Cited by 2,358Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance DevicesNeuroscience and Neural Engineering

The DOI matches its Crossref record; 54 of the 54 references it cites were found in a registry or an index; 7 of the 35 sources its claims cite were checked for support.

Memristors with diffusive dynamics as synaptic emulators for neuromorphic computing

Open access

Abstract

The accumulation and extrusion of Ca 2+ in the pre- and postsynaptic compartments play a critical role in initiating plastic changes in biological synapses. To emulate this fundamental process in electronic devices, we developed diffusive Ag-in-oxide memristors with a temporal response during and after stimulation similar to that of the synaptic Ca 2+ dynamics. In situ high-resolution transmission electron microscopy and nanoparticle dynamics simulations both demonstrate that Ag atoms disperse under electrical bias and regroup spontaneously under zero bias because of interfacial energy minimization, closely resembling synaptic influx and extrusion of Ca 2+, respectively. The diffusive memristor and its dynamics enable a direct emulation of both short- and long-term plasticity of biological synapses, representing an advance in hardware implementation of neuromorphic functionalities.

Overview

Integrity signals

Registry

Crossref · 10.1038/nmat4756

Cites

54 of 54 references verified0 citation errors · 0 not checkable

Statistics

Nothing to recompute.

Verification

Claims the paper makes

7 of 35 cited sources checked · 0 supported · 0 flagged · accuracy not yet measured

Show all 63 claims

  • It may state two separate claims as one. 59
  • Probably not a substantial claim. 9
65 of 65
  • The authors state this as an assumption.

    The model treats electron flow as a series of tunnelling hops: input terminal to closest metal particle, particle to particle, and last particle to output terminal.

    “For the state-dependent resistance we assume sequential electron tunnelling: first from the input terminal to the nearest metallic nanoparticle, and then from this nanoparticle to the next one and so on with the last tunnelling event to the output terminal.”
  • The authors state this as an assumption.

    The tunnelling resistance amplitude is taken to be identical for every island.

    “R 𝑡𝑡 the tunneling resistance amplitude (assumed the same for all islands)”
  • The authors state this as an assumption.

    Each mobile metal nanoparticle is described by an overdamped Langevin equation with a trapping potential and a random force whose strength depends on the local device temperature.

    “we employed an overdamped Langevin equation for each mobile metallic nanoparticle trapped by a potential 𝑈𝑈 and subject to a random force 𝜉𝜉 𝑖𝑖 , the magnitude of which is determined by the device local temperature 𝑇𝑇,”
  • The authors state this as an assumption.

    The simulation model omits redox reactions.

    “The model results here did not include redox reactions, although they can be added in order to more closely resemble the electrochemical models proposed previously [21][22][23][24][25][26] .”
  • The authors state this as an assumption.

    The model's potential energy landscape has two distinct energy scales: a stronger interfacial term that forms large metallic clusters near the device terminals and a weaker pinning term with many wells between electrodes.

    “The potential 𝑈𝑈 = 𝑈𝑈 𝐼𝐼 + 𝑈𝑈 𝑝𝑝 has two energy scales -the interfacial energy 𝑈𝑈 𝐼𝐼 responsible for formation of large metallic clusters near the device terminals and a weaker nanoparticlepinning energy 𝑈𝑈 𝑝𝑝 with many smaller wells between the electrodes.”
5 of 5

Claims other papers make about this one

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Citations

Cites

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Show all 52 references

Research works printed but not linked: 2

  1. Jo, S. H., Kumar, T., Narayanan, S., Lu, W. D. & Nazarian, H. Electron Devices Meeting (IEDM) 6.7.1–6.7.4 (IEEE International, 2014).
  2. Luo, Q. et al. Electron Devices Meeting (IEDM) 10.14.11–10.14.14 (IEEE International, 2015).

Cited by

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Metadata

Authors
Wang, Z., Joshi, S., Savel’ev, S. E., Jiang, H., Midya, R., Lin, P., Hu, M., Ge, N., Strachan, J. P., Li, Z., Wu, Q., Barnell, M., Li, G.-L., Xin, H. L., Williams, R. S., Xia, Q., & Yang, J. J.
Affiliations
  • University of Massachusetts Amherst (US)
  • Hewlett-Packard (United States) (US)
  • U.S. Air Force Research Laboratory Information Directorate (US)
  • Brookhaven National Laboratory (US)
Corresponding author
  • Wang, Zhongrui
  • Joshi, Saumil
  • Yang, J. Joshua
Venue
Nature Materials
Published
2016-09-26
Volume
16
Issue
1
Pages
101-108
ISSN
  • 1476-1122 (ISSN-L)
  • 1476-4660
OpenAlex
W2526646482
Cited by
2,358
References
52
Citations by year
2026: 182 · 2025: 264 · 2024: 259 · 2023: 260 · 2022: 273 · 2021: 274 · 2020: 297 · 2019: 246 · 2018: 210 · 2017: 89 · 2016: 2
FWCI
83.99
Type
journal article
Language
en
Open access
Locations
  • Nature Materials (publishedVersion)
  • PubMed (publishedVersion)
  • OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) (submittedVersion)
  • Loughborough University Institutional Repository (Loughborough University) (submittedVersion, cc-by-nc-nd)
  • Loughborough University Research Repository (Loughborough University) (submittedVersion, cc-by-nc-nd)
Funders
  • National Science Foundation (1253073, DE-SC0012704)
  • U.S. Department of Energy (DE‐SC0012704, SC0012704.)
  • Center for Hierarchical Manufacturing, National Science Foundation
  • Office of Science (DE-SC-0012704, SC0012704)
  • U.S. Air Force (FA9550, FA9550-12-1)
  • University of Massachusetts Amherst
  • Intelligence Advanced Research Projects Activity (2014‐14080800008)
  • Division of Electrical, Communications and Cyber Systems
  • Air Force Office of Scientific Research (FA9550-, -15-2-, FA9550-12, FA9550‐12‐1‐0038, FA9550‐12‐1)
  • Brookhaven National Laboratory (SC0012704, DE- SC0012704)
  • Air Force Research Laboratory (DE-SC0012704, FA8750-15-2- 0044, FA9550)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Memory and Neural Computing
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
  • Life Sciences › Neuroscience › Cellular and Molecular Neuroscience › Neuroscience and Neural Engineering
Keywords
memristors, silver diffusion, synaptic plasticity, calcium dynamics, neuromorphic computing, short-term plasticity, long-term plasticity, synaptic emulation, interfacial energy minimization

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