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Circuit techniques for reducing the effects of op-amp imperfections: autozeroing, correlated double sampling, and chopper stabilization

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Enz, C.C., Temes, G.C.·1996·Proceedings of the IEEE

Abstract

In linear IC's fabricated in a low-voltage CMOS technology, the reduction of the dynamic range due to the dc offset and low frequency noise of the amplifiers becomes increasingly significant. Also, the achievable amplifier gain is often quite low in such a technology, since cascoding may not be a practical circuit option due to the resulting reduction of the output signal swing. In this paper, some old and some new circuit techniques are described for the compensation of the amplifier's most important nonideal effects including the noise (mainly thermal and 1/f noise), the input-referred dc offset voltage as well as the finite gain resulting in a nonideal virtual ground at the input.

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Metadata

Authors
Enz, C. C., & Temes, G. C.
Venue
Proceedings of the IEEE
Published
1996
Volume
84
Issue
11
Pages
1584-1614
ISSN
0018-9219 (ISSN-L)
OpenAlex
W2112611349
Cited by
1,877
References
0
FWCI
8.93
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Circuit techniques for reducing the effects of op-amp imperfections: autozeroing, correlated double sampling, and chopper stabilization. https://app.cochat.ai/papers/10.1109/5.542410
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Enz, C. C., & Temes, G. C. (1996). Circuit techniques for reducing the effects of op-amp imperfections: autozeroing, correlated double sampling, and chopper stabilization. Proceedings of the IEEE. https://doi.org/10.1109/5.542410

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Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.