Cited by 44Quantum and electron transport phenomenaSemiconductor Quantum Structures and DevicesAdvancements in Semiconductor Devices and Circuit Design

The DOI matches its Crossref record; 20 of the 20 references it cites were found in a registry or an index.

Integration of on-chip field-effect transistor switches with dopantless Si/SiGe quantum dots for high-throughput testing

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Ward, D. R., Savage, D. E., Lagally, M. G., Coppersmith, S. N., Eriksson, M. A.·2013·Applied Physics Letters

Abstract

Measuring multiple quantum devices on a single chip increases characterization throughput and enables testing of device repeatability, process yield, and systematic variations in device design. We present a method that uses on-chip field-effect transistor switches to enable multiplexed cryogenic measurements of double quantum dot Si/SiGe devices. Multiplexing enables the characterization of a number of devices that scales exponentially with the number of external wires, a key capability given the significant constraints on cryostat wiring. Using this approach, we characterize three quantum-point contact channels and compare threshold voltages for accumulation and pinch-off voltages during a single cool-down of a dilution refrigerator.

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Crossref · 10.1063/1.4807768

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20 of 20 references verified0 citation errors · 0 not checkable

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  • Device multiplexing using on-chip or off-chip circuitry comes with limitations in the wafer area that can be sampled.

    “One solution is device multiplexing, using either on-chip31,32 or off-chip33 circuitry, but both approaches come with limitations in the wafer area that can be sampled.”

    From Probing single electrons across 300-mm spin qubit wafers (2024) · cites this paper as [31]

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  1. 1980, The Art of Electronics

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Metadata

Authors
Ward, D. R., Savage, D. E., Lagally, M. G., Coppersmith, S. N., & Eriksson, M. A.
Affiliations
University of Wisconsin–Madison (US)
Venue
Applied Physics Letters
Published
2013-05-27
Volume
102
Issue
21
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2086519394
Cited by
43
References
20
Citations by year
2026: 2 · 2025: 2 · 2024: 5 · 2023: 4 · 2021: 1 · 2020: 3 · 2019: 2 · 2018: 2 · 2017: 3 · 2016: 5 · 2015: 9 · 2014: 3 · 2013: 2
FWCI
3.26
Type
journal article
Language
en
Open access
Locations
  • Applied Physics Letters (publishedVersion)
  • arXiv (Cornell University) (submittedVersion)
  • arXiv (Cornell University)
Topics
  • Physical Sciences › Physics and Astronomy › Condensed Matter Physics › Quantum and electron transport phenomena
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Semiconductor Quantum Structures and Devices
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advancements in Semiconductor Devices and Circuit Design
Keywords
Si/SiGe quantum dots, double quantum dot, quantum point contacts, threshold voltage, pinch-off voltage, dilution refrigerator

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