Cited by 538Laser-Matter Interactions and ApplicationsTerahertz technology and applicationsPlasmonic and Surface Plasmon Research

Generation of femtosecond electromagnetic pulses from semiconductor surfaces

Zhang, X.-C., Hu, B. B., Darrow, J. T., Auston, D. H.·1990·Applied Physics Letters

Abstract

We have generated electromagnetic beams from a variety of semiconductors. When a bare semiconductor wafer was illuminated by femtosecond optical pulses, electromagnetic waves radiate from the surface and form collinear diffraction-limited electromagnetic beams in the inward and outward directions. The amplitude and phase of the radiated field depend on carrier mobility, the strength and polarity of the static internal field at the semiconductor surface.

Integrity signals

Registry

Crossref · 10.1063/1.102601

Cites

8 of 8 references verified0 citation errors · 0 not checkable

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  • Drift currents are generated by charge acceleration within applied or built-in electric fields, as occur within semiconductor surface depletion regions, p-n junctions, or Schottky junctions.

    “Drift currents are generated by charge acceleration within applied or built-in electric fields, as occur within semiconductor surface depletion regions26, p–n junctions, or Schottky junctions.”

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Authors
Zhang, X.-C., Hu, B. B., Darrow, J. T., & Auston, D. H.
Affiliations
Columbia University (US)
Venue
Applied Physics Letters
Published
1990-03-12
Volume
56
Issue
11
Pages
1011-1013
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2025038832
Cited by
538
References
8
Citations by year
2026: 4 · 2025: 5 · 2024: 9 · 2023: 14 · 2022: 10 · 2021: 12 · 2020: 9 · 2019: 19 · 2018: 9 · 2017: 13 · 2016: 15 · 2015: 27 · 2014: 18 · 2013: 13 · 2012: 20
FWCI
11.48
Type
journal article
Language
en
Open access
closed
Locations
Applied Physics Letters (publishedVersion)
Topics
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Laser-Matter Interactions and Applications
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
  • Physical Sciences › Engineering › Biomedical Engineering › Plasmonic and Surface Plasmon Research
Keywords
semiconductor surfaces, surface radiation, carrier mobility, diffraction-limited beam, semiconductor wafers, ultrafast laser excitation

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

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