The DOI matches its Crossref record; 34 of the 34 references it cites were found in a registry or an index.
Deep Metric Learning via Lifted Structured Feature Embedding
Open accessAbstract
Learning the distance metric between pairs of examples is of great importance for learning and visual recognition. With the remarkable success from the state of the art convolutional neural networks, recent works [1, 31] have shown promising results on discriminatively training the networks to learn semantic feature embeddings where similar examples are mapped close to each other and dissimilar examples are mapped farther apart. In this paper, we describe an algorithm for taking full advantage of the training batches in the neural network training by lifting the vector of pairwise distances within the batch to the matrix of pairwise distances. This step enables the algorithm to learn the state of the art feature embedding by optimizing a novel structured prediction objective on the lifted problem. Additionally, we collected Stanford Online Products dataset: 120k images of 23k classes of online products for metric learning. Our experiments on the CUB-200-2011 [37], CARS196 [19], and Stanford Online Products datasets demonstrate significant improvement over existing deep feature embedding methods on all experimented embedding sizes with the GoogLeNet [33] network. The source code and the dataset are available at: https://github.com/rksltnl/ Deep-Metric-Learning-CVPR16.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Going deeper with convolutions
Szegedy, C., Liu, W., Jia, Y., Sermanet, P., Reed, S., Anguelov, D., Erhan, D., Vanhoucke, V., & Rabinovich, A. (2015) · 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2015.7298594 · Cited by 48,562
ImageNet Large Scale Visual Recognition Challenge
Russakovsky, O., Deng, J., Su, H., Krause, J., Satheesh, S., Ma, S., Huang, Z., Karpathy, A., Khosla, A., Bernstein, M., et al. (2015) · International Journal of Computer Vision · doi:10.1007/s11263-015-0816-y · Cited by 39,380
FaceNet: A unified embedding for face recognition and clustering
Schroff, F., Kalenichenko, D., & Philbin, J. (2015) · 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2015.7298682 · Cited by 15,267
Nonlinear Dimensionality Reduction by Locally Linear Embedding
Roweis, S. T., & Saul, L. K. (2000) · Science · doi:10.1126/science.290.5500.2323 · Cited by 14,965
Introduction to information retrieval
(2009) · Choice Reviews Online · doi:10.5860/choice.46-2715 · Cited by 12,278
Introduction to Information Retrieval
Manning, C. D., Raghavan, P., & Schütze, H. (2008) · doi:10.1017/cbo9780511809071 · Cited by 11,288
Goodall, C. (1988) · Technometrics · doi:10.1080/00401706.1988.10488412 · Cited by 8,675
Jolliffe, I. T. (1986) · Springer Series in Statistics · doi:10.1007/978-1-4757-1904-8 · Cited by 8,273
Clustering by Passing Messages Between Data Points
Frey, B. J., & Dueck, D. (2007) · Science · doi:10.1126/science.1136800 · Cited by 6,758
Dimensionality Reduction by Learning an Invariant Mapping
Hadsell, R., Chopra, S., & LeCun, Y. (2006) · 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Volume 2 (CVPR'06) · doi:10.1109/cvpr.2006.100 · Cited by 5,336
Distance Metric Learning for Large Margin Nearest Neighbor Classification
Weinberger, K. Q., & Saul, L. K. (2009) · Journal of Machine Learning Research · doi:10.5555/1577069.1577078 · Cited by 4,044
Learning a Similarity Metric Discriminatively, with Application to Face Verification
Chopra, S., Hadsell, R., & LeCun, Y. (2005) · 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'05) · doi:10.1109/cvpr.2005.202 · Cited by 4,036
Caffe: Convolutional Architecture for Fast Feature Embedding
Jia, Y., Shelhamer, E., Donahue, J., Karayev, S., Long, J., Girshick, R., Guadarrama, S., & Darrell, T. J. (2014) · arXiv (Cornell University) · doi:10.48550/arxiv.1408.5093 · Cited by 3,752
Caltech-UCSD Birds-200-2011 Dataset
Wah, C. (2024) · CaltechAUTHORS (California Institute of Technology) · doi:10.57702/i9oeewf6 · Cited by 3,525
3D Object Representations for Fine-Grained Categorization
Krause, J., Stark, M., Deng, J., & Fei-Fei, L. (2013) · 2013 IEEE International Conference on Computer Vision Workshops · doi:10.1109/iccvw.2013.77 · Cited by 3,496
Product Quantization for Nearest Neighbor Search
Jégou, H., Douze, M., & Schmid, C. (2011) · IEEE Transactions on Pattern Analysis and Machine Intelligence · doi:10.1109/tpami.2010.57 · Cited by 2,956 · cited 2×
“We can observe that the embedding clusters the images from the same brand of cars despite the significant pose variations and the changes in the body paint.”
