The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.
Calibration of atomic-force microscope tips
Abstract
Images and force measurements taken by an atomic-force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional equipment.
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Citations
Cites
Reaction-rate theory: fifty years after Kramers
Hänggi, P., Talkner, P., & Borkovec, M. (1990) · Reviews of Modern Physics · doi:10.1103/revmodphys.62.251 · Cited by 6,154
Cited by
Calibration of rectangular atomic force microscope cantilevers
Sader, J. E., Chon, J. W. M., & Mulvaney, P. (1999) · Review of Scientific Instruments · doi:10.1063/1.1150021 · Cited by 2,145
Single-molecule mechanics of mussel adhesion
Lee, H., Scherer, N. F., & Messersmith, P. B. (2006) · Proceedings of the National Academy of Sciences · doi:10.1073/pnas.0605552103 · Cited by 2,112
A reversible wet/dry adhesive inspired by mussels and geckos
Lee, H., Lee, B. P., & Messersmith, P. B. (2007) · Nature · doi:10.1038/nature05968 · Cited by 2,043
Calculation of thermal noise in atomic force microscopy
Butt, H. J., & Jaschke, M. (1995) · Nanotechnology · doi:10.1088/0957-4484/6/1/001 · Cited by 1,589
Elosegui-Artola, A., Oria, R., Chen, Y., Kosmalska, A., Pérez-González, C., Castro, N., Zhu, C., Trepat, X., & Roca-Cusachs, P. (2016) · Nature Cell Biology · doi:10.1038/ncb3336 · Cited by 858
Metadata
- Authors
- Hutter, J. L., & Bechhoefer, J.
- Venue
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Published
- 1993-07-01
- Volume
- 64
- Issue
- 7
- Pages
- 1868-1873
- ISSN
- 0034-6748 (ISSN-L)
- 1089-7623
- OpenAlex
- W2010227280
- Cited by
- 4,194
- References
- 1
- FWCI
- 4.91
- Type
- journal article
- Language
- en
- Open access
- closed
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- Hutter, J. L., & Bechhoefer, J. (1993). Calibration of atomic-force microscope tips. Review of Scientific Instruments. https://doi.org/10.1063/1.1143970
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
