Double modulated differential THz-TDS for thin film dielectric characterization
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Double-modulation terahertz spectroscopy rapidly translates the sample into and out of the THz beam, resulting in a differential signal sensitive to subtle variations in absorption and phase.
“Double-modulation terahertz spectroscopy achieves this by rapidly translating the sample into and out of the THz beam,6,7 resulting in a differential signal sensitive to subtle variations in absorption and phase.”
From Dual-Beam THz Spectrometer with Low-Aberration Optics and Off-Axis Multipixel Photoconductive Emitters for Reduced Systematic Errors (2025) · cites this paper as [7]
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- Authors
- Mickan, S. P., Lee, K.-S., Lu, T.-M., Munch, J., Abbott, D., & Zhang, X.-C.
- Affiliations
- Rensselaer Polytechnic Institute (US)
- The University of Adelaide (AU)
- Corresponding author
- Mickan, Samuel P
- Zhang, X.-C
- Venue
- Microelectronics Journal
- Publisher
- Elsevier BV
- Published
- 2002-12
- Volume
- 33
- Issue
- 12
- Pages
- 1033-1042
- ISSN
- 1879-2391 (ISSN-L)
- OpenAlex
- W2153037499
- Cited by
- 54
- References
- 66
- Citations by year
- 2026: 2 · 2025: 1 · 2024: 1 · 2023: 2 · 2022: 3 · 2021: 2 · 2020: 1 · 2019: 1 · 2018: 1 · 2017: 5 · 2016: 1 · 2014: 4 · 2013: 2 · 2012: 1
- FWCI
- 4.20
- Type
- journal article
- Language
- en
- Open access
- closed
- Licence
- Locations
- Microelectronics Journal (publishedVersion)
- Adelaide Research & Scholarship (AR&S) (University of Adelaide) (submittedVersion)
- Funders
- US-UK Fulbright Commission
- Australian Research Council
- National Science Foundation
- Army Research Office
- Clough
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Keywords
- terahertz spectroscopy, double modulation, dielectric thin films, pump-probe spectroscopy, sensitivity enhancement, iterative methods
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