Noise analysis for high-fidelity quantum entangling gates in an anharmonic linear Paul trap
Open accessAbstract
The realization of high-fidelity quantum gates in a multiqubit system, with a typical target set at $99.9%$, is a critical requirement for the implementation of fault-tolerant quantum computation. To reach this level of fidelity, one needs to carefully analyze the noises and imperfections in the experimental system and optimize the gate operations to mitigate their effects. Here, we consider one of the leading experimental systems for the fault-tolerant quantum computation, ions in an anharmonic linear Paul trap, and optimize entangling quantum gates using segmented laser pulses with the assistance of all the collective transverse phonon modes of the ion crystal. We present detailed analyses of the effects of various kinds of intrinsic experimental noises as well as errors from imperfect experimental controls. Through explicit calculations, we find the requirements on these relevant noise levels and control precisions to achieve the targeted high fidelity of $99.9%$ for the entangling quantum gates in a multi-ion crystal.
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The accumulation of physical errors prevents the execution of large-scale algorithms in current quantum computers.
“The accumulation of physical errors1–3 prevents the execution of large-scale algorithms in current quantum computers.”
From High-threshold and low-overhead fault-tolerant quantum memory (2024) · cites this paper as [1]
The Introduction (p. 1) says important algorithms had been demonstrated only at small scale, and Appendix D (p. 18) describes errors accumulating over repeated gates and a coherence-time limit. These passages support errors as a scaling obstacle, but the paper does not establish that accumulated physical errors prevent large-scale algorithms on current quantum computers generally. (LLM, conf=0.82)
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“008(3) 4× 10−8 2× 10−13 [[288, 12, 18]] 1/48 ≤ 18 0.”
BackgroundMethodInfluentialBenchmarking a trapped-ion quantum computer with 30 qubits
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Optimization and implementation of a surface-electrode ion trap junction
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- Authors
- Wu, Y., Wang, S.-T., & Duan, L.-M.
- Affiliations
- University of Michigan (US)
- Harvard University (US)
- Venue
- Physical Review A
- Publisher
- American Physical Society (APS)
- Published
- 2018-06-19
- Volume
- 97
- Issue
- 6
- ISSN
- 0556-2791 (ISSN-L)
- 2469-9926
- 2469-9934
- OpenAlex
- W2786023959
- Cited by
- 69
- References
- 38
- Citations by year
- 2026: 3 · 2025: 19 · 2024: 8 · 2023: 10 · 2022: 7 · 2021: 10 · 2020: 5 · 2019: 6 · 2018: 1
- FWCI
- 3.10
- Type
- journal article
- Language
- en
- Open access
- green
- arxiv.org
- Licence
- Locations
- Physical Review A (publishedVersion)
- arXiv (Cornell University) (submittedVersion)
- arXiv (Cornell University)
- Funders
- Intelligence Advanced Research Projects Activity
- Topics
- Physical Sciences › Computer Science › Artificial Intelligence › Quantum Information and Cryptography
- Physical Sciences › Computer Science › Artificial Intelligence › Quantum Computing Algorithms and Architecture
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Cold Atom Physics and Bose-Einstein Condensates
- Keywords
- high-fidelity quantum gates, trapped ions, noise analysis, control accuracy, fault-tolerant quantum computing, gate optimization
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