap.45.7565
- The paper
- Okumura, H. (2006). Present Status and Future Prospect of Widegap Semiconductor High-Power Devices. Japanese Journal of Applied Physics. https://doi.org/10.1143/jjap.45.7565
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.