Cited by 54Terahertz technology and applicationsMicrowave and Dielectric Measurement TechniquesThermography and Photoacoustic Techniques

Double modulated differential THz-TDS for thin film dielectric characterization

Mickan, Samuel P, Lee, Kwang-Su, Lu, Toh-Ming, Munch, Jesper, Abbott, Derek, Zhang, X.-C·2002·Microelectronics Journal

Integrity signals

Registry

Crossref · 10.1016/s0026-2692(02)00108-8

Cites

66 of 66 references verified0 citation errors · 0 not checkable

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Authors
Mickan, S. P., Lee, K.-S., Lu, T.-M., Munch, J., Abbott, D., & Zhang, X.-C.
Affiliations
  • Rensselaer Polytechnic Institute (US)
  • The University of Adelaide (AU)
Corresponding author
  • Mickan, Samuel P
  • Zhang, X.-C
Venue
Microelectronics Journal
Publisher
Elsevier BV
Published
2002-12
Volume
33
Issue
12
Pages
1033-1042
ISSN
1879-2391 (ISSN-L)
OpenAlex
W2153037499
Cited by
54
References
66
Citations by year
2026: 2 · 2025: 1 · 2024: 1 · 2023: 2 · 2022: 3 · 2021: 2 · 2020: 1 · 2019: 1 · 2018: 1 · 2017: 5 · 2016: 1 · 2014: 4 · 2013: 2 · 2012: 1
FWCI
4.20
Type
journal article
Language
en
Open access
closed
Locations
  • Microelectronics Journal (publishedVersion)
  • Adelaide Research & Scholarship (AR&S) (University of Adelaide) (submittedVersion)
Funders
  • US-UK Fulbright Commission
  • Australian Research Council
  • National Science Foundation
  • Army Research Office
  • Clough
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
  • Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
Keywords
terahertz spectroscopy, double modulation, dielectric thin films, pump-probe spectroscopy, sensitivity enhancement, iterative methods

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

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