Cited by 34Advanced Memory and Neural ComputingPhase-change materials and chalcogenidesFerroelectric and Negative Capacitance Devices

The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.

Phase-Change Memory Models for Deep Learning Training and Inference

Open access
Nandakumar, S. R., Boybat, Irem, Joshi, Vinay, Piveteau, Christophe, Le Gallo, Manuel, Rajendran, Bipin, Sebastian, Abu, Eleftheriou, Evangelos·2019·2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

Abstract

Non-volatile analog memory devices such as phase-change memory (PCM) enable designing dedicated connectivity matrices for the hardware implementation of deep neural networks (DNN). In this in-memory computing approach, the analog conductance states of the memory device can be gradually updated to train DNNs on-chip or software trained connection strengths may be programmed one-time to the devices to create efficient inference engines. Reliable and computationally simple models that capture the non-ideal programming and temporal evolution of the devices are needed for evaluating the training and inference performance of the deep learning hardware based on in-memory computing. In this paper, we present statistically accurate models for PCM, based on the characterization of more than 10,000 devices, that capture the state-dependent nature and variability of the conductance update, conductance drift, and read noise. Integrating the computationally simple device models with deep learning frameworks such as TensorFlow enables us to realistically evaluate training and inference performance of the PCM array based hardware implementations of DNNs.

Overview

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Crossref · 10.1109/icecs46596.2019.8964852

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Research works printed but not linked: 13

  1. 10.1109/IEDM.2011.6131488 · DOI · Paper page
  2. 10.1002/aelm.201700627 · DOI
  3. 10.1109/TED.2009.2016397 · DOI
  4. 10.1103/PhysRevB.79.165206 · DOI
  5. 10.1109/TED.2018.2865352 · DOI · Paper page
  6. 10.1063/1.5042413 · DOI
  7. 10.1109/ISCAS.2018.8351656 · DOI
  8. joshi, 2019, Accurate deep neural network inference using computational phase-change memory
  9. sebastian, 0, Computational memory-based inference and training of deep neural networks, Proc Symp VLSI Technol Circuits
  10. 10.1109/IEDM.2010.5703445 · DOI · Paper page
  11. 10.1038/ncomms5314 · DOI
  12. 10.1145/2897937.2898010 · DOI
  13. 10.1063/1.5042408 · DOI

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Metadata

Authors
Nandakumar, S. R., Boybat, I., Joshi, V., Piveteau, C., Le Gallo, M., Rajendran, B., Sebastian, A., & Eleftheriou, E.
Affiliations
  • IBM Research - Zurich (CH)
  • École Polytechnique Fédérale de Lausanne (CH)
  • New Jersey Institute of Technology (US)
  • ETH Zurich (CH)
  • IBM Research - Zurich,Rüschlikon,Switzerland,8803
Venue
2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
Publisher
IEEE
Published
2019-11
Pages
727-730
OpenAlex
W3003151806
Cited by
34
References
2
Citations by year
2026: 5 · 2025: 8 · 2024: 5 · 2023: 7 · 2022: 3 · 2021: 1 · 2020: 4 · 2019: 1
FWCI
3.58
Type
conference paper
Language
en
Open access
Locations
  • IEEE International Conference on Electronics, Circuits and Systems (ICECS) (publishedVersion)
  • Infoscience (Ecole Polytechnique Fédérale de Lausanne) (submittedVersion, cc-by-nc-nd)
  • Research Portal (King's College London) (submittedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Memory and Neural Computing
  • Physical Sciences › Materials Science › Materials Chemistry › Phase-change materials and chalcogenides
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
Keywords
phase-change memory, in-memory computing, device modeling, conductance drift, readout noise, on-chip learning, inference engine, device variability

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