BackgroundMethodSIGNATURE VERIFICATION USING A “SIAMESE” TIME DELAY NEURAL NETWORK
BROMLEY, J., BENTZ, J. W., BOTTOU, L., GUYON, I., LECUN, Y., MOORE, C., SÄCKINGER, E., & SHAH, R. (1994) · Series in Machine Perception and Artificial Intelligence · doi:10.1142/9789812797926_0003 · Cited by 2,350
DeViSE: A Deep Visual-Semantic Embedding Model
Frome, A., Corrado, G. S., Shlens, J., Samy Bengio, A., Dean, J., Ranzato, M., & Mikolov, T. (2013) · Cited by 2,308
Accelerating t-SNE using tree-based algorithms
van der Maaten, L. (2014) · doi:10.5555/2627435.2697068 · Cited by 2,226
Attribute-Based Classification for Zero-Shot Visual Object Categorization
Lampert, C. H., Nickisch, H., & Harmeling, S. (2014) · IEEE Transactions on Pattern Analysis and Machine Intelligence · doi:10.1109/tpami.2013.140 · Cited by 1,627
Going Deeper with Convolutions
Szegedy, C., Liu, W., Jia, Y., Sermanet, P., Reed, S., Anguelov, D., Erhan, D., Vanhoucke, V., & Rabinovich, A. (2014) · arXiv · doi:10.48550/arxiv.1409.4842 · Cited by 1,461
Learning Fine-Grained Image Similarity with Deep Ranking
Wang, J., Song, Y., Leung, T., Rosenberg, C., Wang, J., Philbin, J., Chen, B., & Wu, Y. (2014) · 2014 IEEE Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2014.180 · Cited by 1,269
Support vector machine learning for interdependent and structured output spaces
Tsochantaridis, I., Hofmann, T., Joachims, T., & Altun, Y. (2004) · Twenty-first international conference on Machine learning - ICML '04 · doi:10.1145/1015330.1015341 · Cited by 1,243
Cutting-plane training of structural SVMs
Joachims, T., Finley, T., & Yu, C.-N. J. (2009) · Machine Learning · doi:10.1007/s10994-009-5108-8 · Cited by 958
Out-of-Sample Extensions for LLE, Isomap, MDS, Eigenmaps, and Spectral Clustering
Bengio, Y., Paiement, J.-F., Vincent, P., Delalleau, O., Roux, N. L., & Ouimet, M. (2003) · Cited by 894
Zero-Shot Learning with Semantic Output Codes
Palatucci, M., Pomerleau, D., Hinton, G. E., & Mitchell, T. M. (2018) · Figshare · doi:10.1184/r1/6476456 · Cited by 752
Large Scale Online Learning of Image Similarity through Ranking
Chechik, G., Sharma, V., Shalit, U., & Bengio, S. (2009) · Lecture Notes in Computer Science · doi:10.1007/978-3-642-02172-5_2 · Cited by 722
Learning visual similarity for product design with convolutional neural networks
Bell, S., & Bala, K. (2015) · ACM Transactions on Graphics · doi:10.1145/2766959 · Cited by 408
FastXML: a fast, accurate and stable tree-classifier for extreme multi-label learning
Prabhu, Y., & Varma, M. (2014) · Proceedings of the 20th ACM SIGKDD international conference on Knowledge discovery and data mining · doi:10.1145/2623330.2623651 · Cited by 307
Evaluating knowledge transfer and zero-shot learning in a large-scale setting
Rohrbach, M., Stark, M., & Schiele, B. (2011) · CVPR 2011 · doi:10.1109/cvpr.2011.5995627 · Cited by 303
Metric Learning for Large Scale Image Classification: Generalizing to New Classes at Near-Zero Cost
Mensink, T., Verbeek, J., Perronnin, F., & Csurka, G. (2012) · Lecture Notes in Computer Science · doi:10.1007/978-3-642-33709-3_35 · Cited by 281
Joint embeddings of shapes and images via CNN image purification
Li, Y., Su, H., Qi, C. R., Fish, N., Cohen-Or, D., & Guibas, L. J. (2015) · ACM Transactions on Graphics · doi:10.1145/2816795.2818071 · Cited by 174
Fine-grained visual categorization via multi-stage metric learning
Qian, Q., Jin, R., Shenghuo Zhu, B., & Lin, Y. (2015) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr.2015.7298995 · Cited by 140
Pose-Sensitive Embedding by Nonlinear NCA Regression
Taylor, G. W., Fergus, R., Williams, G., Spiro, I., & Bregler, C. (2010) · Cited by 29
Cited by
ArcFace: Additive Angular Margin Loss for Deep Face Recognition
Deng, J., Guo, J., Xue, N., & Zafeiriou, S. (2019) · 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2019.00482 · Cited by 7,781
Occupancy Networks: Learning 3D Reconstruction in Function Space
Mescheder, L., Oechsle, M., Niemeyer, M., Nowozin, S., & Geiger, A. (2019) · 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2019.00459 · Cited by 2,708
SphereFace: Deep Hypersphere Embedding for Face Recognition
Liu, W., Wen, Y., Yu, Z., Li, M., Raj, B., & Song, L. (2017) · 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2017.713 · Cited by 2,280
VoxCeleb2: Deep Speaker Recognition
Chung, J. S., Nagrani, A., & Zisserman, A. (2018) · Interspeech 2018 · doi:10.21437/interspeech.2018-1929 · Cited by 2,256
3D-R2N2: A Unified Approach for Single and Multi-view 3D Object Reconstruction
Choy, C. B., Xu, D., Gwak, J., Chen, K., & Savarese, S. (2016) · Lecture Notes in Computer Science · doi:10.1007/978-3-319-46484-8_38 · Cited by 1,632
Self-citation
Metadata
- Authors
- Song, H. O., Xiang, Y., Jegelka, S., & Savarese, S.
- Venue
- 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
- Publisher
- IEEE
- Published
- 2016-06
- Pages
- 4004-4012
- ISSN
- 1063-6919 (ISSN-L)
- OpenAlex
- W2176040302
- Cited by
- 1,630
- References
- 34
- FWCI
- 52.16
- Type
- conference paper
- Language
- en
- Open access
- green
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.